CobaltMaghrebV1, PascalFrancis, Corpus, bibRecord, 000165

Structural properties of CoPt films patterned using ion irradiation

Identifieur interne : 000165 ( PascalFrancis/Corpus ); précédent : 000164; suivant : 000166

Structural properties of CoPt films patterned using ion irradiation

Auteurs : M. Abes ; J. Venuat ; D. Muller ; A. Carvalho ; G. Schmerber ; E. Beaurepaire ; A. Dinia ; V. Pierron-Bohnes

Source :

Catalysis today [ 0920-5861 ] ; 2006.

RBID : Pascal:06-0371435

Descripteurs français

Pascal (Inist)
- Film, Irradiation ion, Rugosité, Propriété magnétique, Catalyse hétérogène, Formation motif, Cobalt, Platine, Métal transition, Lithographie faisceau électron.

English descriptors

KwdEn :
- Cobalt, Electron beam lithography, Film, Heterogeneous catalysis, Ion irradiation, Magnetic properties, Patterning, Platinum, Roughness, Transition metal.

Abstract

Patterned CoPt films were fabricated using a combination of e-beam lithography and He⁺ ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He⁺ ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.

Notice en format standard (ISO 2709)

Pour connaître la documentation sur le format Inist Standard.

A01	`01`	`1`		`@0 0920-5861`
A02	`01`			`@0 CATTEA`
A03		`1`		`@0 Catal. today`
A05				`@2 113`
A06				`@2 3-4`
A08	`01`	`1`	`ENG`	`@1 Structural properties of CoPt films patterned using ion irradiation`
A09	`01`	`1`	`ENG`	`@1 Catalysis, Nanomaterials and Environment`
A11	`01`	`1`		`@1 ABES (M.)`
A11	`02`	`1`		`@1 VENUAT (J.)`
A11	`03`	`1`		`@1 MULLER (D.)`
A11	`04`	`1`		`@1 CARVALHO (A.)`
A11	`05`	`1`		`@1 SCHMERBER (G.)`
A11	`06`	`1`		`@1 BEAUREPAIRE (E.)`
A11	`07`	`1`		`@1 DINIA (A.)`
A11	`08`	`1`		`@1 PIERRON-BOHNES (V.)`
A12	`01`	`1`		`@1 GARIN (François) @9 ed.`
A12	`02`	`1`		`@1 MAAMACHE (Mustapha) @9 ed.`
A12	`03`	`1`		`@1 SCHMERBER (Guy) @9 ed.`
A12	`04`	`1`		`@1 DEMANGEAT (Claude) @9 ed.`
A14	`01`			`@1 IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43 @2 67034 Strasbourg @3 FRA @Z 1 aut. @Z 2 aut. @Z 4 aut. @Z 5 aut. @Z 6 aut. @Z 7 aut. @Z 8 aut.`
A14	`02`			`@1 Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess @2 67037 Strasbourg @3 FRA @Z 3 aut.`
A15	`01`			`@1 Laboratoire des Matériaux, Surfaces et Procédés pour la Catalyse (LMSPC), UMR 7515-CNRS-ULP-ECPM, 25 rue Becquerel @2 67087 Strasbourg @3 FRA @Z 1 aut.`
A15	`02`			`@1 Département de Physique, Faculté des Sciences, Université Ferhat Abbas @2 1900 Sétif @3 DZA @Z 2 aut.`
A15	`03`			`@1 Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, UMR 7504-CNRS-ULP, 23 rue du Loess, BP 43 @2 67034 Strasbourg @3 FRA @Z 3 aut. @Z 4 aut.`
A20				`@1 245-250`
A21				`@1 2006`
A23	`01`			`@0 ENG`
A43	`01`			`@1 INIST @2 21357 @5 354000142867030180`
A44				`@0 0000 @1 © 2006 INIST-CNRS. All rights reserved.`
A45				`@0 13 ref.`
A47	`01`	`1`		`@0 06-0371435`
A60				`@1 P @2 C`
A61				`@0 A`
A64	`01`	`1`		`@0 Catalysis today`
A66	`01`			`@0 NLD`
C01	`01`		`ENG`	@0 Patterned CoPt films were fabricated using a combination of e-beam lithography and He⁺ ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He⁺ ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.
C02	`01`	`X`		`@0 001C01A03`
C03	`01`	`X`	`FRE`	`@0 Film @5 01`
C03	`01`	`X`	`ENG`	`@0 Film @5 01`
C03	`01`	`X`	`SPA`	`@0 Película @5 01`
C03	`02`	`X`	`FRE`	`@0 Irradiation ion @5 02`
C03	`02`	`X`	`ENG`	`@0 Ion irradiation @5 02`
C03	`02`	`X`	`SPA`	`@0 Irradiación ión @5 02`
C03	`03`	`X`	`FRE`	`@0 Rugosité @5 03`
C03	`03`	`X`	`ENG`	`@0 Roughness @5 03`
C03	`03`	`X`	`SPA`	`@0 Rugosidad @5 03`
C03	`04`	`X`	`FRE`	`@0 Propriété magnétique @5 04`
C03	`04`	`X`	`ENG`	`@0 Magnetic properties @5 04`
C03	`04`	`X`	`SPA`	`@0 Propiedad magnética @5 04`
C03	`05`	`X`	`FRE`	`@0 Catalyse hétérogène @5 05`
C03	`05`	`X`	`ENG`	`@0 Heterogeneous catalysis @5 05`
C03	`05`	`X`	`SPA`	`@0 Catálisis heterogénea @5 05`
C03	`06`	`X`	`FRE`	`@0 Formation motif @5 06`
C03	`06`	`X`	`ENG`	`@0 Patterning @5 06`
C03	`06`	`X`	`SPA`	`@0 Formacíon motivo @5 06`
C03	`07`	`X`	`FRE`	`@0 Cobalt @2 NC @5 07`
C03	`07`	`X`	`ENG`	`@0 Cobalt @2 NC @5 07`
C03	`07`	`X`	`SPA`	`@0 Cobalto @2 NC @5 07`
C03	`08`	`X`	`FRE`	`@0 Platine @2 NC @5 08`
C03	`08`	`X`	`ENG`	`@0 Platinum @2 NC @5 08`
C03	`08`	`X`	`SPA`	`@0 Platino @2 NC @5 08`
C03	`09`	`X`	`FRE`	`@0 Métal transition @2 NC @5 09`
C03	`09`	`X`	`ENG`	`@0 Transition metal @2 NC @5 09`
C03	`09`	`X`	`SPA`	`@0 Metal transición @2 NC @5 09`
C03	`10`	`X`	`FRE`	`@0 Lithographie faisceau électron @5 10`
C03	`10`	`X`	`ENG`	`@0 Electron beam lithography @5 10`
C03	`10`	`X`	`SPA`	`@0 Litografía haz electrón @5 10`
N21				`@1 247`

A30	`01`	`1`	`ENG`	`@1 Colloquium on Environment, Materials, Physics and Energy @3 Ouargla DZA @4 2004-12-11`

Format Inist (serveur)

NO :	PASCAL 06-0371435 INIST
ET :	Structural properties of CoPt films patterned using ion irradiation
AU :	ABES (M.); VENUAT (J.); MULLER (D.); CARVALHO (A.); SCHMERBER (G.); BEAUREPAIRE (E.); DINIA (A.); PIERRON-BOHNES (V.); GARIN (François); MAAMACHE (Mustapha); SCHMERBER (Guy); DEMANGEAT (Claude)
AF :	IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43/67034 Strasbourg/France (1 aut., 2 aut., 4 aut., 5 aut., 6 aut., 7 aut., 8 aut.); Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess/67037 Strasbourg/France (3 aut.); Laboratoire des Matériaux, Surfaces et Procédés pour la Catalyse (LMSPC), UMR 7515-CNRS-ULP-ECPM, 25 rue Becquerel/67087 Strasbourg/France (1 aut.); Département de Physique, Faculté des Sciences, Université Ferhat Abbas/1900 Sétif/Algérie (2 aut.); Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, UMR 7504-CNRS-ULP, 23 rue du Loess, BP 43/67034 Strasbourg/France (3 aut., 4 aut.)
DT :	Publication en série; Congrès; Niveau analytique
SO :	Catalysis today; ISSN 0920-5861; Coden CATTEA; Pays-Bas; Da. 2006; Vol. 113; No. 3-4; Pp. 245-250; Bibl. 13 ref.
LA :	Anglais
EA :	Patterned CoPt films were fabricated using a combination of e-beam lithography and He⁺ ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He⁺ ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.
CC :	001C01A03
FD :	Film; Irradiation ion; Rugosité; Propriété magnétique; Catalyse hétérogène; Formation motif; Cobalt; Platine; Métal transition; Lithographie faisceau électron
ED :	Film; Ion irradiation; Roughness; Magnetic properties; Heterogeneous catalysis; Patterning; Cobalt; Platinum; Transition metal; Electron beam lithography
SD :	Película; Irradiación ión; Rugosidad; Propiedad magnética; Catálisis heterogénea; Formacíon motivo; Cobalto; Platino; Metal transición; Litografía haz electrón
LO :	INIST-21357.354000142867030180
ID :	06-0371435

Links to Exploration step

Pascal:06-0371435

Le document en format XML

<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Structural properties of CoPt films patterned using ion irradiation</title>
<author><name sortKey="Abes, M" sort="Abes, M" uniqKey="Abes M" first="M." last="Abes">M. Abes</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Venuat, J" sort="Venuat, J" uniqKey="Venuat J" first="J." last="Venuat">J. Venuat</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Muller, D" sort="Muller, D" uniqKey="Muller D" first="D." last="Muller">D. Muller</name>
<affiliation><inist:fA14 i1="02"><s1>Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess</s1>
<s2>67037 Strasbourg</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Carvalho, A" sort="Carvalho, A" uniqKey="Carvalho A" first="A." last="Carvalho">A. Carvalho</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Schmerber, G" sort="Schmerber, G" uniqKey="Schmerber G" first="G." last="Schmerber">G. Schmerber</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Beaurepaire, E" sort="Beaurepaire, E" uniqKey="Beaurepaire E" first="E." last="Beaurepaire">E. Beaurepaire</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Dinia, A" sort="Dinia, A" uniqKey="Dinia A" first="A." last="Dinia">A. Dinia</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Pierron Bohnes, V" sort="Pierron Bohnes, V" uniqKey="Pierron Bohnes V" first="V." last="Pierron-Bohnes">V. Pierron-Bohnes</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
</titleStmt>
<publicationStmt><idno type="wicri:source">INIST</idno>
<idno type="inist">06-0371435</idno>
<date when="2006">2006</date>
<idno type="stanalyst">PASCAL 06-0371435 INIST</idno>
<idno type="RBID">Pascal:06-0371435</idno>
<idno type="wicri:Area/PascalFrancis/Corpus">000165</idno>
</publicationStmt>
<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Structural properties of CoPt films patterned using ion irradiation</title>
<author><name sortKey="Abes, M" sort="Abes, M" uniqKey="Abes M" first="M." last="Abes">M. Abes</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Venuat, J" sort="Venuat, J" uniqKey="Venuat J" first="J." last="Venuat">J. Venuat</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Muller, D" sort="Muller, D" uniqKey="Muller D" first="D." last="Muller">D. Muller</name>
<affiliation><inist:fA14 i1="02"><s1>Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess</s1>
<s2>67037 Strasbourg</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Carvalho, A" sort="Carvalho, A" uniqKey="Carvalho A" first="A." last="Carvalho">A. Carvalho</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Schmerber, G" sort="Schmerber, G" uniqKey="Schmerber G" first="G." last="Schmerber">G. Schmerber</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Beaurepaire, E" sort="Beaurepaire, E" uniqKey="Beaurepaire E" first="E." last="Beaurepaire">E. Beaurepaire</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Dinia, A" sort="Dinia, A" uniqKey="Dinia A" first="A." last="Dinia">A. Dinia</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
<author><name sortKey="Pierron Bohnes, V" sort="Pierron Bohnes, V" uniqKey="Pierron Bohnes V" first="V." last="Pierron-Bohnes">V. Pierron-Bohnes</name>
<affiliation><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</inist:fA14>
</affiliation>
</author>
</analytic>
<series><title level="j" type="main">Catalysis today</title>
<title level="j" type="abbreviated">Catal. today</title>
<idno type="ISSN">0920-5861</idno>
<imprint><date when="2006">2006</date>
</imprint>
</series>
</biblStruct>
</sourceDesc>
<seriesStmt><title level="j" type="main">Catalysis today</title>
<title level="j" type="abbreviated">Catal. today</title>
<idno type="ISSN">0920-5861</idno>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Cobalt</term>
<term>Electron beam lithography</term>
<term>Film</term>
<term>Heterogeneous catalysis</term>
<term>Ion irradiation</term>
<term>Magnetic properties</term>
<term>Patterning</term>
<term>Platinum</term>
<term>Roughness</term>
<term>Transition metal</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Film</term>
<term>Irradiation ion</term>
<term>Rugosité</term>
<term>Propriété magnétique</term>
<term>Catalyse hétérogène</term>
<term>Formation motif</term>
<term>Cobalt</term>
<term>Platine</term>
<term>Métal transition</term>
<term>Lithographie faisceau électron</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">Patterned CoPt films were fabricated using a combination of e-beam lithography and He<sup>+</sup>
 ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He<sup>+</sup>
 ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.</div>
</front>
</TEI>
<inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0920-5861</s0>
</fA01>
<fA02 i1="01"><s0>CATTEA</s0>
</fA02>
<fA03 i2="1"><s0>Catal. today</s0>
</fA03>
<fA05><s2>113</s2>
</fA05>
<fA06><s2>3-4</s2>
</fA06>
<fA08 i1="01" i2="1" l="ENG"><s1>Structural properties of CoPt films patterned using ion irradiation</s1>
</fA08>
<fA09 i1="01" i2="1" l="ENG"><s1>Catalysis, Nanomaterials and Environment</s1>
</fA09>
<fA11 i1="01" i2="1"><s1>ABES (M.)</s1>
</fA11>
<fA11 i1="02" i2="1"><s1>VENUAT (J.)</s1>
</fA11>
<fA11 i1="03" i2="1"><s1>MULLER (D.)</s1>
</fA11>
<fA11 i1="04" i2="1"><s1>CARVALHO (A.)</s1>
</fA11>
<fA11 i1="05" i2="1"><s1>SCHMERBER (G.)</s1>
</fA11>
<fA11 i1="06" i2="1"><s1>BEAUREPAIRE (E.)</s1>
</fA11>
<fA11 i1="07" i2="1"><s1>DINIA (A.)</s1>
</fA11>
<fA11 i1="08" i2="1"><s1>PIERRON-BOHNES (V.)</s1>
</fA11>
<fA12 i1="01" i2="1"><s1>GARIN (François)</s1>
<s9>ed.</s9>
</fA12>
<fA12 i1="02" i2="1"><s1>MAAMACHE (Mustapha)</s1>
<s9>ed.</s9>
</fA12>
<fA12 i1="03" i2="1"><s1>SCHMERBER (Guy)</s1>
<s9>ed.</s9>
</fA12>
<fA12 i1="04" i2="1"><s1>DEMANGEAT (Claude)</s1>
<s9>ed.</s9>
</fA12>
<fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
<sZ>4 aut.</sZ>
<sZ>5 aut.</sZ>
<sZ>6 aut.</sZ>
<sZ>7 aut.</sZ>
<sZ>8 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess</s1>
<s2>67037 Strasbourg</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
</fA14>
<fA15 i1="01"><s1>Laboratoire des Matériaux, Surfaces et Procédés pour la Catalyse (LMSPC), UMR 7515-CNRS-ULP-ECPM, 25 rue Becquerel</s1>
<s2>67087 Strasbourg</s2>
<s3>FRA</s3>
<sZ>1 aut.</sZ>
</fA15>
<fA15 i1="02"><s1>Département de Physique, Faculté des Sciences, Université Ferhat Abbas</s1>
<s2>1900 Sétif</s2>
<s3>DZA</s3>
<sZ>2 aut.</sZ>
</fA15>
<fA15 i1="03"><s1>Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, UMR 7504-CNRS-ULP, 23 rue du Loess, BP 43</s1>
<s2>67034 Strasbourg</s2>
<s3>FRA</s3>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</fA15>
<fA20><s1>245-250</s1>
</fA20>
<fA21><s1>2006</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>21357</s2>
<s5>354000142867030180</s5>
</fA43>
<fA44><s0>0000</s0>
<s1>© 2006 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45><s0>13 ref.</s0>
</fA45>
<fA47 i1="01" i2="1"><s0>06-0371435</s0>
</fA47>
<fA60><s1>P</s1>
<s2>C</s2>
</fA60>
<fA61><s0>A</s0>
</fA61>
<fA64 i1="01" i2="1"><s0>Catalysis today</s0>
</fA64>
<fA66 i1="01"><s0>NLD</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>Patterned CoPt films were fabricated using a combination of e-beam lithography and He<sup>+</sup>
 ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He<sup>+</sup>
 ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.</s0>
</fC01>
<fC02 i1="01" i2="X"><s0>001C01A03</s0>
</fC02>
<fC03 i1="01" i2="X" l="FRE"><s0>Film</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="X" l="ENG"><s0>Film</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="X" l="SPA"><s0>Película</s0>
<s5>01</s5>
</fC03>
<fC03 i1="02" i2="X" l="FRE"><s0>Irradiation ion</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="X" l="ENG"><s0>Ion irradiation</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="X" l="SPA"><s0>Irradiación ión</s0>
<s5>02</s5>
</fC03>
<fC03 i1="03" i2="X" l="FRE"><s0>Rugosité</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="ENG"><s0>Roughness</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="X" l="SPA"><s0>Rugosidad</s0>
<s5>03</s5>
</fC03>
<fC03 i1="04" i2="X" l="FRE"><s0>Propriété magnétique</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="ENG"><s0>Magnetic properties</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA"><s0>Propiedad magnética</s0>
<s5>04</s5>
</fC03>
<fC03 i1="05" i2="X" l="FRE"><s0>Catalyse hétérogène</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="X" l="ENG"><s0>Heterogeneous catalysis</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="X" l="SPA"><s0>Catálisis heterogénea</s0>
<s5>05</s5>
</fC03>
<fC03 i1="06" i2="X" l="FRE"><s0>Formation motif</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="X" l="ENG"><s0>Patterning</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="X" l="SPA"><s0>Formacíon motivo</s0>
<s5>06</s5>
</fC03>
<fC03 i1="07" i2="X" l="FRE"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="X" l="ENG"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="X" l="SPA"><s0>Cobalto</s0>
<s2>NC</s2>
<s5>07</s5>
</fC03>
<fC03 i1="08" i2="X" l="FRE"><s0>Platine</s0>
<s2>NC</s2>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="X" l="ENG"><s0>Platinum</s0>
<s2>NC</s2>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="X" l="SPA"><s0>Platino</s0>
<s2>NC</s2>
<s5>08</s5>
</fC03>
<fC03 i1="09" i2="X" l="FRE"><s0>Métal transition</s0>
<s2>NC</s2>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="ENG"><s0>Transition metal</s0>
<s2>NC</s2>
<s5>09</s5>
</fC03>
<fC03 i1="09" i2="X" l="SPA"><s0>Metal transición</s0>
<s2>NC</s2>
<s5>09</s5>
</fC03>
<fC03 i1="10" i2="X" l="FRE"><s0>Lithographie faisceau électron</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="ENG"><s0>Electron beam lithography</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="X" l="SPA"><s0>Litografía  haz electrón</s0>
<s5>10</s5>
</fC03>
<fN21><s1>247</s1>
</fN21>
</pA>
<pR><fA30 i1="01" i2="1" l="ENG"><s1>Colloquium on Environment, Materials, Physics and Energy</s1>
<s3>Ouargla DZA</s3>
<s4>2004-12-11</s4>
</fA30>
</pR>
</standard>
<server><NO>PASCAL 06-0371435 INIST</NO>
<ET>Structural properties of CoPt films patterned using ion irradiation</ET>
<AU>ABES (M.); VENUAT (J.); MULLER (D.); CARVALHO (A.); SCHMERBER (G.); BEAUREPAIRE (E.); DINIA (A.); PIERRON-BOHNES (V.); GARIN (François); MAAMACHE (Mustapha); SCHMERBER (Guy); DEMANGEAT (Claude)</AU>
<AF>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43/67034 Strasbourg/France (1 aut., 2 aut., 4 aut., 5 aut., 6 aut., 7 aut., 8 aut.); Laboratoire PHASE, (UPR 292 CNRS), 23 rue du Laess/67037 Strasbourg/France (3 aut.); Laboratoire des Matériaux, Surfaces et Procédés pour la Catalyse (LMSPC), UMR 7515-CNRS-ULP-ECPM, 25 rue Becquerel/67087 Strasbourg/France (1 aut.); Département de Physique, Faculté des Sciences, Université Ferhat Abbas/1900 Sétif/Algérie (2 aut.); Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Université Louis Pasteur, UMR 7504-CNRS-ULP, 23 rue du Loess, BP 43/67034 Strasbourg/France (3 aut., 4 aut.)</AF>
<DT>Publication en série; Congrès; Niveau analytique</DT>
<SO>Catalysis today; ISSN 0920-5861; Coden CATTEA; Pays-Bas; Da. 2006; Vol. 113; No. 3-4; Pp. 245-250; Bibl. 13 ref.</SO>
<LA>Anglais</LA>
<EA>Patterned CoPt films were fabricated using a combination of e-beam lithography and He<sup>+</sup>
 ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He<sup>+</sup>
 ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.</EA>
<CC>001C01A03</CC>
<FD>Film; Irradiation ion; Rugosité; Propriété magnétique; Catalyse hétérogène; Formation motif; Cobalt; Platine; Métal transition; Lithographie faisceau électron</FD>
<ED>Film; Ion irradiation; Roughness; Magnetic properties; Heterogeneous catalysis; Patterning; Cobalt; Platinum; Transition metal; Electron beam lithography</ED>
<SD>Película; Irradiación ión; Rugosidad; Propiedad magnética; Catálisis heterogénea; Formacíon motivo; Cobalto; Platino; Metal transición; Litografía haz electrón</SD>
<LO>INIST-21357.354000142867030180</LO>
<ID>06-0371435</ID>
</server>
</inist>
</record>

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Structural properties of CoPt films patterned using ion irradiation

Structural properties of CoPt films patterned using ion irradiation

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