CobaltMaghrebV1, PascalFrancis, Curation, bibRecord, 000172

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Identifieur interne : 000172 ( PascalFrancis/Curation ); précédent : 000171; suivant : 000173

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Auteurs : A. Kharmouche [Algérie] ; I. Djouada [Algérie]

Source :

Applied surface science [ 0169-4332 ] ; 2008.

RBID : Pascal:08-0446682

Descripteurs français

Pascal (Inist)
- Composition surface, Verre, Couche mince, Evaporation sous vide, Modélisation, RBS, Epaisseur, Simulation, Diffusion mutuelle, Diffusion(transport), Diffraction RX, Réseau hexagonal compact, Orientation préférentielle, Microscopie force atomique, Cobalt alliage, Chrome alliage, Alliage binaire, Alliage CoCr, Silicium, 6855J, 8280Y, 6855N, 6110N.
Wicri :
- topic : Verre, Simulation.

English descriptors

KwdEn :
- Atomic force microscopy, Binary alloys, Chromium alloys, Cobalt alloys, Diffusion, Glass, HCP lattices, Interdiffusion, Modelling, Preferred orientation, RBS, Silicon, Simulation, Surface composition, Thickness, Thin films, Vacuum evaporation, XRD.

Abstract

Series of Co_xCr_1-x thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.

A01	`01`	`1`		`@0 0169-4332`
A03		`1`		`@0 Appl. surf. sci.`
A05				`@2 254`
A06				`@2 18`
A08	`01`	`1`	`ENG`	`@1 Structural studies of evaporated Co_xCr_1-x/Si (1 0 0) and Co_xCr_1-x/glass thin films`
A11	`01`	`1`		`@1 KHARMOUCHE (A.)`
A11	`02`	`1`		`@1 DJOUADA (I.)`
A14	`01`			`@1 Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas @2 Sétif 19000 @3 DZA @Z 1 aut. @Z 2 aut.`
A20				`@1 5732-5735`
A21				`@1 2008`
A23	`01`			`@0 ENG`
A43	`01`			`@1 INIST @2 16002 @5 354000197872590160`
A44				`@0 0000 @1 © 2008 INIST-CNRS. All rights reserved.`
A45				`@0 16 ref.`
A47	`01`	`1`		`@0 08-0446682`
A60				`@1 P`
A61				`@0 A`
A64	`01`	`1`		`@0 Applied surface science`
A66	`01`			`@0 NLD`
C01	`01`		`ENG`	@0 Series of Co_xCr_1-x thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.
C02	`01`	`3`		`@0 001B60H55J`
C02	`02`	`X`		`@0 001C04G`
C02	`03`	`3`		`@0 001B60H55N`
C02	`04`	`3`		`@0 001B60A10N`
C03	`01`	`3`	`FRE`	`@0 Composition surface @5 01`
C03	`01`	`3`	`ENG`	`@0 Surface composition @5 01`
C03	`02`	`3`	`FRE`	`@0 Verre @5 02`
C03	`02`	`3`	`ENG`	`@0 Glass @5 02`
C03	`03`	`3`	`FRE`	`@0 Couche mince @5 03`
C03	`03`	`3`	`ENG`	`@0 Thin films @5 03`
C03	`04`	`3`	`FRE`	`@0 Evaporation sous vide @5 04`
C03	`04`	`3`	`ENG`	`@0 Vacuum evaporation @5 04`
C03	`05`	`3`	`FRE`	`@0 Modélisation @5 07`
C03	`05`	`3`	`ENG`	`@0 Modelling @5 07`
C03	`06`	`3`	`FRE`	`@0 RBS @5 08`
C03	`06`	`3`	`ENG`	`@0 RBS @5 08`
C03	`07`	`3`	`FRE`	`@0 Epaisseur @5 09`
C03	`07`	`3`	`ENG`	`@0 Thickness @5 09`
C03	`08`	`3`	`FRE`	`@0 Simulation @5 10`
C03	`08`	`3`	`ENG`	`@0 Simulation @5 10`
C03	`09`	`X`	`FRE`	`@0 Diffusion mutuelle @5 11`
C03	`09`	`X`	`ENG`	`@0 Interdiffusion @5 11`
C03	`09`	`X`	`SPA`	`@0 Difusión mútua @5 11`
C03	`10`	`3`	`FRE`	`@0 Diffusion(transport) @5 12`
C03	`10`	`3`	`ENG`	`@0 Diffusion @5 12`
C03	`11`	`3`	`FRE`	`@0 Diffraction RX @5 13`
C03	`11`	`3`	`ENG`	`@0 XRD @5 13`
C03	`12`	`3`	`FRE`	`@0 Réseau hexagonal compact @5 14`
C03	`12`	`3`	`ENG`	`@0 HCP lattices @5 14`
C03	`13`	`X`	`FRE`	`@0 Orientation préférentielle @5 15`
C03	`13`	`X`	`ENG`	`@0 Preferred orientation @5 15`
C03	`13`	`X`	`SPA`	`@0 Orientación preferencial @5 15`
C03	`14`	`3`	`FRE`	`@0 Microscopie force atomique @5 16`
C03	`14`	`3`	`ENG`	`@0 Atomic force microscopy @5 16`
C03	`15`	`3`	`FRE`	`@0 Cobalt alliage @5 17`
C03	`15`	`3`	`ENG`	`@0 Cobalt alloys @5 17`
C03	`16`	`3`	`FRE`	`@0 Chrome alliage @5 18`
C03	`16`	`3`	`ENG`	`@0 Chromium alloys @5 18`
C03	`17`	`3`	`FRE`	`@0 Alliage binaire @5 19`
C03	`17`	`3`	`ENG`	`@0 Binary alloys @5 19`
C03	`18`	`3`	`FRE`	`@0 Alliage CoCr @4 INC @5 32`
C03	`19`	`3`	`FRE`	`@0 Silicium @2 NC @5 41`
C03	`19`	`3`	`ENG`	`@0 Silicon @2 NC @5 41`
C03	`20`	`3`	`FRE`	`@0 6855J @2 PAC @4 INC @5 45`
C03	`21`	`3`	`FRE`	`@0 8280Y @2 PAC @4 INC @5 46`
C03	`22`	`3`	`FRE`	`@0 6855N @2 PAC @4 INC @5 47`
C03	`23`	`3`	`FRE`	`@0 6110N @2 PAC @4 INC @5 48`
C07	`01`	`3`	`FRE`	`@0 Métal transition alliage @5 20`
C07	`01`	`3`	`ENG`	`@0 Transition element alloys @5 20`
N21				`@1 287`

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Le document en format XML

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Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
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<country>Algérie</country>
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<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
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<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country>Algérie</country>
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</author>
<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
<affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
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<seriesStmt><title level="j" type="main">Applied surface science</title>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Atomic force microscopy</term>
<term>Binary alloys</term>
<term>Chromium alloys</term>
<term>Cobalt alloys</term>
<term>Diffusion</term>
<term>Glass</term>
<term>HCP lattices</term>
<term>Interdiffusion</term>
<term>Modelling</term>
<term>Preferred orientation</term>
<term>RBS</term>
<term>Silicon</term>
<term>Simulation</term>
<term>Surface composition</term>
<term>Thickness</term>
<term>Thin films</term>
<term>Vacuum evaporation</term>
<term>XRD</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Composition surface</term>
<term>Verre</term>
<term>Couche mince</term>
<term>Evaporation sous vide</term>
<term>Modélisation</term>
<term>RBS</term>
<term>Epaisseur</term>
<term>Simulation</term>
<term>Diffusion mutuelle</term>
<term>Diffusion(transport)</term>
<term>Diffraction RX</term>
<term>Réseau hexagonal compact</term>
<term>Orientation préférentielle</term>
<term>Microscopie force atomique</term>
<term>Cobalt alliage</term>
<term>Chrome alliage</term>
<term>Alliage binaire</term>
<term>Alliage CoCr</term>
<term>Silicium</term>
<term>6855J</term>
<term>8280Y</term>
<term>6855N</term>
<term>6110N</term>
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<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Verre</term>
<term>Simulation</term>
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<front><div type="abstract" xml:lang="en">Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
 thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</div>
</front>
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<fA06><s2>18</s2>
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<fA08 i1="01" i2="1" l="ENG"><s1>Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</s1>
</fA08>
<fA11 i1="01" i2="1"><s1>KHARMOUCHE (A.)</s1>
</fA11>
<fA11 i1="02" i2="1"><s1>DJOUADA (I.)</s1>
</fA11>
<fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
<s3>DZA</s3>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</fA14>
<fA20><s1>5732-5735</s1>
</fA20>
<fA21><s1>2008</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>16002</s2>
<s5>354000197872590160</s5>
</fA43>
<fA44><s0>0000</s0>
<s1>© 2008 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45><s0>16 ref.</s0>
</fA45>
<fA47 i1="01" i2="1"><s0>08-0446682</s0>
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<fA60><s1>P</s1>
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<fA66 i1="01"><s0>NLD</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
 thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</s0>
</fC01>
<fC02 i1="01" i2="3"><s0>001B60H55J</s0>
</fC02>
<fC02 i1="02" i2="X"><s0>001C04G</s0>
</fC02>
<fC02 i1="03" i2="3"><s0>001B60H55N</s0>
</fC02>
<fC02 i1="04" i2="3"><s0>001B60A10N</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>Composition surface</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="3" l="ENG"><s0>Surface composition</s0>
<s5>01</s5>
</fC03>
<fC03 i1="02" i2="3" l="FRE"><s0>Verre</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="3" l="ENG"><s0>Glass</s0>
<s5>02</s5>
</fC03>
<fC03 i1="03" i2="3" l="FRE"><s0>Couche mince</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="3" l="ENG"><s0>Thin films</s0>
<s5>03</s5>
</fC03>
<fC03 i1="04" i2="3" l="FRE"><s0>Evaporation sous vide</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="3" l="ENG"><s0>Vacuum evaporation</s0>
<s5>04</s5>
</fC03>
<fC03 i1="05" i2="3" l="FRE"><s0>Modélisation</s0>
<s5>07</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG"><s0>Modelling</s0>
<s5>07</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>RBS</s0>
<s5>08</s5>
</fC03>
<fC03 i1="06" i2="3" l="ENG"><s0>RBS</s0>
<s5>08</s5>
</fC03>
<fC03 i1="07" i2="3" l="FRE"><s0>Epaisseur</s0>
<s5>09</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG"><s0>Thickness</s0>
<s5>09</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>Simulation</s0>
<s5>10</s5>
</fC03>
<fC03 i1="08" i2="3" l="ENG"><s0>Simulation</s0>
<s5>10</s5>
</fC03>
<fC03 i1="09" i2="X" l="FRE"><s0>Diffusion mutuelle</s0>
<s5>11</s5>
</fC03>
<fC03 i1="09" i2="X" l="ENG"><s0>Interdiffusion</s0>
<s5>11</s5>
</fC03>
<fC03 i1="09" i2="X" l="SPA"><s0>Difusión mútua</s0>
<s5>11</s5>
</fC03>
<fC03 i1="10" i2="3" l="FRE"><s0>Diffusion(transport)</s0>
<s5>12</s5>
</fC03>
<fC03 i1="10" i2="3" l="ENG"><s0>Diffusion</s0>
<s5>12</s5>
</fC03>
<fC03 i1="11" i2="3" l="FRE"><s0>Diffraction RX</s0>
<s5>13</s5>
</fC03>
<fC03 i1="11" i2="3" l="ENG"><s0>XRD</s0>
<s5>13</s5>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Réseau hexagonal compact</s0>
<s5>14</s5>
</fC03>
<fC03 i1="12" i2="3" l="ENG"><s0>HCP lattices</s0>
<s5>14</s5>
</fC03>
<fC03 i1="13" i2="X" l="FRE"><s0>Orientation préférentielle</s0>
<s5>15</s5>
</fC03>
<fC03 i1="13" i2="X" l="ENG"><s0>Preferred orientation</s0>
<s5>15</s5>
</fC03>
<fC03 i1="13" i2="X" l="SPA"><s0>Orientación preferencial</s0>
<s5>15</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE"><s0>Microscopie force atomique</s0>
<s5>16</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG"><s0>Atomic force microscopy</s0>
<s5>16</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE"><s0>Cobalt alliage</s0>
<s5>17</s5>
</fC03>
<fC03 i1="15" i2="3" l="ENG"><s0>Cobalt alloys</s0>
<s5>17</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE"><s0>Chrome alliage</s0>
<s5>18</s5>
</fC03>
<fC03 i1="16" i2="3" l="ENG"><s0>Chromium alloys</s0>
<s5>18</s5>
</fC03>
<fC03 i1="17" i2="3" l="FRE"><s0>Alliage binaire</s0>
<s5>19</s5>
</fC03>
<fC03 i1="17" i2="3" l="ENG"><s0>Binary alloys</s0>
<s5>19</s5>
</fC03>
<fC03 i1="18" i2="3" l="FRE"><s0>Alliage CoCr</s0>
<s4>INC</s4>
<s5>32</s5>
</fC03>
<fC03 i1="19" i2="3" l="FRE"><s0>Silicium</s0>
<s2>NC</s2>
<s5>41</s5>
</fC03>
<fC03 i1="19" i2="3" l="ENG"><s0>Silicon</s0>
<s2>NC</s2>
<s5>41</s5>
</fC03>
<fC03 i1="20" i2="3" l="FRE"><s0>6855J</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>45</s5>
</fC03>
<fC03 i1="21" i2="3" l="FRE"><s0>8280Y</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>46</s5>
</fC03>
<fC03 i1="22" i2="3" l="FRE"><s0>6855N</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>47</s5>
</fC03>
<fC03 i1="23" i2="3" l="FRE"><s0>6110N</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>48</s5>
</fC03>
<fC07 i1="01" i2="3" l="FRE"><s0>Métal transition alliage</s0>
<s5>20</s5>
</fC07>
<fC07 i1="01" i2="3" l="ENG"><s0>Transition element alloys</s0>
<s5>20</s5>
</fC07>
<fN21><s1>287</s1>
</fN21>
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</standard>
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</record>

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	Serveur d'exploration sur le cobalt au Maghreb
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Serveur d'exploration sur le cobalt au Maghreb

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films

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