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Index « Wicri.i » - entrée « Isolant »
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Irradiation < Isolant < Isolation thermique  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 45.
[0-20] [0 - 20][0 - 45][20-40]
Ident.Authors (with country if any)Title
000738 (2013) Photocurable propyl-cinnamate-functionalized polyhedral oligomeric silsesquioxane as a gate dielectric for organic thin film transistors
001017 (2013) Contact vs bulk effects in N-semi-insulating-N and P-semi-insulating-P diodes
00BC22 (2004) A nanoparticle-coated nanocrystal-gate for an InP-based heterostructure field-effect transistor
00C474 (2003-04-15) Implementation of an all-electron GW approximation based on the projector augmented wave method without plasmon pole approximation: Application to Si, SiC, AlAs, InAs, NaH, and KH
00EF21 (2002) Metalorganic chemical vapor deposition of oxide films on semiconductor substrates using aluminum, gallium, and indium alkyl chloride precursors
013039 (2000) Improved bias-thermal-stress method for the insulator charge measurement of BN/InP MIS structures
013094 (2000) High temperature sol-gel insulation coatings for HTS magnets and their adhesion properties
014A59 (1999) Rapid epitaxial growth of conducting and insulating III-V compounds on (001), (110), (111)A, (311)A, and (311)B surfaces by hydride vapor phase epitaxy
016F29 (1998) Impedance analysis of electrodeposited insulating polypyrrole
017286 (1998) Effects of insulating layers on the performance of organic electroluminescent devices
017889 (1997-11) Élaboration par dépôt chimique en phase vapeur assisté par plasma (PECVD) de films minces de nitrure de bore (BN) sur phosphure d'indium (InP)
017C35 (1997-07) CONTRIBUTION A L'AMELIORATION DE METHODES DE CARACTERISATIONS ELECTRIQUES DE STRUCTURES MIS (Au/BN/InP) ET MOS
018863 (1997) Organic electroluminescence device based on an electrodeposited poly(3-substituted thiophen) film
019083 (1997) Electrical conduction in POxNyInZ films deposited on InP
01AC37 (1996) Highly sensitive In0.75Ga0.25As/AlInAs Hall sensors
01B025 (1996) Differential charging in XPS. Part II. Sample mounting and X-ray flux effects on heterogeneous samples
01B140 (1996) Comparative measurements of the electron emission behavior of Si3N4-InGaAs interfaces prepared by remote and direct PECVD
01B210 (1996) Calculation of surface peak intensity of GaAs and InP in high-energy ion scattering
01C207 (1995) Self-trapped exciton luminescence induced by photoexcitation of the impurity ions in alkali halides
01CD43 (1995) Detailed investigation of InSb p-channel metal-oxide-semiconductor field effect transistor prepared by photo-enhanced chemical vapor deposition
01EE22 (1993) Dépôt de nitrure de bore par PECVD pour son utilisation comme isolant de grille dans les structures MISFET sur InP

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