GMR versus interfacial roughness induced from different buffers in (Co/Cu) ML
Identifieur interne :
000399 ( PascalFrancis/Curation );
précédent :
000398;
suivant :
000400
GMR versus interfacial roughness induced from different buffers in (Co/Cu) ML
Auteurs : M. El Harfaoui [
France] ;
H. Le Gall [
France] ;
J. Ben Youssef [
France] ;
S. Pogossian [
France] ;
A. Thiaville [
France] ;
P. Gogol [
France] ;
A. Qachaou [
Maroc] ;
J. M. Desvignes [
France]
Source :
-
Journal of magnetism and magnetic materials [ 0304-8853 ] ; 1999.
RBID : Pascal:99-0317962
Descripteurs français
- Pascal (Inist)
- Etude expérimentale,
Magnétorésistance géante,
Multicouche,
Couche tampon,
Relation structure propriété,
Structure interface,
Rugosité,
Aimantation,
Effet dimensionnel,
Cobalt,
Cuivre,
Aluminium,
Tantale,
Chrome,
Co,
Cu,
Al,
Ta,
7570P,
Cr.
- Wicri :
English descriptors
- KwdEn :
- Aluminium,
Buffer layer,
Chromium,
Cobalt,
Copper,
Experimental study,
Giant magnetoresistance,
Interface structure,
Magnetization,
Multilayers,
Property structure relationship,
Roughness,
Size effect,
Tantalum.
Abstract
The correlation between the giant magnetoresistance AR/R, at the first maximum of the oscillating thickness dependence of the magnetoresistance (MR), and the structural and magnetic parameters has been investigated in (Co/Cu) multilayers (ML) deposited by the unusual RF sputtering method. Different textures and interface roughnesses have been induced from magnetic (Fe, Co) and non-magnetic (Cu, Al, Ta, Cr) buffers. The MR is independent of the ML texture and grain size but presents a strong correlation with the interface as deduced from small and large angle XRD and AFM. In high roughness ML the evolution, under increasing applied field, of AR/R versus (M/Ms)2 presents a strong deviation from a standard linear dependence. Such a deviation is attributed to the presence of Co granules in the Cu or/ and the buffer matrices when strong interface disorder is induced in the samples.
pA |
A01 | 01 | 1 | | @0 0304-8853 |
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A02 | 01 | | | @0 JMMMDC |
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A03 | | 1 | | @0 J. magn. magn. mater. |
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A05 | | | | @2 198-99 |
---|
A08 | 01 | 1 | ENG | @1 GMR versus interfacial roughness induced from different buffers in (Co/Cu) ML |
---|
A09 | 01 | 1 | ENG | @1 Proceedings of the Third International Symposium on Metallic Multilayers (MML'98) |
---|
A11 | 01 | 1 | | @1 EL HARFAOUI (M.) |
---|
A11 | 02 | 1 | | @1 LE GALL (H.) |
---|
A11 | 03 | 1 | | @1 BEN YOUSSEF (J.) |
---|
A11 | 04 | 1 | | @1 POGOSSIAN (S.) |
---|
A11 | 05 | 1 | | @1 THIAVILLE (A.) |
---|
A11 | 06 | 1 | | @1 GOGOL (P.) |
---|
A11 | 07 | 1 | | @1 QACHAOU (A.) |
---|
A11 | 08 | 1 | | @1 DESVIGNES (J. M.) |
---|
A12 | 01 | 1 | | @1 HEINRICH (B.) @9 ed. |
---|
A12 | 02 | 1 | | @1 COCHRAN (J. F.) @9 ed. |
---|
A12 | 03 | 1 | | @1 VENUS (D.) @9 ed. |
---|
A14 | 01 | | | @1 CNRS-LPSB @2 92195 Meudon-Bellevue @3 FRA @Z 1 aut. @Z 2 aut. @Z 3 aut. @Z 4 aut. @Z 8 aut. |
---|
A14 | 02 | | | @1 CNRS-LPS, Université d'Orsay @2 91405 @3 FRA @Z 5 aut. @Z 6 aut. |
---|
A14 | 03 | | | @1 LPMC, Fac. Sci. Ibn Tofail BP 133 @2 Kénitra @3 MAR @Z 7 aut. |
---|
A20 | | | | @1 107-109 |
---|
A21 | | | | @1 1999 |
---|
A23 | 01 | | | @0 ENG |
---|
A43 | 01 | | | @1 INIST @2 17230 @5 354000085341670350 |
---|
A44 | | | | @0 0000 @1 © 1999 INIST-CNRS. All rights reserved. |
---|
A45 | | | | @0 9 ref. |
---|
A47 | 01 | 1 | | @0 99-0317962 |
---|
A60 | | | | @1 P @2 C |
---|
A61 | | | | @0 A |
---|
A64 | 01 | 1 | | @0 Journal of magnetism and magnetic materials |
---|
A66 | 01 | | | @0 NLD |
---|
C01 | 01 | | ENG | @0 The correlation between the giant magnetoresistance AR/R, at the first maximum of the oscillating thickness dependence of the magnetoresistance (MR), and the structural and magnetic parameters has been investigated in (Co/Cu) multilayers (ML) deposited by the unusual RF sputtering method. Different textures and interface roughnesses have been induced from magnetic (Fe, Co) and non-magnetic (Cu, Al, Ta, Cr) buffers. The MR is independent of the ML texture and grain size but presents a strong correlation with the interface as deduced from small and large angle XRD and AFM. In high roughness ML the evolution, under increasing applied field, of AR/R versus (M/Ms)2 presents a strong deviation from a standard linear dependence. Such a deviation is attributed to the presence of Co granules in the Cu or/ and the buffer matrices when strong interface disorder is induced in the samples. |
---|
C02 | 01 | 3 | | @0 001B70E70P |
---|
C02 | 02 | X | | @0 240 |
---|
C03 | 01 | 3 | FRE | @0 Etude expérimentale @5 01 |
---|
C03 | 01 | 3 | ENG | @0 Experimental study @5 01 |
---|
C03 | 02 | 3 | FRE | @0 Magnétorésistance géante @5 02 |
---|
C03 | 02 | 3 | ENG | @0 Giant magnetoresistance @5 02 |
---|
C03 | 03 | 3 | FRE | @0 Multicouche @5 03 |
---|
C03 | 03 | 3 | ENG | @0 Multilayers @5 03 |
---|
C03 | 04 | X | FRE | @0 Couche tampon @5 04 |
---|
C03 | 04 | X | ENG | @0 Buffer layer @5 04 |
---|
C03 | 04 | X | SPA | @0 Capa tampón @5 04 |
---|
C03 | 05 | X | FRE | @0 Relation structure propriété @5 05 |
---|
C03 | 05 | X | ENG | @0 Property structure relationship @5 05 |
---|
C03 | 05 | X | SPA | @0 Relación estructura propiedad @5 05 |
---|
C03 | 06 | 3 | FRE | @0 Structure interface @5 06 |
---|
C03 | 06 | 3 | ENG | @0 Interface structure @5 06 |
---|
C03 | 07 | 3 | FRE | @0 Rugosité @5 07 |
---|
C03 | 07 | 3 | ENG | @0 Roughness @5 07 |
---|
C03 | 08 | 3 | FRE | @0 Aimantation @5 08 |
---|
C03 | 08 | 3 | ENG | @0 Magnetization @5 08 |
---|
C03 | 09 | 3 | FRE | @0 Effet dimensionnel @5 10 |
---|
C03 | 09 | 3 | ENG | @0 Size effect @5 10 |
---|
C03 | 10 | 3 | FRE | @0 Cobalt @2 NC @5 15 |
---|
C03 | 10 | 3 | ENG | @0 Cobalt @2 NC @5 15 |
---|
C03 | 11 | 3 | FRE | @0 Cuivre @2 NC @5 16 |
---|
C03 | 11 | 3 | ENG | @0 Copper @2 NC @5 16 |
---|
C03 | 12 | 3 | FRE | @0 Aluminium @2 NC @5 17 |
---|
C03 | 12 | 3 | ENG | @0 Aluminium @2 NC @5 17 |
---|
C03 | 13 | 3 | FRE | @0 Tantale @2 NC @5 18 |
---|
C03 | 13 | 3 | ENG | @0 Tantalum @2 NC @5 18 |
---|
C03 | 14 | 3 | FRE | @0 Chrome @2 NC @5 19 |
---|
C03 | 14 | 3 | ENG | @0 Chromium @2 NC @5 19 |
---|
C03 | 15 | 3 | FRE | @0 Co @4 INC @5 52 |
---|
C03 | 16 | 3 | FRE | @0 Cu @4 INC @5 53 |
---|
C03 | 17 | 3 | FRE | @0 Al @4 INC @5 54 |
---|
C03 | 18 | 3 | FRE | @0 Ta @4 INC @5 55 |
---|
C03 | 19 | 3 | FRE | @0 7570P @2 PAC @4 INC @5 56 |
---|
C03 | 20 | 3 | FRE | @0 Cr @4 INC @5 92 |
---|
C07 | 01 | 3 | FRE | @0 Métal transition @5 48 |
---|
C07 | 01 | 3 | ENG | @0 Transition elements @5 48 |
---|
N21 | | | | @1 200 |
---|
|
pR |
A30 | 01 | 1 | ENG | @1 MML98 International Symposium on Metallic Multilayers @2 3 @3 Vancouver CAN @4 1998-06-14 |
---|
|
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Le document en format XML
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<term>Chromium</term>
<term>Cobalt</term>
<term>Copper</term>
<term>Experimental study</term>
<term>Giant magnetoresistance</term>
<term>Interface structure</term>
<term>Magnetization</term>
<term>Multilayers</term>
<term>Property structure relationship</term>
<term>Roughness</term>
<term>Size effect</term>
<term>Tantalum</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Etude expérimentale</term>
<term>Magnétorésistance géante</term>
<term>Multicouche</term>
<term>Couche tampon</term>
<term>Relation structure propriété</term>
<term>Structure interface</term>
<term>Rugosité</term>
<term>Aimantation</term>
<term>Effet dimensionnel</term>
<term>Cobalt</term>
<term>Cuivre</term>
<term>Aluminium</term>
<term>Tantale</term>
<term>Chrome</term>
<term>Co</term>
<term>Cu</term>
<term>Al</term>
<term>Ta</term>
<term>7570P</term>
<term>Cr</term>
</keywords>
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<front><div type="abstract" xml:lang="en">The correlation between the giant magnetoresistance AR/R, at the first maximum of the oscillating thickness dependence of the magnetoresistance (MR), and the structural and magnetic parameters has been investigated in (Co/Cu) multilayers (ML) deposited by the unusual RF sputtering method. Different textures and interface roughnesses have been induced from magnetic (Fe, Co) and non-magnetic (Cu, Al, Ta, Cr) buffers. The MR is independent of the ML texture and grain size but presents a strong correlation with the interface as deduced from small and large angle XRD and AFM. In high roughness ML the evolution, under increasing applied field, of AR/R versus (M/M<sub>s</sub>
)<sup>2</sup>
presents a strong deviation from a standard linear dependence. Such a deviation is attributed to the presence of Co granules in the Cu or/ and the buffer matrices when strong interface disorder is induced in the samples.</div>
</front>
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</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>17230</s2>
<s5>354000085341670350</s5>
</fA43>
<fA44><s0>0000</s0>
<s1>© 1999 INIST-CNRS. All rights reserved.</s1>
</fA44>
<fA45><s0>9 ref.</s0>
</fA45>
<fA47 i1="01" i2="1"><s0>99-0317962</s0>
</fA47>
<fA60><s1>P</s1>
<s2>C</s2>
</fA60>
<fA64 i1="01" i2="1"><s0>Journal of magnetism and magnetic materials</s0>
</fA64>
<fA66 i1="01"><s0>NLD</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>The correlation between the giant magnetoresistance AR/R, at the first maximum of the oscillating thickness dependence of the magnetoresistance (MR), and the structural and magnetic parameters has been investigated in (Co/Cu) multilayers (ML) deposited by the unusual RF sputtering method. Different textures and interface roughnesses have been induced from magnetic (Fe, Co) and non-magnetic (Cu, Al, Ta, Cr) buffers. The MR is independent of the ML texture and grain size but presents a strong correlation with the interface as deduced from small and large angle XRD and AFM. In high roughness ML the evolution, under increasing applied field, of AR/R versus (M/M<sub>s</sub>
)<sup>2</sup>
presents a strong deviation from a standard linear dependence. Such a deviation is attributed to the presence of Co granules in the Cu or/ and the buffer matrices when strong interface disorder is induced in the samples.</s0>
</fC01>
<fC02 i1="01" i2="3"><s0>001B70E70P</s0>
</fC02>
<fC02 i1="02" i2="X"><s0>240</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>Etude expérimentale</s0>
<s5>01</s5>
</fC03>
<fC03 i1="01" i2="3" l="ENG"><s0>Experimental study</s0>
<s5>01</s5>
</fC03>
<fC03 i1="02" i2="3" l="FRE"><s0>Magnétorésistance géante</s0>
<s5>02</s5>
</fC03>
<fC03 i1="02" i2="3" l="ENG"><s0>Giant magnetoresistance</s0>
<s5>02</s5>
</fC03>
<fC03 i1="03" i2="3" l="FRE"><s0>Multicouche</s0>
<s5>03</s5>
</fC03>
<fC03 i1="03" i2="3" l="ENG"><s0>Multilayers</s0>
<s5>03</s5>
</fC03>
<fC03 i1="04" i2="X" l="FRE"><s0>Couche tampon</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="ENG"><s0>Buffer layer</s0>
<s5>04</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA"><s0>Capa tampón</s0>
<s5>04</s5>
</fC03>
<fC03 i1="05" i2="X" l="FRE"><s0>Relation structure propriété</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="X" l="ENG"><s0>Property structure relationship</s0>
<s5>05</s5>
</fC03>
<fC03 i1="05" i2="X" l="SPA"><s0>Relación estructura propiedad</s0>
<s5>05</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>Structure interface</s0>
<s5>06</s5>
</fC03>
<fC03 i1="06" i2="3" l="ENG"><s0>Interface structure</s0>
<s5>06</s5>
</fC03>
<fC03 i1="07" i2="3" l="FRE"><s0>Rugosité</s0>
<s5>07</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG"><s0>Roughness</s0>
<s5>07</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>Aimantation</s0>
<s5>08</s5>
</fC03>
<fC03 i1="08" i2="3" l="ENG"><s0>Magnetization</s0>
<s5>08</s5>
</fC03>
<fC03 i1="09" i2="3" l="FRE"><s0>Effet dimensionnel</s0>
<s5>10</s5>
</fC03>
<fC03 i1="09" i2="3" l="ENG"><s0>Size effect</s0>
<s5>10</s5>
</fC03>
<fC03 i1="10" i2="3" l="FRE"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>15</s5>
</fC03>
<fC03 i1="10" i2="3" l="ENG"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>15</s5>
</fC03>
<fC03 i1="11" i2="3" l="FRE"><s0>Cuivre</s0>
<s2>NC</s2>
<s5>16</s5>
</fC03>
<fC03 i1="11" i2="3" l="ENG"><s0>Copper</s0>
<s2>NC</s2>
<s5>16</s5>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Aluminium</s0>
<s2>NC</s2>
<s5>17</s5>
</fC03>
<fC03 i1="12" i2="3" l="ENG"><s0>Aluminium</s0>
<s2>NC</s2>
<s5>17</s5>
</fC03>
<fC03 i1="13" i2="3" l="FRE"><s0>Tantale</s0>
<s2>NC</s2>
<s5>18</s5>
</fC03>
<fC03 i1="13" i2="3" l="ENG"><s0>Tantalum</s0>
<s2>NC</s2>
<s5>18</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE"><s0>Chrome</s0>
<s2>NC</s2>
<s5>19</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG"><s0>Chromium</s0>
<s2>NC</s2>
<s5>19</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE"><s0>Co</s0>
<s4>INC</s4>
<s5>52</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE"><s0>Cu</s0>
<s4>INC</s4>
<s5>53</s5>
</fC03>
<fC03 i1="17" i2="3" l="FRE"><s0>Al</s0>
<s4>INC</s4>
<s5>54</s5>
</fC03>
<fC03 i1="18" i2="3" l="FRE"><s0>Ta</s0>
<s4>INC</s4>
<s5>55</s5>
</fC03>
<fC03 i1="19" i2="3" l="FRE"><s0>7570P</s0>
<s2>PAC</s2>
<s4>INC</s4>
<s5>56</s5>
</fC03>
<fC03 i1="20" i2="3" l="FRE"><s0>Cr</s0>
<s4>INC</s4>
<s5>92</s5>
</fC03>
<fC07 i1="01" i2="3" l="FRE"><s0>Métal transition</s0>
<s5>48</s5>
</fC07>
<fC07 i1="01" i2="3" l="ENG"><s0>Transition elements</s0>
<s5>48</s5>
</fC07>
<fN21><s1>200</s1>
</fN21>
</pA>
<pR><fA30 i1="01" i2="1" l="ENG"><s1>MML98 International Symposium on Metallic Multilayers</s1>
<s2>3</s2>
<s3>Vancouver CAN</s3>
<s4>1998-06-14</s4>
</fA30>
</pR>
</standard>
</inist>
</record>
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