Tm3+-related emissions in III-V semiconductors grown by metalorganic vapor phase epitaxy
Identifieur interne : 003742 ( Main/Exploration ); précédent : 003741; suivant : 003743Tm3+-related emissions in III-V semiconductors grown by metalorganic vapor phase epitaxy
Auteurs : K. Pressel [Allemagne] ; J. Weber ; C. Hiller ; D. Ottenw Lder ; W. Kürner ; A. Dörnen ; F. Scholz ; K. Locke ; D. Wiedmann ; F. CordedduSource :
- Applied physics letters [ 0003-6951 ] ; 1992.
Descripteurs français
- Pascal (Inist)
- Wicri :
- topic : Composé minéral.
English descriptors
- KwdEn :
Abstract
Layers of InP:Tm, GaAs:Tm, GaP:Tm, and GaInP:Tm have been grown by metal-organic vapor phase epitaxy at atmospheric pressure using tris(isopropylcyclopentadienyl)thulium as a liquid Tm source. Electrical measurements revealed no characteristic influence of Tm on the electrical properties of the semiconductor host. Tm3+-related 4f emissions at 1.2 and 1.9 μm are observed both in GaAs and GaInP. In GaAs, the Tm3+ 4f luminescence at 1.2 μm consists of a series of very sharp lines. In GaInP samples, the Tm3+-related luminescence at 1.2 μm is much stronger than in the GaAs samples and is still observable at room temperature
Affiliations:
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Le document en format XML
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-related emissions in III-V semiconductors grown by metalorganic vapor phase epitaxy</title>
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<wicri:noRegion>7000 Stuttgart</wicri:noRegion>
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<author><name sortKey="Dornen, A" sort="Dornen, A" uniqKey="Dornen A" first="A." last="Dörnen">A. Dörnen</name>
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<author><name sortKey="Scholz, F" sort="Scholz, F" uniqKey="Scholz F" first="F." last="Scholz">F. Scholz</name>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Experimental study</term>
<term>Gallium Arsenides</term>
<term>Gallium Indium Phosphides Mixed</term>
<term>Gallium Phosphides</term>
<term>Impurity</term>
<term>Indium Phosphides</term>
<term>Inorganic compound</term>
<term>Optical transition</term>
<term>Photoluminescence</term>
<term>Semiconductor materials</term>
<term>Thulium</term>
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<term>Photoluminescence</term>
<term>Transition optique</term>
<term>Impureté</term>
<term>Semiconducteur</term>
<term>Composé minéral</term>
<term>Gallium Arséniure</term>
<term>Indium Phosphure</term>
<term>Gallium Phosphure</term>
<term>Gallium Indium Phosphure Mixte</term>
<term>Thulium</term>
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<front><div type="abstract" xml:lang="en">Layers of InP:Tm, GaAs:Tm, GaP:Tm, and GaInP:Tm have been grown by metal-organic vapor phase epitaxy at atmospheric pressure using tris(isopropylcyclopentadienyl)thulium as a liquid Tm source. Electrical measurements revealed no characteristic influence of Tm on the electrical properties of the semiconductor host. Tm<sup>3+</sup>
-related 4f emissions at 1.2 and 1.9 μm are observed both in GaAs and GaInP. In GaAs, the Tm<sup>3+</sup>
4f luminescence at 1.2 μm consists of a series of very sharp lines. In GaInP samples, the Tm<sup>3+</sup>
-related luminescence at 1.2 μm is much stronger than in the GaAs samples and is still observable at room temperature</div>
</front>
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<name sortKey="Hiller, C" sort="Hiller, C" uniqKey="Hiller C" first="C." last="Hiller">C. Hiller</name>
<name sortKey="Kurner, W" sort="Kurner, W" uniqKey="Kurner W" first="W." last="Kürner">W. Kürner</name>
<name sortKey="Locke, K" sort="Locke, K" uniqKey="Locke K" first="K." last="Locke">K. Locke</name>
<name sortKey="Ottenw Lder, D" sort="Ottenw Lder, D" uniqKey="Ottenw Lder D" first="D." last="Ottenw Lder">D. Ottenw Lder</name>
<name sortKey="Scholz, F" sort="Scholz, F" uniqKey="Scholz F" first="F." last="Scholz">F. Scholz</name>
<name sortKey="Weber, J" sort="Weber, J" uniqKey="Weber J" first="J." last="Weber">J. Weber</name>
<name sortKey="Wiedmann, D" sort="Wiedmann, D" uniqKey="Wiedmann D" first="D." last="Wiedmann">D. Wiedmann</name>
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<country name="Allemagne"><region name="Bade-Wurtemberg"><name sortKey="Pressel, K" sort="Pressel, K" uniqKey="Pressel K" first="K." last="Pressel">K. Pressel</name>
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