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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Semiconductor device models »
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Semiconductor device measurement < Semiconductor device models < Semiconductor device noise  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 7.
Ident.Authors (with country if any)Title
001907 (2004-03-15) Dynamical conductance through InAs/GaSb/InAs and InAs/AlSb/GaSb/AlSb/InAs structures
001918 (2004-01-26) One-polymer active pixel
001C86 (2002-05) Extended radio frequency nonlinear model for power prediction of AlGaAs/InGaAs pseudomorphic high electron mobility transistors
002186 (1999-06-15) 1/f noise measurements on indium antimonide metal-oxide-semiconductor field-effect transistors
002319 (1998-06) Theoretical analysis of the Auger mechanism in a GaInAsSb infrared photovoltaic detector
002442 (1997-10-20) A novel waveguide structure to reduce beam divergence and threshold current in GaInP/AlGaInP visible quantum-well lasers
002458 (1997-05-15) Characteristics of InxGa1-xAs/GaAs pseudomorphic modulation doped field effect transistor

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