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Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems

Identifieur interne : 000078 ( PascalFrancis/Corpus ); précédent : 000077; suivant : 000079

Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems

Auteurs : B. Elsafi ; F. Trigui ; Z. Fakhfakh

Source :

RBID : Pascal:11-0033771

Descripteurs français

English descriptors

Abstract

The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.

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Pour connaître la documentation sur le format Inist Standard.

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A01 01  1    @0 0927-0256
A03   1    @0 Comput. mater. sci.
A05       @2 50
A06       @2 2
A08 01  1  ENG  @1 Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems
A11 01  1    @1 ELSAFI (B.)
A11 02  1    @1 TRIGUI (F.)
A11 03  1    @1 FAKHFAKH (Z.)
A14 01      @1 LaMaCop, Faculté des Sciences de Sfax. BP 802 @2 CP 3018 Sfax @3 TUN @Z 1 aut. @Z 2 aut. @Z 3 aut.
A20       @1 800-804
A21       @1 2010
A23 01      @0 ENG
A43 01      @1 INIST @2 26032 @5 354000193478560700
A44       @0 0000 @1 © 2011 INIST-CNRS. All rights reserved.
A45       @0 18 ref.
A47 01  1    @0 11-0033771
A60       @1 P
A61       @0 A
A64 01  1    @0 Computational materials science
A66 01      @0 NLD
C01 01    ENG  @0 The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.
C02 01  3    @0 001B70E47D
C03 01  3  FRE  @0 Magnétorésistance géante @5 04
C03 01  3  ENG  @0 Giant magnetoresistance @5 04
C03 02  X  FRE  @0 Théorie semiclassique @5 05
C03 02  X  ENG  @0 Semiclassical theory @5 05
C03 02  X  SPA  @0 Teoría semiclásica @5 05
C03 03  3  FRE  @0 Rugosité @5 06
C03 03  3  ENG  @0 Roughness @5 06
C03 04  X  FRE  @0 Modèle phénoménologique @5 07
C03 04  X  ENG  @0 Phenomenological model @5 07
C03 04  X  SPA  @0 Modelo fenomenológico @5 07
C03 05  3  FRE  @0 Temps relaxation @5 09
C03 05  3  ENG  @0 Relaxation time @5 09
C03 06  3  FRE  @0 Epaisseur @5 10
C03 06  3  ENG  @0 Thickness @5 10
C03 07  3  FRE  @0 Cuivre @2 NC @5 15
C03 07  3  ENG  @0 Copper @2 NC @5 15
C03 08  3  FRE  @0 Multicouche @5 16
C03 08  3  ENG  @0 Multilayers @5 16
C03 09  3  FRE  @0 Couche mince @5 17
C03 09  3  ENG  @0 Thin films @5 17
C03 10  3  FRE  @0 Cobalt @2 NC @5 18
C03 10  3  ENG  @0 Cobalt @2 NC @5 18
N21       @1 024

Format Inist (serveur)

NO : PASCAL 11-0033771 INIST
ET : Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems
AU : ELSAFI (B.); TRIGUI (F.); FAKHFAKH (Z.)
AF : LaMaCop, Faculté des Sciences de Sfax. BP 802/CP 3018 Sfax/Tunisie (1 aut., 2 aut., 3 aut.)
DT : Publication en série; Niveau analytique
SO : Computational materials science; ISSN 0927-0256; Pays-Bas; Da. 2010; Vol. 50; No. 2; Pp. 800-804; Bibl. 18 ref.
LA : Anglais
EA : The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.
CC : 001B70E47D
FD : Magnétorésistance géante; Théorie semiclassique; Rugosité; Modèle phénoménologique; Temps relaxation; Epaisseur; Cuivre; Multicouche; Couche mince; Cobalt
ED : Giant magnetoresistance; Semiclassical theory; Roughness; Phenomenological model; Relaxation time; Thickness; Copper; Multilayers; Thin films; Cobalt
SD : Teoría semiclásica; Modelo fenomenológico
LO : INIST-26032.354000193478560700
ID : 11-0033771

Links to Exploration step

Pascal:11-0033771

Le document en format XML

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<sub>n</sub>
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