Czochralski growth of RE3Ga5SiO14 (RE=La, Pr, Nd) single crystals for the analysis of the influence of rare earth substitution on piezoelectricity
Identifieur interne : 001E87 ( Main/Curation ); précédent : 001E86; suivant : 001E88Czochralski growth of RE3Ga5SiO14 (RE=La, Pr, Nd) single crystals for the analysis of the influence of rare earth substitution on piezoelectricity
Auteurs : J. Sato [Japon] ; H. Takeda [Japon] ; H. Morikoshi [Japon] ; K. Shimamura [Japon] ; P. Rudolph [Japon, Allemagne] ; T. Fukuda [Japon]Source :
- Journal of Crystal Growth [ 0022-0248 ] ; 1998.
English descriptors
- KwdEn :
- Atomic number, Axial lattice parameter distribution, Cation, Constant diameter, Constant diameters, Crystal, Crystal growth, Crystal properties, Crystal surface, Czochralski, Czochralski growth, Czochralski method, Elsevier science, Frequency control symp, Fukuda, Good transparency, Lattice, Lattice parameter, Oxygen atoms, Phys, Piezoelectric, Piezoelectric properties, Piezoelectric strain, Platinum crucible, Rare earth, Rare earth substitution, Resonance method, Sato, Shimamura, Single crystals, Site substitution, Spiral growth, Step facetting, Structural analysis, Substitution, Temperature gradient, Transmission spectra, Type structure, Wavelength region, Whole length.
- Teeft :
- Atomic number, Axial lattice parameter distribution, Cation, Constant diameter, Constant diameters, Crystal, Crystal growth, Crystal properties, Crystal surface, Czochralski, Czochralski growth, Czochralski method, Elsevier science, Frequency control symp, Fukuda, Good transparency, Lattice, Lattice parameter, Oxygen atoms, Phys, Piezoelectric, Piezoelectric properties, Piezoelectric strain, Platinum crucible, Rare earth, Rare earth substitution, Resonance method, Sato, Shimamura, Single crystals, Site substitution, Spiral growth, Step facetting, Structural analysis, Substitution, Temperature gradient, Transmission spectra, Type structure, Wavelength region, Whole length.
Abstract
Abstract: Pr3Ga5SiO14 and Nd3Ga5SiO14 single crystals with constant diameter of 22mm and lengths up to 145mm have been grown by the Czochralski method. The phase identification, site occupancy of cations and axial lattice parameter distribution were determined by X-ray analysis. The transmission spectra within the 340–3200nm wavelength region were measured. The centre of interest are the piezoelectric properties of (2 1̄ 0) and (0 1 0) plates in comparison with former grown La3Ga5SiO14 crystals in order to find out the influence of the rare earth substitution of La3+ by Pr3+ and Nd3+ on the piezoelectric strain constant d11. A decrease of |d11| with increasing atomic number was found giving the hint to the substitution of lanthanum by further elements with larger atomic radii.
Url:
DOI: 10.1016/S0022-0248(98)00362-5
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ISTEX:3287437C1195150D8C9800326310A9111BDB9E49Le document en format XML
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<term>Crystal</term>
<term>Crystal growth</term>
<term>Crystal properties</term>
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<term>Piezoelectric</term>
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<term>Piezoelectric properties</term>
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<front><div type="abstract" xml:lang="en">Abstract: Pr3Ga5SiO14 and Nd3Ga5SiO14 single crystals with constant diameter of 22mm and lengths up to 145mm have been grown by the Czochralski method. The phase identification, site occupancy of cations and axial lattice parameter distribution were determined by X-ray analysis. The transmission spectra within the 340–3200nm wavelength region were measured. The centre of interest are the piezoelectric properties of (2 1̄ 0) and (0 1 0) plates in comparison with former grown La3Ga5SiO14 crystals in order to find out the influence of the rare earth substitution of La3+ by Pr3+ and Nd3+ on the piezoelectric strain constant d11. A decrease of |d11| with increasing atomic number was found giving the hint to the substitution of lanthanum by further elements with larger atomic radii.</div>
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