Measuring the spatial distribution of rare-earth dopants in high-power optical fibers
Identifieur interne :
000216 ( Pascal/Corpus );
précédent :
000215;
suivant :
000217
Measuring the spatial distribution of rare-earth dopants in high-power optical fibers
Auteurs : A. D. YablonSource :
-
Proceedings of SPIE, the International Society for Optical Engineering [ 0277-786X ] ; 2011.
RBID : Pascal:11-0365463
Descripteurs français
- Pascal (Inist)
- Emission spontanée,
Laser fibre,
Imagerie,
Résolution spatiale,
Indice réfraction,
Fibre optique,
Matériau dopé,
Addition lanthanide,
Silice,
Lanthanide,
Huile,
Fabrication industrielle,
Addition thulium,
0130C,
4255W.
English descriptors
- KwdEn :
- Doped materials,
Fiber lasers,
Imagery,
Manufacturing,
Oils,
Optical fibers,
Rare earth additions,
Rare earths,
Refractive index,
Silica,
Spatial resolution,
Spontaneous emission,
Thulium additions.
Abstract
For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers.
Notice en format standard (ISO 2709)
Pour connaître la documentation sur le format Inist Standard.
pA |
A01 | 01 | 1 | | @0 0277-786X |
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A02 | 01 | | | @0 PSISDG |
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A03 | | 1 | | @0 Proc. SPIE Int. Soc. Opt. Eng. |
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A05 | | | | @2 7914 |
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A08 | 01 | 1 | ENG | @1 Measuring the spatial distribution of rare-earth dopants in high-power optical fibers |
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A09 | 01 | 1 | ENG | @1 Fiber lasers VIII : technology, systems, and applications |
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A11 | 01 | 1 | | @1 YABLON (A. D.) |
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A12 | 01 | 1 | | @1 DAWSON (Jay W.) @9 ed. |
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A12 | 02 | 1 | | @1 HONEA (Eric C.) @9 ed. |
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A14 | 01 | | | @1 Interfiber Analysis, 26 Ridgewood Drive @2 Livingston, NJ,07039-3120 @3 USA @Z 1 aut. |
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A18 | 01 | 1 | | @1 SPIE @3 USA @9 org-cong. |
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A20 | | | | @2 79141N.1-79141N.8 |
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A21 | | | | @1 2011 |
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A23 | 01 | | | @0 ENG |
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A25 | 01 | | | @1 SPIE @2 Bellingham, Wash. |
---|
A26 | 01 | | | @0 978-0-8194-8451-2 |
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A43 | 01 | | | @1 INIST @2 21760 @5 354000174739020460 |
---|
A44 | | | | @0 0000 @1 © 2011 INIST-CNRS. All rights reserved. |
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A45 | | | | @0 24 ref. |
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A47 | 01 | 1 | | @0 11-0365463 |
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A60 | | | | @1 P @2 C |
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A61 | | | | @0 A |
---|
A64 | 01 | 1 | | @0 Proceedings of SPIE, the International Society for Optical Engineering |
---|
A66 | 01 | | | @0 USA |
---|
C01 | 01 | | ENG | @0 For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers. |
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C02 | 01 | 3 | | @0 001B00A30C |
---|
C02 | 02 | 3 | | @0 001B40B55W |
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C03 | 01 | 3 | FRE | @0 Emission spontanée @5 03 |
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C03 | 01 | 3 | ENG | @0 Spontaneous emission @5 03 |
---|
C03 | 02 | 3 | FRE | @0 Laser fibre @5 11 |
---|
C03 | 02 | 3 | ENG | @0 Fiber lasers @5 11 |
---|
C03 | 03 | X | FRE | @0 Imagerie @5 19 |
---|
C03 | 03 | X | ENG | @0 Imagery @5 19 |
---|
C03 | 03 | X | SPA | @0 Imaginería @5 19 |
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C03 | 04 | 3 | FRE | @0 Résolution spatiale @5 41 |
---|
C03 | 04 | 3 | ENG | @0 Spatial resolution @5 41 |
---|
C03 | 05 | 3 | FRE | @0 Indice réfraction @5 42 |
---|
C03 | 05 | 3 | ENG | @0 Refractive index @5 42 |
---|
C03 | 06 | 3 | FRE | @0 Fibre optique @5 47 |
---|
C03 | 06 | 3 | ENG | @0 Optical fibers @5 47 |
---|
C03 | 07 | 3 | FRE | @0 Matériau dopé @5 50 |
---|
C03 | 07 | 3 | ENG | @0 Doped materials @5 50 |
---|
C03 | 08 | 3 | FRE | @0 Addition lanthanide @5 57 |
---|
C03 | 08 | 3 | ENG | @0 Rare earth additions @5 57 |
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C03 | 09 | 3 | FRE | @0 Silice @2 NK @5 58 |
---|
C03 | 09 | 3 | ENG | @0 Silica @2 NK @5 58 |
---|
C03 | 10 | 3 | FRE | @0 Lanthanide @2 NC @5 61 |
---|
C03 | 10 | 3 | ENG | @0 Rare earths @2 NC @5 61 |
---|
C03 | 11 | 3 | FRE | @0 Huile @5 62 |
---|
C03 | 11 | 3 | ENG | @0 Oils @5 62 |
---|
C03 | 12 | 3 | FRE | @0 Fabrication industrielle @5 63 |
---|
C03 | 12 | 3 | ENG | @0 Manufacturing @5 63 |
---|
C03 | 13 | 3 | FRE | @0 Addition thulium @5 64 |
---|
C03 | 13 | 3 | ENG | @0 Thulium additions @5 64 |
---|
C03 | 14 | 3 | FRE | @0 0130C @4 INC @5 83 |
---|
C03 | 15 | 3 | FRE | @0 4255W @4 INC @5 91 |
---|
N21 | | | | @1 249 |
---|
N44 | 01 | | | @1 OTO |
---|
N82 | | | | @1 OTO |
---|
|
pR |
A30 | 01 | 1 | ENG | @1 Fiber lasers @2 08 @3 San Francisco CA USA @4 2011 |
---|
|
Format Inist (serveur)
NO : | PASCAL 11-0365463 INIST |
ET : | Measuring the spatial distribution of rare-earth dopants in high-power optical fibers |
AU : | YABLON (A. D.); DAWSON (Jay W.); HONEA (Eric C.) |
AF : | Interfiber Analysis, 26 Ridgewood Drive/Livingston, NJ,07039-3120/Etats-Unis (1 aut.) |
DT : | Publication en série; Congrès; Niveau analytique |
SO : | Proceedings of SPIE, the International Society for Optical Engineering; ISSN 0277-786X; Coden PSISDG; Etats-Unis; Da. 2011; Vol. 7914; 79141N.1-79141N.8; Bibl. 24 ref. |
LA : | Anglais |
EA : | For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers. |
CC : | 001B00A30C; 001B40B55W |
FD : | Emission spontanée; Laser fibre; Imagerie; Résolution spatiale; Indice réfraction; Fibre optique; Matériau dopé; Addition lanthanide; Silice; Lanthanide; Huile; Fabrication industrielle; Addition thulium; 0130C; 4255W |
ED : | Spontaneous emission; Fiber lasers; Imagery; Spatial resolution; Refractive index; Optical fibers; Doped materials; Rare earth additions; Silica; Rare earths; Oils; Manufacturing; Thulium additions |
SD : | Imaginería |
LO : | INIST-21760.354000174739020460 |
ID : | 11-0365463 |
Links to Exploration step
Pascal:11-0365463
Le document en format XML
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<front><div type="abstract" xml:lang="en">For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers.</div>
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<ET>Measuring the spatial distribution of rare-earth dopants in high-power optical fibers</ET>
<AU>YABLON (A. D.); DAWSON (Jay W.); HONEA (Eric C.)</AU>
<AF>Interfiber Analysis, 26 Ridgewood Drive/Livingston, NJ,07039-3120/Etats-Unis (1 aut.)</AF>
<DT>Publication en série; Congrès; Niveau analytique</DT>
<SO>Proceedings of SPIE, the International Society for Optical Engineering; ISSN 0277-786X; Coden PSISDG; Etats-Unis; Da. 2011; Vol. 7914; 79141N.1-79141N.8; Bibl. 24 ref.</SO>
<LA>Anglais</LA>
<EA>For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers.</EA>
<CC>001B00A30C; 001B40B55W</CC>
<FD>Emission spontanée; Laser fibre; Imagerie; Résolution spatiale; Indice réfraction; Fibre optique; Matériau dopé; Addition lanthanide; Silice; Lanthanide; Huile; Fabrication industrielle; Addition thulium; 0130C; 4255W</FD>
<ED>Spontaneous emission; Fiber lasers; Imagery; Spatial resolution; Refractive index; Optical fibers; Doped materials; Rare earth additions; Silica; Rare earths; Oils; Manufacturing; Thulium additions</ED>
<SD>Imaginería</SD>
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