Measuring the spatial distribution of rare-earth dopants in high-power optical fibers
Identifieur interne : 000B43 ( Main/Merge ); précédent : 000B42; suivant : 000B44Measuring the spatial distribution of rare-earth dopants in high-power optical fibers
Auteurs : A. D. Yablon [États-Unis]Source :
- Proceedings of SPIE, the International Society for Optical Engineering [ 0277-786X ] ; 2011.
Descripteurs français
- Pascal (Inist)
- Wicri :
- topic : Fabrication industrielle.
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Abstract
For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers.
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Pascal:11-0365463Le document en format XML
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<term>Manufacturing</term>
<term>Oils</term>
<term>Optical fibers</term>
<term>Rare earth additions</term>
<term>Rare earths</term>
<term>Refractive index</term>
<term>Silica</term>
<term>Spatial resolution</term>
<term>Spontaneous emission</term>
<term>Thulium additions</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Emission spontanée</term>
<term>Laser fibre</term>
<term>Imagerie</term>
<term>Résolution spatiale</term>
<term>Indice réfraction</term>
<term>Fibre optique</term>
<term>Matériau dopé</term>
<term>Addition lanthanide</term>
<term>Silice</term>
<term>Lanthanide</term>
<term>Huile</term>
<term>Fabrication industrielle</term>
<term>Addition thulium</term>
<term>0130C</term>
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<front><div type="abstract" xml:lang="en">For the first time, a non-destructive technique for spatially resolving the location and relative concentration of rare-earth dopants in an optical fiber is demonstrated. This novel technique is based on computerized tomographic detection of spontaneous emission and achieves micron-scale spatial resolution with the aid of oil-immersion imaging. In addition to elucidating interactions between the signal, pump, and dopant distributions, the measurement described here can reveal shortcomings in fiber manufacturing. Since the technique is non-destructive and can be scanned along the fiber length, it can map the full 3-dimensional distribution of complex rare-earth-doped fiber structures including gratings, physical tapers, fusion splices, and even couplers. Experimental data obtained from commercially available Yb-doped silica optical fibers is presented, contrasted, and compared to refractive index profile data. In principle the technique can also be applied to Er-, Bi-, or Tm-doped silica or non-silica optical fibers.</div>
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