Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems
Identifieur interne : 000078 ( PascalFrancis/Corpus ); précédent : 000077; suivant : 000079Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems
Auteurs : B. Elsafi ; F. Trigui ; Z. FakhfakhSource :
- Computational materials science [ 0927-0256 ] ; 2010.
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- Pascal (Inist)
English descriptors
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Abstract
The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.
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NO : | PASCAL 11-0033771 INIST |
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ET : | Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems |
AU : | ELSAFI (B.); TRIGUI (F.); FAKHFAKH (Z.) |
AF : | LaMaCop, Faculté des Sciences de Sfax. BP 802/CP 3018 Sfax/Tunisie (1 aut., 2 aut., 3 aut.) |
DT : | Publication en série; Niveau analytique |
SO : | Computational materials science; ISSN 0927-0256; Pays-Bas; Da. 2010; Vol. 50; No. 2; Pp. 800-804; Bibl. 18 ref. |
LA : | Anglais |
EA : | The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)n has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer. |
CC : | 001B70E47D |
FD : | Magnétorésistance géante; Théorie semiclassique; Rugosité; Modèle phénoménologique; Temps relaxation; Epaisseur; Cuivre; Multicouche; Couche mince; Cobalt |
ED : | Giant magnetoresistance; Semiclassical theory; Roughness; Phenomenological model; Relaxation time; Thickness; Copper; Multilayers; Thin films; Cobalt |
SD : | Teoría semiclásica; Modelo fenomenológico |
LO : | INIST-26032.354000193478560700 |
ID : | 11-0033771 |
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Pascal:11-0033771Le document en format XML
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<front><div type="abstract" xml:lang="en">The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)<sub>n</sub>
has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.</div>
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<server><NO>PASCAL 11-0033771 INIST</NO>
<ET>Effects of bulk and interface scattering on giant magnetoresistance in the Co/Cu multilayer systems</ET>
<AU>ELSAFI (B.); TRIGUI (F.); FAKHFAKH (Z.)</AU>
<AF>LaMaCop, Faculté des Sciences de Sfax. BP 802/CP 3018 Sfax/Tunisie (1 aut., 2 aut., 3 aut.)</AF>
<DT>Publication en série; Niveau analytique</DT>
<SO>Computational materials science; ISSN 0927-0256; Pays-Bas; Da. 2010; Vol. 50; No. 2; Pp. 800-804; Bibl. 18 ref.</SO>
<LA>Anglais</LA>
<EA>The evolution of the giant magnetoresistance (GMR) effect in thin film multilayers based on (Co/Cu)<sub>n</sub>
has been investigated by using semi-classical approach of the two spin channel currents developed by Hood, Falicov and Penn. The in plane MR of Co/Cu multilayers is calculated for correlated quasiperiodic interfaces. The numerical results show important influence of interface roughness on the behaviour of MR. The variation of MR with phenomenological parameters S↑ and S↓ for two directions of spin and relaxation time is reported. This interface roughness has been successfully included in our GMR simulation using a semi-classical description to analyse the experimental results giving the variation of MR with the thickness of the copper interlayer.</EA>
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