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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Semiconductor device manufacture »
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Semiconductor device breakdown < Semiconductor device manufacture < Semiconductor device measurement  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 5.
Ident.Authors (with country if any)Title
001A13 (2004) Fabrication of 1.55-μm Si-based resonant cavity enhanced photodetectors using Sol-Gel bonding
001E84 (2001) The keys to get high transconductance of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs devices
002093 (2000) InP-based enhancement-mode pseudomorphic HEMT with strained In0.45Al0.55As barrier and In0.75Ga0.25As channel layers
002143 (2000) All-solid-state inorganic electrochromic display of WO3 and NiO films with LiNbO3 ion conductor
002270 (1999) High-performance, graded-base AlGaAs/InGaAs collector-up heterojunction bipolar transistors using a novel selective area regrowth process

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