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Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Keywords » - entrée « Depth profiles »
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Deposition rate < Depth profiles < Derivative  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000259 (2013) Fabrication and characteristics of BaTi0.85Sn0.15O3 thin films on tin doped indium oxide/glass substrate
000465 (2012) Microstructural characterization of Cu-poor Cu (In, Ga)Se2 surface layer
001856 (2005) An experimental investigation of Zn diffusion into InP and InGaAs
001E99 (2001) Study on the interaction between Ag and tris(8-hydroxyquinoline) aluminum using x-ray photoelectron spectroscopy
002664 (1995-05-15) Photoreflectance characterization of graded InAlAs/InGaAs heterojunction bipolar transistor layers
002740 (1994-10-15) Study of indium antimonide metal-oxide-semiconductor structure prepared by direct photochemical-vapor deposition

Pour manipuler ce document sous Unix (Dilib)

EXPLOR_STEP=IndiumV3/Data/Chine/Analysis

HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/KwdEn.i -k "Depth profiles" 

HfdIndexSelect -h $EXPLOR_AREA/Data/Chine/Analysis/KwdEn.i  \
                -Sk "Depth profiles" \
         | HfdSelect -Kh $EXPLOR_AREA/Data/Chine/Analysis/biblio.hfd

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   |wiki=   *** parameter Area/wikiCode missing *** 
   |area=    IndiumV3
   |flux=    Chine
   |étape=   Analysis
   |type=    indexItem
   |index=    KwdEn.i
   |clé=    Depth profiles
}}
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