Structural properties of CoPt films patterned using ion irradiation
Identifieur interne :
000130 ( PascalFrancis/Curation );
précédent :
000129;
suivant :
000131
Structural properties of CoPt films patterned using ion irradiation
Auteurs : M. Abes [
France] ;
J. Venuat [
France] ;
D. Muller [
France] ;
A. Carvalho [
France] ;
G. Schmerber [
France] ;
E. Beaurepaire [
France] ;
A. Dinia [
France] ;
V. Pierron-Bohnes [
France]
Source :
-
Catalysis today [ 0920-5861 ] ; 2006.
RBID : Pascal:06-0371435
Descripteurs français
English descriptors
Abstract
Patterned CoPt films were fabricated using a combination of e-beam lithography and He+ ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He+ ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.
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A01 | 01 | 1 | | @0 0920-5861 |
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A03 | | 1 | | @0 Catal. today |
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A06 | | | | @2 3-4 |
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A08 | 01 | 1 | ENG | @1 Structural properties of CoPt films patterned using ion irradiation |
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A09 | 01 | 1 | ENG | @1 Catalysis, Nanomaterials and Environment |
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A11 | 01 | 1 | | @1 ABES (M.) |
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A11 | 02 | 1 | | @1 VENUAT (J.) |
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A11 | 03 | 1 | | @1 MULLER (D.) |
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A11 | 04 | 1 | | @1 CARVALHO (A.) |
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A11 | 05 | 1 | | @1 SCHMERBER (G.) |
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A11 | 06 | 1 | | @1 BEAUREPAIRE (E.) |
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A11 | 07 | 1 | | @1 DINIA (A.) |
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A11 | 08 | 1 | | @1 PIERRON-BOHNES (V.) |
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A12 | 01 | 1 | | @1 GARIN (François) @9 ed. |
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A12 | 02 | 1 | | @1 MAAMACHE (Mustapha) @9 ed. |
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A12 | 03 | 1 | | @1 SCHMERBER (Guy) @9 ed. |
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A12 | 04 | 1 | | @1 DEMANGEAT (Claude) @9 ed. |
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A14 | 01 | | | @1 IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43 @2 67034 Strasbourg @3 FRA @Z 1 aut. @Z 2 aut. @Z 4 aut. @Z 5 aut. @Z 6 aut. @Z 7 aut. @Z 8 aut. |
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A14 | 02 | | | @1 Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess @2 67037 Strasbourg @3 FRA @Z 3 aut. |
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A15 | 01 | | | @1 Laboratoire des Matériaux, Surfaces et Procédés pour la Catalyse (LMSPC), UMR 7515-CNRS-ULP-ECPM, 25 rue Becquerel @2 67087 Strasbourg @3 FRA @Z 1 aut. |
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A15 | 02 | | | @1 Département de Physique, Faculté des Sciences, Université Ferhat Abbas @2 1900 Sétif @3 DZA @Z 2 aut. |
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A15 | 03 | | | @1 Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, UMR 7504-CNRS-ULP, 23 rue du Loess, BP 43 @2 67034 Strasbourg @3 FRA @Z 3 aut. @Z 4 aut. |
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A20 | | | | @1 245-250 |
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A21 | | | | @1 2006 |
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A23 | 01 | | | @0 ENG |
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A43 | 01 | | | @1 INIST @2 21357 @5 354000142867030180 |
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A44 | | | | @0 0000 @1 © 2006 INIST-CNRS. All rights reserved. |
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A45 | | | | @0 13 ref. |
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A47 | 01 | 1 | | @0 06-0371435 |
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A60 | | | | @1 P @2 C |
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A61 | | | | @0 A |
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A64 | 01 | 1 | | @0 Catalysis today |
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A66 | 01 | | | @0 NLD |
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C01 | 01 | | ENG | @0 Patterned CoPt films were fabricated using a combination of e-beam lithography and He+ ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He+ ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies. |
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C02 | 01 | X | | @0 001C01A03 |
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C03 | 01 | X | FRE | @0 Film @5 01 |
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C03 | 01 | X | ENG | @0 Film @5 01 |
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C03 | 01 | X | SPA | @0 Película @5 01 |
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C03 | 02 | X | FRE | @0 Irradiation ion @5 02 |
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C03 | 02 | X | ENG | @0 Ion irradiation @5 02 |
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C03 | 02 | X | SPA | @0 Irradiación ión @5 02 |
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C03 | 03 | X | FRE | @0 Rugosité @5 03 |
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C03 | 03 | X | ENG | @0 Roughness @5 03 |
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C03 | 03 | X | SPA | @0 Rugosidad @5 03 |
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C03 | 04 | X | FRE | @0 Propriété magnétique @5 04 |
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C03 | 04 | X | ENG | @0 Magnetic properties @5 04 |
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C03 | 04 | X | SPA | @0 Propiedad magnética @5 04 |
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C03 | 05 | X | FRE | @0 Catalyse hétérogène @5 05 |
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C03 | 05 | X | ENG | @0 Heterogeneous catalysis @5 05 |
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C03 | 05 | X | SPA | @0 Catálisis heterogénea @5 05 |
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C03 | 06 | X | FRE | @0 Formation motif @5 06 |
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C03 | 06 | X | ENG | @0 Patterning @5 06 |
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C03 | 06 | X | SPA | @0 Formacíon motivo @5 06 |
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C03 | 07 | X | FRE | @0 Cobalt @2 NC @5 07 |
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C03 | 07 | X | ENG | @0 Cobalt @2 NC @5 07 |
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C03 | 07 | X | SPA | @0 Cobalto @2 NC @5 07 |
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C03 | 08 | X | FRE | @0 Platine @2 NC @5 08 |
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C03 | 08 | X | ENG | @0 Platinum @2 NC @5 08 |
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C03 | 08 | X | SPA | @0 Platino @2 NC @5 08 |
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C03 | 09 | X | FRE | @0 Métal transition @2 NC @5 09 |
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C03 | 09 | X | ENG | @0 Transition metal @2 NC @5 09 |
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C03 | 09 | X | SPA | @0 Metal transición @2 NC @5 09 |
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C03 | 10 | X | FRE | @0 Lithographie faisceau électron @5 10 |
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C03 | 10 | X | ENG | @0 Electron beam lithography @5 10 |
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C03 | 10 | X | SPA | @0 Litografía haz electrón @5 10 |
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N21 | | | | @1 247 |
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pR |
A30 | 01 | 1 | ENG | @1 Colloquium on Environment, Materials, Physics and Energy @3 Ouargla DZA @4 2004-12-11 |
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Le document en format XML
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<author><name sortKey="Pierron Bohnes, V" sort="Pierron Bohnes, V" uniqKey="Pierron Bohnes V" first="V." last="Pierron-Bohnes">V. Pierron-Bohnes</name>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Cobalt</term>
<term>Electron beam lithography</term>
<term>Film</term>
<term>Heterogeneous catalysis</term>
<term>Ion irradiation</term>
<term>Magnetic properties</term>
<term>Patterning</term>
<term>Platinum</term>
<term>Roughness</term>
<term>Transition metal</term>
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<term>Irradiation ion</term>
<term>Rugosité</term>
<term>Propriété magnétique</term>
<term>Catalyse hétérogène</term>
<term>Formation motif</term>
<term>Cobalt</term>
<term>Platine</term>
<term>Métal transition</term>
<term>Lithographie faisceau électron</term>
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<front><div type="abstract" xml:lang="en">Patterned CoPt films were fabricated using a combination of e-beam lithography and He<sup>+</sup>
ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He<sup>+</sup>
ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.</div>
</front>
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<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess</s1>
<s2>67037 Strasbourg</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
</fA14>
<fA15 i1="01"><s1>Laboratoire des Matériaux, Surfaces et Procédés pour la Catalyse (LMSPC), UMR 7515-CNRS-ULP-ECPM, 25 rue Becquerel</s1>
<s2>67087 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
</fA15>
<fA15 i1="02"><s1>Département de Physique, Faculté des Sciences, Université Ferhat Abbas</s1>
<s2>1900 Sétif</s2>
<s3>DZA</s3>
<sZ>2 aut.</sZ>
</fA15>
<fA15 i1="03"><s1>Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, UMR 7504-CNRS-ULP, 23 rue du Loess, BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</fA15>
<fA20><s1>245-250</s1>
</fA20>
<fA21><s1>2006</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>21357</s2>
<s5>354000142867030180</s5>
</fA43>
<fA44><s0>0000</s0>
<s1>© 2006 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45><s0>13 ref.</s0>
</fA45>
<fA47 i1="01" i2="1"><s0>06-0371435</s0>
</fA47>
<fA60><s1>P</s1>
<s2>C</s2>
</fA60>
<fA64 i1="01" i2="1"><s0>Catalysis today</s0>
</fA64>
<fA66 i1="01"><s0>NLD</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>Patterned CoPt films were fabricated using a combination of e-beam lithography and He<sup>+</sup>
ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He<sup>+</sup>
ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.</s0>
</fC01>
<fC02 i1="01" i2="X"><s0>001C01A03</s0>
</fC02>
<fC03 i1="01" i2="X" l="FRE"><s0>Film</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="X" l="ENG"><s0>Film</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="X" l="SPA"><s0>Película</s0>
<s5>01</s5>
</fC03>
<fC03 i1="02" i2="X" l="FRE"><s0>Irradiation ion</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="X" l="ENG"><s0>Ion irradiation</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="X" l="SPA"><s0>Irradiación ión</s0>
<s5>02</s5>
</fC03>
<fC03 i1="03" i2="X" l="FRE"><s0>Rugosité</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="ENG"><s0>Roughness</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="SPA"><s0>Rugosidad</s0>
<s5>03</s5>
</fC03>
<fC03 i1="04" i2="X" l="FRE"><s0>Propriété magnétique</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="ENG"><s0>Magnetic properties</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA"><s0>Propiedad magnética</s0>
<s5>04</s5>
</fC03>
<fC03 i1="05" i2="X" l="FRE"><s0>Catalyse hétérogène</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="X" l="ENG"><s0>Heterogeneous catalysis</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="X" l="SPA"><s0>Catálisis heterogénea</s0>
<s5>05</s5>
</fC03>
<fC03 i1="06" i2="X" l="FRE"><s0>Formation motif</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="X" l="ENG"><s0>Patterning</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="X" l="SPA"><s0>Formacíon motivo</s0>
<s5>06</s5>
</fC03>
<fC03 i1="07" i2="X" l="FRE"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="X" l="ENG"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="X" l="SPA"><s0>Cobalto</s0>
<s2>NC</s2>
<s5>07</s5>
</fC03>
<fC03 i1="08" i2="X" l="FRE"><s0>Platine</s0>
<s2>NC</s2>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="X" l="ENG"><s0>Platinum</s0>
<s2>NC</s2>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="X" l="SPA"><s0>Platino</s0>
<s2>NC</s2>
<s5>08</s5>
</fC03>
<fC03 i1="09" i2="X" l="FRE"><s0>Métal transition</s0>
<s2>NC</s2>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="ENG"><s0>Transition metal</s0>
<s2>NC</s2>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="SPA"><s0>Metal transición</s0>
<s2>NC</s2>
<s5>09</s5>
</fC03>
<fC03 i1="10" i2="X" l="FRE"><s0>Lithographie faisceau électron</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="ENG"><s0>Electron beam lithography</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="SPA"><s0>Litografía haz electrón</s0>
<s5>10</s5>
</fC03>
<fN21><s1>247</s1>
</fN21>
</pA>
<pR><fA30 i1="01" i2="1" l="ENG"><s1>Colloquium on Environment, Materials, Physics and Energy</s1>
<s3>Ouargla DZA</s3>
<s4>2004-12-11</s4>
</fA30>
</pR>
</standard>
</inist>
</record>
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