SIMOX technology < SIMS < SIPBH laser

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 231.
[0-20] [0 - 20][0 - 50][20-40]

Ident.	Authors (with country if any)	Title
000305 (2013)		ToF-SIMS of metal-complex-based supramolecular architectures on oxide surfaces
000490 (2013)		Strong-field ionization of C60 sputtered neutral molecules using 1015W/cm2 of fs IR radiation
000577 (2013)		SIMS-EDX system for the quantitative analysis of solids
000626 (2013)		RFS ratio of silicon in III-V compound semi-conductor measured with different offset voltage
000815 (2013)		Observation of the absorption of the In-DTPA-hexa-lactoside (IDHL) and its distribution in vitro by ICP-MS and TOF-SIMS
000943 (2013)		Low-temperature growth of InxGa1-xN films by radio-frequency magnetron sputtering
000F98 (2013)		Core-shell structure of fly ash particles - SIMS depth profile analysis
001060 (2013)		Chemical evolution of InP/InGaAs/InGaAsP microstructures irradiated in air and deionized water with ArF and KrF lasers
001187 (2013)		A surface-ionization method of detection of a neutral component of indium sputtering under bombardment by cluster ions
001594 (2012)		SIMS using O-, F-, CI-, Br- and I- primary ion bombardment
001C35 (2012)		Evaluation of reagent effect on skin using time-of-flight secondary ion mass spectrometry and multivariate curve resolution
002323 (2011)		The effect of thin oxide film on protein sample measurement with TOF-SIMS
002596 (2011)		SIMS depth profile analysis of particles collected in an urban environment
002974 (2011)		Molecular dynamics study of metal-organic samples bombarded by kiloelectronvolt projectiles
002E66 (2011)		Focused ion beam implantation of Ga in InP studied by SIMS and dynamic computer simulations
002F39 (2011)		Evaluation of immobilized polypeptides with different C-terminal residues using argon gas-cluster SIMS
003219 (2011)		Depth-profiling analysis of MOCVD-grown triple junction solar cells by SIMS
003332 (2011)		Characterization and quantification of biological micropatterns using cluster SIMS
003A78 (2010)		Predicting the wettability of patterned ITO surface using ToF-SIMS images
003E35 (2010)		Investigation of molecular surfaces with time-of-flight secondary ion mass spectrometry
004210 (2010)		Epitaxial MOVPE growth of highly c-axis oriented InGaN/GaN films on ZnO- buffered Si (111) substrates

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