Thulium induced reconstructions of the Si(001 ) surface
Identifieur interne : 000B15 ( Main/Exploration ); précédent : 000B14; suivant : 000B16Thulium induced reconstructions of the Si(001 ) surface
Auteurs : Y. Cui [Canada] ; J. Nogami [Canada]Source :
- Surface science [ 0039-6028 ] ; 2011.
Descripteurs français
- Pascal (Inist)
English descriptors
- KwdEn :
Abstract
The initial stages of epitaxial growth of Tm on Si(001) are studied by using scanning tunneling microscopy. Tm induces two kinds of surface reconstructions: 2 × 4 and a striped pseudo 2 × 7 phase. The morphology of the 2 x 4 is similar to the 2 x 4 phase induced by other rare earth metals. The pseudo 2 × 7 phase has some common structural elements with the conventional 2 × 7 phase but shows a broad width distribution. Growth of silicide islands and nanowires is seen at higher metal coverages after post deposition annealing. Differences in behavior with respect to other rare earth metals can be attributed to differences in the stable bulk silicides in this system.
Affiliations:
Links toward previous steps (curation, corpus...)
- to stream Pascal, to step Corpus: 000180
- to stream Pascal, to step Curation: 000180
- to stream Pascal, to step Checkpoint: 000183
- to stream Main, to step Merge: 000B19
- to stream Main, to step Curation: 000B15
Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Thulium induced reconstructions of the Si(001 ) surface</title><author><name sortKey="Cui, Y" sort="Cui, Y" uniqKey="Cui Y" first="Y." last="Cui">Y. Cui</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, University of Toronto</s1><s2>Toronto</s2><s3>CAN</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country>Canada</country><placeName><settlement type="city">Toronto</settlement><region type="state">Ontario</region></placeName><orgName type="university">Université de Toronto</orgName></affiliation></author><author><name sortKey="Nogami, J" sort="Nogami, J" uniqKey="Nogami J" first="J." last="Nogami">J. Nogami</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, University of Toronto</s1><s2>Toronto</s2><s3>CAN</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country>Canada</country><placeName><settlement type="city">Toronto</settlement><region type="state">Ontario</region></placeName><orgName type="university">Université de Toronto</orgName></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">INIST</idno><idno type="inist">12-0051710</idno><date when="2011">2011</date><idno type="stanalyst">PASCAL 12-0051710 INIST</idno><idno type="RBID">Pascal:12-0051710</idno><idno type="wicri:Area/Pascal/Corpus">000180</idno><idno type="wicri:Area/Pascal/Curation">000180</idno><idno type="wicri:Area/Pascal/Checkpoint">000183</idno><idno type="wicri:explorRef" wicri:stream="Pascal" wicri:step="Checkpoint">000183</idno><idno type="wicri:doubleKey">0039-6028:2011:Cui Y:thulium:induced:reconstructions</idno><idno type="wicri:Area/Main/Merge">000B19</idno><idno type="wicri:Area/Main/Curation">000B15</idno><idno type="wicri:Area/Main/Exploration">000B15</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Thulium induced reconstructions of the Si(001 ) surface</title><author><name sortKey="Cui, Y" sort="Cui, Y" uniqKey="Cui Y" first="Y." last="Cui">Y. Cui</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, University of Toronto</s1><s2>Toronto</s2><s3>CAN</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country>Canada</country><placeName><settlement type="city">Toronto</settlement><region type="state">Ontario</region></placeName><orgName type="university">Université de Toronto</orgName></affiliation></author><author><name sortKey="Nogami, J" sort="Nogami, J" uniqKey="Nogami J" first="J." last="Nogami">J. Nogami</name><affiliation wicri:level="4"><inist:fA14 i1="01"><s1>Department of Materials Science and Engineering, University of Toronto</s1><s2>Toronto</s2><s3>CAN</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country>Canada</country><placeName><settlement type="city">Toronto</settlement><region type="state">Ontario</region></placeName><orgName type="university">Université de Toronto</orgName></affiliation></author></analytic><series><title level="j" type="main">Surface science</title><title level="j" type="abbreviated">Surf. sci.</title><idno type="ISSN">0039-6028</idno><imprint><date when="2011">2011</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Surface science</title><title level="j" type="abbreviated">Surf. sci.</title><idno type="ISSN">0039-6028</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Actinides</term><term>Rare earths</term><term>Scanning tunneling microscopy</term><term>Silicon</term><term>Surface reconstruction</term><term>Surface structure</term><term>Thulium</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Actinide</term><term>Thulium</term><term>Silicium</term><term>Microscopie tunnel balayage</term><term>Reconstruction surface</term><term>Structure surface</term><term>Lanthanide</term><term>Tm</term><term>Si</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">The initial stages of epitaxial growth of Tm on Si(001) are studied by using scanning tunneling microscopy. Tm induces two kinds of surface reconstructions: 2 × 4 and a striped pseudo 2 × 7 phase. The morphology of the 2 x 4 is similar to the 2 x 4 phase induced by other rare earth metals. The pseudo 2 × 7 phase has some common structural elements with the conventional 2 × 7 phase but shows a broad width distribution. Growth of silicide islands and nanowires is seen at higher metal coverages after post deposition annealing. Differences in behavior with respect to other rare earth metals can be attributed to differences in the stable bulk silicides in this system.</div></front></TEI><affiliations><list><country><li>Canada</li></country><region><li>Ontario</li></region><settlement><li>Toronto</li></settlement><orgName><li>Université de Toronto</li></orgName></list><tree><country name="Canada"><region name="Ontario"><name sortKey="Cui, Y" sort="Cui, Y" uniqKey="Cui Y" first="Y." last="Cui">Y. Cui</name></region><name sortKey="Nogami, J" sort="Nogami, J" uniqKey="Nogami J" first="J." last="Nogami">J. Nogami</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=$WICRI_ROOT/Wicri/Terre/explor/ThuliumV1/Data/Main/Exploration
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000B15 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 000B15 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= Wicri/Terre
|area= ThuliumV1
|flux= Main
|étape= Exploration
|type= RBID
|clé= Pascal:12-0051710
|texte= Thulium induced reconstructions of the Si(001 ) surface
}}
| This area was generated with Dilib version V0.6.21. |  |