CobaltMaghrebV1, PascalFrancis, Checkpoint, bibRecord, 000125

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Identifieur interne : 000125 ( PascalFrancis/Checkpoint ); précédent : 000124; suivant : 000126

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Auteurs : A. Kharmouche [Algérie] ; I. Djouada [Algérie]

Source :

Applied surface science [ 0169-4332 ] ; 2008.

RBID : Pascal:08-0446682

Descripteurs français

Pascal (Inist)
- Composition surface, Verre, Couche mince, Evaporation sous vide, Modélisation, RBS, Epaisseur, Simulation, Diffusion mutuelle, Diffusion(transport), Diffraction RX, Réseau hexagonal compact, Orientation préférentielle, Microscopie force atomique, Cobalt alliage, Chrome alliage, Alliage binaire, Alliage CoCr, Silicium, 6855J, 8280Y, 6855N, 6110N.
Wicri :
- topic : Verre, Simulation.

English descriptors

KwdEn :
- Atomic force microscopy, Binary alloys, Chromium alloys, Cobalt alloys, Diffusion, Glass, HCP lattices, Interdiffusion, Modelling, Preferred orientation, RBS, Silicon, Simulation, Surface composition, Thickness, Thin films, Vacuum evaporation, XRD.

Abstract

Series of Co_xCr_1-x thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.

Affiliations:

Algérie

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Le document en format XML

<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
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<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
<wicri:noRegion>Sétif 19000</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
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<series><title level="j" type="main">Applied surface science</title>
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<seriesStmt><title level="j" type="main">Applied surface science</title>
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<idno type="ISSN">0169-4332</idno>
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</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Atomic force microscopy</term>
<term>Binary alloys</term>
<term>Chromium alloys</term>
<term>Cobalt alloys</term>
<term>Diffusion</term>
<term>Glass</term>
<term>HCP lattices</term>
<term>Interdiffusion</term>
<term>Modelling</term>
<term>Preferred orientation</term>
<term>RBS</term>
<term>Silicon</term>
<term>Simulation</term>
<term>Surface composition</term>
<term>Thickness</term>
<term>Thin films</term>
<term>Vacuum evaporation</term>
<term>XRD</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Composition surface</term>
<term>Verre</term>
<term>Couche mince</term>
<term>Evaporation sous vide</term>
<term>Modélisation</term>
<term>RBS</term>
<term>Epaisseur</term>
<term>Simulation</term>
<term>Diffusion mutuelle</term>
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<term>Diffraction RX</term>
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<term>Chrome alliage</term>
<term>Alliage binaire</term>
<term>Alliage CoCr</term>
<term>Silicium</term>
<term>6855J</term>
<term>8280Y</term>
<term>6855N</term>
<term>6110N</term>
</keywords>
<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Verre</term>
<term>Simulation</term>
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<front><div type="abstract" xml:lang="en">Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
 thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</div>
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Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</s1>
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<fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
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<fC01 i1="01" l="ENG"><s0>Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
 thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</s0>
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<fC03 i1="04" i2="3" l="FRE"><s0>Evaporation sous vide</s0>
<s5>04</s5>
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<s5>07</s5>
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<s5>08</s5>
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<fC03 i1="06" i2="3" l="ENG"><s0>RBS</s0>
<s5>08</s5>
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<s5>09</s5>
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<fC03 i1="07" i2="3" l="ENG"><s0>Thickness</s0>
<s5>09</s5>
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<s5>10</s5>
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<s5>10</s5>
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<s5>12</s5>
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<s5>12</s5>
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<s5>13</s5>
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<s5>15</s5>
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<s5>15</s5>
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<s5>15</s5>
</fC03>
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<s5>16</s5>
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<s5>16</s5>
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<s5>17</s5>
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<s5>17</s5>
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<fC03 i1="16" i2="3" l="FRE"><s0>Chrome alliage</s0>
<s5>18</s5>
</fC03>
<fC03 i1="16" i2="3" l="ENG"><s0>Chromium alloys</s0>
<s5>18</s5>
</fC03>
<fC03 i1="17" i2="3" l="FRE"><s0>Alliage binaire</s0>
<s5>19</s5>
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<fC03 i1="17" i2="3" l="ENG"><s0>Binary alloys</s0>
<s5>19</s5>
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<fC03 i1="18" i2="3" l="FRE"><s0>Alliage CoCr</s0>
<s4>INC</s4>
<s5>32</s5>
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<s2>NC</s2>
<s5>41</s5>
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<fC03 i1="19" i2="3" l="ENG"><s0>Silicon</s0>
<s2>NC</s2>
<s5>41</s5>
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<s2>PAC</s2>
<s4>INC</s4>
<s5>46</s5>
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<fC03 i1="22" i2="3" l="FRE"><s0>6855N</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>47</s5>
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<fC03 i1="23" i2="3" l="FRE"><s0>6110N</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>48</s5>
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<s5>20</s5>
</fC07>
<fC07 i1="01" i2="3" l="ENG"><s0>Transition element alloys</s0>
<s5>20</s5>
</fC07>
<fN21><s1>287</s1>
</fN21>
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<affiliations><list><country><li>Algérie</li>
</country>
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<tree><country name="Algérie"><noRegion><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
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<name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
</country>
</tree>
</affiliations>
</record>

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Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Source :

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Links to Exploration step

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri