Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films
Identifieur interne : 000123 ( PascalFrancis/Corpus ); précédent : 000122; suivant : 000124Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films
Auteurs : A. Kharmouche ; I. DjouadaSource :
- Applied surface science [ 0169-4332 ] ; 2008.
Descripteurs français
- Pascal (Inist)
- Composition surface, Verre, Couche mince, Evaporation sous vide, Modélisation, RBS, Epaisseur, Simulation, Diffusion mutuelle, Diffusion(transport), Diffraction RX, Réseau hexagonal compact, Orientation préférentielle, Microscopie force atomique, Cobalt alliage, Chrome alliage, Alliage binaire, Alliage CoCr, Silicium, 6855J, 8280Y, 6855N, 6110N.
English descriptors
- KwdEn :
Abstract
Series of CoxCr1-x thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.
Notice en format standard (ISO 2709)
Pour connaître la documentation sur le format Inist Standard.
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Format Inist (serveur)
NO : | PASCAL 08-0446682 INIST |
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ET : | Structural studies of evaporated CoxCr1-x/Si (1 0 0) and CoxCr1-x/glass thin films |
AU : | KHARMOUCHE (A.); DJOUADA (I.) |
AF : | Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas/Sétif 19000/Algérie (1 aut., 2 aut.) |
DT : | Publication en série; Niveau analytique |
SO : | Applied surface science; ISSN 0169-4332; Pays-Bas; Da. 2008; Vol. 254; No. 18; Pp. 5732-5735; Bibl. 16 ref. |
LA : | Anglais |
EA : | Series of CoxCr1-x thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces. |
CC : | 001B60H55J; 001C04G; 001B60H55N; 001B60A10N |
FD : | Composition surface; Verre; Couche mince; Evaporation sous vide; Modélisation; RBS; Epaisseur; Simulation; Diffusion mutuelle; Diffusion(transport); Diffraction RX; Réseau hexagonal compact; Orientation préférentielle; Microscopie force atomique; Cobalt alliage; Chrome alliage; Alliage binaire; Alliage CoCr; Silicium; 6855J; 8280Y; 6855N; 6110N |
FG : | Métal transition alliage |
ED : | Surface composition; Glass; Thin films; Vacuum evaporation; Modelling; RBS; Thickness; Simulation; Interdiffusion; Diffusion; XRD; HCP lattices; Preferred orientation; Atomic force microscopy; Cobalt alloys; Chromium alloys; Binary alloys; Silicon |
EG : | Transition element alloys |
SD : | Difusión mútua; Orientación preferencial |
LO : | INIST-16002.354000197872590160 |
ID : | 08-0446682 |
Links to Exploration step
Pascal:08-0446682Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
<affiliation><inist:fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
<s2>Sétif 19000</s2>
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<author><name sortKey="Djouada, I" sort="Djouada, I" uniqKey="Djouada I" first="I." last="Djouada">I. Djouada</name>
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<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</title>
<author><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name>
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<term>Glass</term>
<term>HCP lattices</term>
<term>Interdiffusion</term>
<term>Modelling</term>
<term>Preferred orientation</term>
<term>RBS</term>
<term>Silicon</term>
<term>Simulation</term>
<term>Surface composition</term>
<term>Thickness</term>
<term>Thin films</term>
<term>Vacuum evaporation</term>
<term>XRD</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Composition surface</term>
<term>Verre</term>
<term>Couche mince</term>
<term>Evaporation sous vide</term>
<term>Modélisation</term>
<term>RBS</term>
<term>Epaisseur</term>
<term>Simulation</term>
<term>Diffusion mutuelle</term>
<term>Diffusion(transport)</term>
<term>Diffraction RX</term>
<term>Réseau hexagonal compact</term>
<term>Orientation préférentielle</term>
<term>Microscopie force atomique</term>
<term>Cobalt alliage</term>
<term>Chrome alliage</term>
<term>Alliage binaire</term>
<term>Alliage CoCr</term>
<term>Silicium</term>
<term>6855J</term>
<term>8280Y</term>
<term>6855N</term>
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<front><div type="abstract" xml:lang="en">Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</div>
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Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</s1>
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<fA14 i1="01"><s1>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas</s1>
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Cr<sub>1-x</sub>
thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</s0>
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<s5>04</s5>
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<s5>04</s5>
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<s5>07</s5>
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<fC03 i1="06" i2="3" l="FRE"><s0>RBS</s0>
<s5>08</s5>
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<s5>08</s5>
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<s5>09</s5>
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<s5>09</s5>
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<s5>10</s5>
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<fC03 i1="08" i2="3" l="ENG"><s0>Simulation</s0>
<s5>10</s5>
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<s5>11</s5>
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<s5>11</s5>
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<s5>11</s5>
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<s5>12</s5>
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<s5>12</s5>
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<fC03 i1="11" i2="3" l="FRE"><s0>Diffraction RX</s0>
<s5>13</s5>
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<fC03 i1="11" i2="3" l="ENG"><s0>XRD</s0>
<s5>13</s5>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Réseau hexagonal compact</s0>
<s5>14</s5>
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<fC03 i1="12" i2="3" l="ENG"><s0>HCP lattices</s0>
<s5>14</s5>
</fC03>
<fC03 i1="13" i2="X" l="FRE"><s0>Orientation préférentielle</s0>
<s5>15</s5>
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<fC03 i1="13" i2="X" l="ENG"><s0>Preferred orientation</s0>
<s5>15</s5>
</fC03>
<fC03 i1="13" i2="X" l="SPA"><s0>Orientación preferencial</s0>
<s5>15</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE"><s0>Microscopie force atomique</s0>
<s5>16</s5>
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<fC03 i1="14" i2="3" l="ENG"><s0>Atomic force microscopy</s0>
<s5>16</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE"><s0>Cobalt alliage</s0>
<s5>17</s5>
</fC03>
<fC03 i1="15" i2="3" l="ENG"><s0>Cobalt alloys</s0>
<s5>17</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE"><s0>Chrome alliage</s0>
<s5>18</s5>
</fC03>
<fC03 i1="16" i2="3" l="ENG"><s0>Chromium alloys</s0>
<s5>18</s5>
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<s5>19</s5>
</fC03>
<fC03 i1="17" i2="3" l="ENG"><s0>Binary alloys</s0>
<s5>19</s5>
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<fC03 i1="18" i2="3" l="FRE"><s0>Alliage CoCr</s0>
<s4>INC</s4>
<s5>32</s5>
</fC03>
<fC03 i1="19" i2="3" l="FRE"><s0>Silicium</s0>
<s2>NC</s2>
<s5>41</s5>
</fC03>
<fC03 i1="19" i2="3" l="ENG"><s0>Silicon</s0>
<s2>NC</s2>
<s5>41</s5>
</fC03>
<fC03 i1="20" i2="3" l="FRE"><s0>6855J</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>45</s5>
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<fC03 i1="21" i2="3" l="FRE"><s0>8280Y</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>46</s5>
</fC03>
<fC03 i1="22" i2="3" l="FRE"><s0>6855N</s0>
<s2>PAC</s2>
<s4>INC</s4>
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<fC03 i1="23" i2="3" l="FRE"><s0>6110N</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>48</s5>
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<s5>20</s5>
</fC07>
<fC07 i1="01" i2="3" l="ENG"><s0>Transition element alloys</s0>
<s5>20</s5>
</fC07>
<fN21><s1>287</s1>
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</standard>
<server><NO>PASCAL 08-0446682 INIST</NO>
<ET>Structural studies of evaporated Co<sub>x</sub>
Cr<sub>1-x</sub>
/Si (1 0 0) and Co<sub>x</sub>
Cr<sub>1-x</sub>
/glass thin films</ET>
<AU>KHARMOUCHE (A.); DJOUADA (I.)</AU>
<AF>Faculté des Sciences de l'Ingénieur, Université Ferhat Abbas/Sétif 19000/Algérie (1 aut., 2 aut.)</AF>
<DT>Publication en série; Niveau analytique</DT>
<SO>Applied surface science; ISSN 0169-4332; Pays-Bas; Da. 2008; Vol. 254; No. 18; Pp. 5732-5735; Bibl. 16 ref.</SO>
<LA>Anglais</LA>
<EA>Series of Co<sub>x</sub>
Cr<sub>1-x</sub>
thin films have been evaporated under vacuum onto Si (1 0 0) and glass substrates. Chemical composition and interface properties have been studied by modelling Rutherford backscattering spectra (RBS) using SIMNRA programme. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Simulation of the energy spectra shows an interdiffusion profile in the thickest films, but no diffusion is seen in thinner ones. Microscopic characterizations of the films are done with X-ray diffraction (XRD) measurements. All the samples are polycrystalline, with an hcp structure and show a <0001>preferred orientation. Atomic force microscopies (AFM) reveal very smooth film surfaces.</EA>
<CC>001B60H55J; 001C04G; 001B60H55N; 001B60A10N</CC>
<FD>Composition surface; Verre; Couche mince; Evaporation sous vide; Modélisation; RBS; Epaisseur; Simulation; Diffusion mutuelle; Diffusion(transport); Diffraction RX; Réseau hexagonal compact; Orientation préférentielle; Microscopie force atomique; Cobalt alliage; Chrome alliage; Alliage binaire; Alliage CoCr; Silicium; 6855J; 8280Y; 6855N; 6110N</FD>
<FG>Métal transition alliage</FG>
<ED>Surface composition; Glass; Thin films; Vacuum evaporation; Modelling; RBS; Thickness; Simulation; Interdiffusion; Diffusion; XRD; HCP lattices; Preferred orientation; Atomic force microscopy; Cobalt alloys; Chromium alloys; Binary alloys; Silicon</ED>
<EG>Transition element alloys</EG>
<SD>Difusión mútua; Orientación preferencial</SD>
<LO>INIST-16002.354000197872590160</LO>
<ID>08-0446682</ID>
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