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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Semiconductor device measurement »
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Semiconductor device manufacture < Semiconductor device measurement < Semiconductor device models  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
001887 (2004-05-03) Double-transconductance-plateau characteristics in InGaAs/GaAs real-space transfer high-electron-mobility transistor
001918 (2004-01-26) One-polymer active pixel
001A71 (2003-09-29) Multiple negative differential resistance of InP/InGaAs superlattice-emitter resonant-tunneling bipolar transistor at room temperature
001A80 (2003-08-15) Carrier dynamics in nitride-based light-emitting p-n junction diodes with two active regions emitting at different wavelengths
001A86 (2003-07-28) Bright red-emitting electrophosphorescent device using osmium complex as a triplet emitter
001B01 (2003-05) Depletion- and enhancement-mode In0.49Ga0.51P/InGaAs/AlGaAs high-electron-mobility transistors with high-breakdown voltage
001B18 (2003-01) Study on dc characteristics of an interesting InP/InGaAs tunneling-emitter bipolar transistor with double heterostructures

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