Augmented reality user interface for an atomic force microscope-based nanorobotic system
Identifieur interne : 006118 ( Main/Exploration ); précédent : 006117; suivant : 006119Augmented reality user interface for an atomic force microscope-based nanorobotic system
Auteurs : Wolfgang Vogl [Allemagne] ; Bernice Kai-Lam Ma [États-Unis] ; Metin Sitti [États-Unis]Source :
- IEEE transactions on nanotechnology [ 1536-125X ] ; 2006.
Descripteurs français
- Pascal (Inist)
- Wicri :
- topic : Nanotechnologie.
English descriptors
- KwdEn :
Abstract
A real-time augmented reality (AR) user interface for nanoscale interaction and manipulation applications using an atomic force microscope (AFM) is presented. Nanoscale three-dimensional (3-D) topography and force information sensed by an AFM probe are fed back to a user through a simulated AR system. The sample surface is modeled with a B-spline-based geometry model, upon which a collision detection algorithm determines whether and how the spherical AFM tip penetrates the surface. Based on these results, the induced surface deformations are simulated using continuum micro/nanoforce and Maugis-Dug-dale elastic contact mechanics models, and 3-D decoupled force feedback information is obtained in real time. The simulated information is then blended in real time with the force measurements of the AFM in an AR human machine interface, comprising a computer graphics environment and a haptic interface. Accuracy, usability, and reliability of the proposed AR user interface is tested by experiments for three tasks: positioning the AFM probe tip close to a surface, just in contact with a surface, or below a surface by elastically indenting. Results of these tests showed the performance of the proposed user interface. This user interface would be critical for many nanorobotic applications in biotechnology, nanodevice prototyping, and nanotechnology education.
Affiliations:
- Allemagne, États-Unis
- Bavière, District de Haute-Bavière, Pennsylvanie
- Munich
- Université Carnegie-Mellon, Université Louis-et-Maximilien de Munich
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Le document en format XML
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<term>Feedback regulation</term>
<term>Force measurement</term>
<term>Mechanical contact</term>
<term>Nanomanipulation</term>
<term>Nanotechnology</term>
<term>Performance evaluation</term>
<term>Reliability</term>
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<term>User interface</term>
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<term>Microscopie force atomique</term>
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<term>Algorithme</term>
<term>Déformation superficielle</term>
<term>Contact mécanique</term>
<term>Rétroaction</term>
<term>Mesure force</term>
<term>Infographie</term>
<term>Fiabilité</term>
<term>Surface contact</term>
<term>Evaluation performance</term>
<term>Nanotechnologie</term>
<term>0779L</term>
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<front><div type="abstract" xml:lang="en">A real-time augmented reality (AR) user interface for nanoscale interaction and manipulation applications using an atomic force microscope (AFM) is presented. Nanoscale three-dimensional (3-D) topography and force information sensed by an AFM probe are fed back to a user through a simulated AR system. The sample surface is modeled with a B-spline-based geometry model, upon which a collision detection algorithm determines whether and how the spherical AFM tip penetrates the surface. Based on these results, the induced surface deformations are simulated using continuum micro/nanoforce and Maugis-Dug-dale elastic contact mechanics models, and 3-D decoupled force feedback information is obtained in real time. The simulated information is then blended in real time with the force measurements of the AFM in an AR human machine interface, comprising a computer graphics environment and a haptic interface. Accuracy, usability, and reliability of the proposed AR user interface is tested by experiments for three tasks: positioning the AFM probe tip close to a surface, just in contact with a surface, or below a surface by elastically indenting. Results of these tests showed the performance of the proposed user interface. This user interface would be critical for many nanorobotic applications in biotechnology, nanodevice prototyping, and nanotechnology education.</div>
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