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Tm3+-related emissions in III-V semiconductors grown by metalorganic vapor phase epitaxy

Identifieur interne : 003742 ( Main/Exploration ); précédent : 003741; suivant : 003743

Tm3+-related emissions in III-V semiconductors grown by metalorganic vapor phase epitaxy

Auteurs : K. Pressel [Allemagne] ; J. Weber ; C. Hiller ; D. Ottenw Lder ; W. Kürner ; A. Dörnen ; F. Scholz ; K. Locke ; D. Wiedmann ; F. Cordeddu

Source :

RBID : Pascal:92-0499350

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English descriptors

Abstract

Layers of InP:Tm, GaAs:Tm, GaP:Tm, and GaInP:Tm have been grown by metal-organic vapor phase epitaxy at atmospheric pressure using tris(isopropylcyclopentadienyl)thulium as a liquid Tm source. Electrical measurements revealed no characteristic influence of Tm on the electrical properties of the semiconductor host. Tm3+-related 4f emissions at 1.2 and 1.9 μm are observed both in GaAs and GaInP. In GaAs, the Tm3+ 4f luminescence at 1.2 μm consists of a series of very sharp lines. In GaInP samples, the Tm3+-related luminescence at 1.2 μm is much stronger than in the GaAs samples and is still observable at room temperature


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Le document en format XML

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<sup>3+</sup>
-related emissions in III-V semiconductors grown by metalorganic vapor phase epitaxy</title>
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<term>Impurity</term>
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<div type="abstract" xml:lang="en">Layers of InP:Tm, GaAs:Tm, GaP:Tm, and GaInP:Tm have been grown by metal-organic vapor phase epitaxy at atmospheric pressure using tris(isopropylcyclopentadienyl)thulium as a liquid Tm source. Electrical measurements revealed no characteristic influence of Tm on the electrical properties of the semiconductor host. Tm
<sup>3+</sup>
-related 4f emissions at 1.2 and 1.9 μm are observed both in GaAs and GaInP. In GaAs, the Tm
<sup>3+</sup>
4f luminescence at 1.2 μm consists of a series of very sharp lines. In GaInP samples, the Tm
<sup>3+</sup>
-related luminescence at 1.2 μm is much stronger than in the GaAs samples and is still observable at room temperature</div>
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