Singapour < Slovaquie < Slovénie

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 111.
[20-40] [0 - 20][0 - 50][40-60]

Ident.	Authors (with country if any)	Title
005652 (2009)		Effect of indium on the microstructure of the interface between Sn3.13AgO.74CuIn solder and Cu substrate
005978 (2009)		AlGaAs/InGaP interfaces in structures prepared by MOVPE
006441 (2008)		Influence of thermal cycling on shear strength of Cu-Sn3.5AgIn-Cu joints with various content of indium
007013 (2007)		Study of radiation detectors based on semi-insulating GaAs and InP : Aspects of material and electrode technology
007162 (2007)		Role of the V-III ratio and growth rate in decomposition of In0.27Ga0.73P/GaP grown by MOVPE
007441 (2007)		Novel Hall sensors developed for magnetic field imaging systems
007713 (2007)		Influence of surface strain on the MOVPE growth of InGaP epitaxial layers
008378 (2006)		Spinodal-like decomposition of InGaP epitaxial layers grown on GaP substrates
008472 (2006)		SIMS and SEM analysis of In1-x-yAlxGayP LED structure grown on InxGa1-xP graded buffer
008552 (2006)		Pressure effect on heavy fermion compound YbCu5
008945 (2006)		Investigation of graded InxGa1-xP buffer by Raman scattering method
008F38 (2006)		Conformai AZ5214-E resist déposition on patterned (100) InP substrates
009955 (2005)		Micromachining of mesa and pyramidal-shaped objects in (100) InP substrates
009F35 (2005)		Effects of annealing on the properties of indium-tin oxide films prepared by ion beam sputtering
009F95 (2005)		Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging
00A937 (2004)		Wet-etch bulk micromachining of (100) InP substrates
00A967 (2004)		Ultrathin polyelectrolyte multilayers: in situ ESR/UV-Vis-NIR spectroelectrochemical study of charge carriers formed under oxidation
00AA19 (2004)		Thin film voltammetric microsensor for heavy metal analysis
00B157 (2004)		Material properties of graded composition InxGa1-xP buffer layers grown on GaP by organometallic vapor phase epitaxy
00B287 (2004)		Investigation of compensation defect centres in semi-insulating InP crystals
00B417 (2004)		In-depth analysis of the interfaces in InGaP/GaAs heterosystems

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