Effect of cross relaxation on the 1470 and 1800 nm emissions in Tm3+ :TeO2-CdCl2 glass
Identifieur interne : 000A53 ( Pascal/Curation ); précédent : 000A52; suivant : 000A54Effect of cross relaxation on the 1470 and 1800 nm emissions in Tm3+ :TeO2-CdCl2 glass
Auteurs : Alphan Sennaroglu [Turquie] ; Adnan Kurt [Turquie] ; Gönül Özen [Turquie]Source :
- Journal of physics. Condensed matter : (Print) [ 0953-8984 ] ; 2004.
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- Pascal (Inist)
- Wicri :
- topic : Verre.
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- KwdEn :
Abstract
We have used spectroscopic methods to investigate the effect of cross relaxation on the 1470 and 1800 nm emissions in Tm3+:TeO2-CdCl2 glass for Tm3+ ion concentrations of 0.05, 0.1, 0.25, 0.5 and 1.0 mol%. The emission spectra obtained under 800 nm excitation reveal the existence of energy transfer via cross relaxation among the Tm3+ ions. As a result, as the thulium concentration is increased, the strength of the 1470 nm emission is found to decrease in relation to that of the 1800 nm emission. The analysis of the time evolution of the 3F4 emission due to the 3F4 → 3H6 transition further shows that the electronic mechanism responsible for the ion-ion interaction can be identified as an electric dipole-dipole energy transfer process and occurs in the diffusion-limited relaxation regime. The average critical distance parameter which provides a measure for the strength of cross relaxation was further determined to be 17.9 Å.
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:TeO<sub>2</sub>
-CdCl<sub>2</sub>
glass</title>
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<front><div type="abstract" xml:lang="en">We have used spectroscopic methods to investigate the effect of cross relaxation on the 1470 and 1800 nm emissions in Tm<sup>3+</sup>
:TeO<sub>2</sub>
-CdCl<sub>2</sub>
glass for Tm<sup>3+</sup>
ion concentrations of 0.05, 0.1, 0.25, 0.5 and 1.0 mol%. The emission spectra obtained under 800 nm excitation reveal the existence of energy transfer via cross relaxation among the Tm<sup>3+</sup>
ions. As a result, as the thulium concentration is increased, the strength of the 1470 nm emission is found to decrease in relation to that of the 1800 nm emission. The analysis of the time evolution of the <sup>3</sup>
F<sub>4</sub>
emission due to the <sup>3</sup>
F<sub>4</sub>
→ <sup>3</sup>
H<sub>6</sub>
transition further shows that the electronic mechanism responsible for the ion-ion interaction can be identified as an electric dipole-dipole energy transfer process and occurs in the diffusion-limited relaxation regime. The average critical distance parameter which provides a measure for the strength of cross relaxation was further determined to be 17.9 Å.</div>
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<fC01 i1="01" l="ENG"><s0>We have used spectroscopic methods to investigate the effect of cross relaxation on the 1470 and 1800 nm emissions in Tm<sup>3+</sup>
:TeO<sub>2</sub>
-CdCl<sub>2</sub>
glass for Tm<sup>3+</sup>
ion concentrations of 0.05, 0.1, 0.25, 0.5 and 1.0 mol%. The emission spectra obtained under 800 nm excitation reveal the existence of energy transfer via cross relaxation among the Tm<sup>3+</sup>
ions. As a result, as the thulium concentration is increased, the strength of the 1470 nm emission is found to decrease in relation to that of the 1800 nm emission. The analysis of the time evolution of the <sup>3</sup>
F<sub>4</sub>
emission due to the <sup>3</sup>
F<sub>4</sub>
→ <sup>3</sup>
H<sub>6</sub>
transition further shows that the electronic mechanism responsible for the ion-ion interaction can be identified as an electric dipole-dipole energy transfer process and occurs in the diffusion-limited relaxation regime. The average critical distance parameter which provides a measure for the strength of cross relaxation was further determined to be 17.9 Å.</s0>
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