Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films
Identifieur interne : 000199 ( PascalFrancis/Checkpoint ); précédent : 000198; suivant : 000200Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films
Auteurs : A. Kharmouche [Algérie, France] ; S-M Cherif [France] ; A. Bourzami [Algérie] ; A. Layadi [Algérie] ; G. Schmerber [France]Source :
- Journal of physics. D, Applied physics : (Print) [ 0022-3727 ] ; 2004.
Descripteurs français
- Pascal (Inist)
- Wicri :
- topic : Cobalt.
English descriptors
- KwdEn :
Abstract
A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, tCo, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field Ha decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of Ha. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.
Affiliations:
- Algérie, France
- Alsace (région administrative), Grand Est, Île-de-France
- Strasbourg
- Université Paris 13, Université Strasbourg 1
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Kharmouche</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Département de Physique, Université Ferhat Abbas</s1><s2>Sétif 19000</s2><s3>DZA</s3><sZ>1 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Algérie</country><wicri:noRegion>Sétif 19000</wicri:noRegion></affiliation><affiliation wicri:level="4"><inist:fA14 i1="02"><s1>Laboratoire PMTM, Institut Galilée, Université Paris 13</s1><s2>Villetaneuse, 93340</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Île-de-France</region></placeName><orgName type="university">Université Paris 13</orgName></affiliation></author><author><name sortKey="Cherif, S M" sort="Cherif, S M" uniqKey="Cherif S" first="S-M" last="Cherif">S-M Cherif</name><affiliation wicri:level="4"><inist:fA14 i1="02"><s1>Laboratoire PMTM, Institut Galilée, Université Paris 13</s1><s2>Villetaneuse, 93340</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Île-de-France</region></placeName><orgName type="university">Université Paris 13</orgName></affiliation></author><author><name sortKey="Bourzami, A" sort="Bourzami, A" uniqKey="Bourzami A" first="A." last="Bourzami">A. Bourzami</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Département de Physique, Université Ferhat Abbas</s1><s2>Sétif 19000</s2><s3>DZA</s3><sZ>1 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Algérie</country><wicri:noRegion>Sétif 19000</wicri:noRegion></affiliation></author><author><name sortKey="Layadi, A" sort="Layadi, A" uniqKey="Layadi A" first="A." last="Layadi">A. Layadi</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Département de Physique, Université Ferhat Abbas</s1><s2>Sétif 19000</s2><s3>DZA</s3><sZ>1 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ></inist:fA14><country>Algérie</country><wicri:noRegion>Sétif 19000</wicri:noRegion></affiliation></author><author><name sortKey="Schmerber, G" sort="Schmerber, G" uniqKey="Schmerber G" first="G." last="Schmerber">G. Schmerber</name><affiliation wicri:level="4"><inist:fA14 i1="03"><s1>IPCMS-GEMME, UMR-CNRS, Université Louis Pasteur, 23 rue du Loess, B.P. 43</s1><s2>67034, Strasbourg</s2><s3>FRA</s3><sZ>5 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region">Grand Est</region><region type="old region">Alsace (région administrative)</region><settlement type="city">Strasbourg</settlement></placeName><orgName type="university">Université Strasbourg 1</orgName></affiliation></author></analytic><series><title level="j" type="main">Journal of physics. D, Applied physics : (Print)</title><title level="j" type="abbreviated">J. phys., D. Appl. phys. : (Print)</title><idno type="ISSN">0022-3727</idno><imprint><date when="2004">2004</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Journal of physics. D, Applied physics : (Print)</title><title level="j" type="abbreviated">J. phys., D. Appl. phys. : (Print)</title><idno type="ISSN">0022-3727</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Cobalt</term><term>Coercive force</term><term>Experimental study</term><term>Grain size</term><term>Light scattering</term><term>Magnetic anisotropy</term><term>Magnetic domains</term><term>Magnetic force microscopy</term><term>Magnetic hysteresis</term><term>Magnetic properties</term><term>Polycrystals</term><term>Stripe domains</term><term>Texture</term><term>Thickness</term><term>Thin films</term><term>XRD</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Propriété magnétique</term><term>Diffraction RX</term><term>Hystérésis magnétique</term><term>Diffusion lumière</term><term>Microscopie force magnétique</term><term>Texture</term><term>Grosseur grain</term><term>Force coercitive</term><term>Anisotropie magnétique</term><term>Domaine magnétique</term><term>Epaisseur</term><term>Couche mince</term><term>Polycristal</term><term>Cobalt</term><term>Etude expérimentale</term><term>7570A</term><term>Domaine en rubans</term></keywords><keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Cobalt</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t<sub>Co</sub>, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H<sub>a</sub> decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H<sub>a</sub>. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0022-3727</s0></fA01><fA02 i1="01"><s0>JPAPBE</s0></fA02><fA03 i2="1"><s0>J. phys., D. 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All rights reserved.</s1></fA44><fA45><s0>16 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>04-0516302</s0></fA47><fA60><s1>P</s1></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Journal of physics. D, Applied physics : (Print)</s0></fA64><fA66 i1="01"><s0>GBR</s0></fA66><fC01 i1="01" l="ENG"><s0>A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t<sub>Co</sub>, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H<sub>a</sub> decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H<sub>a</sub>. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.</s0></fC01><fC02 i1="01" i2="3"><s0>001B70E70A</s0></fC02><fC03 i1="01" i2="3" l="FRE"><s0>Propriété magnétique</s0><s5>02</s5></fC03><fC03 i1="01" i2="3" l="ENG"><s0>Magnetic properties</s0><s5>02</s5></fC03><fC03 i1="02" i2="3" l="FRE"><s0>Diffraction RX</s0><s5>03</s5></fC03><fC03 i1="02" i2="3" l="ENG"><s0>XRD</s0><s5>03</s5></fC03><fC03 i1="03" i2="3" l="FRE"><s0>Hystérésis magnétique</s0><s5>04</s5></fC03><fC03 i1="03" i2="3" l="ENG"><s0>Magnetic hysteresis</s0><s5>04</s5></fC03><fC03 i1="04" i2="3" l="FRE"><s0>Diffusion lumière</s0><s5>06</s5></fC03><fC03 i1="04" i2="3" l="ENG"><s0>Light scattering</s0><s5>06</s5></fC03><fC03 i1="05" i2="3" l="FRE"><s0>Microscopie force magnétique</s0><s5>07</s5></fC03><fC03 i1="05" i2="3" l="ENG"><s0>Magnetic force microscopy</s0><s5>07</s5></fC03><fC03 i1="06" i2="3" l="FRE"><s0>Texture</s0><s5>08</s5></fC03><fC03 i1="06" i2="3" l="ENG"><s0>Texture</s0><s5>08</s5></fC03><fC03 i1="07" i2="3" l="FRE"><s0>Grosseur grain</s0><s5>09</s5></fC03><fC03 i1="07" i2="3" l="ENG"><s0>Grain size</s0><s5>09</s5></fC03><fC03 i1="08" i2="3" l="FRE"><s0>Force coercitive</s0><s5>10</s5></fC03><fC03 i1="08" i2="3" l="ENG"><s0>Coercive force</s0><s5>10</s5></fC03><fC03 i1="09" i2="3" l="FRE"><s0>Anisotropie magnétique</s0><s5>11</s5></fC03><fC03 i1="09" i2="3" l="ENG"><s0>Magnetic anisotropy</s0><s5>11</s5></fC03><fC03 i1="10" i2="3" l="FRE"><s0>Domaine magnétique</s0><s5>12</s5></fC03><fC03 i1="10" i2="3" l="ENG"><s0>Magnetic domains</s0><s5>12</s5></fC03><fC03 i1="11" i2="3" l="FRE"><s0>Epaisseur</s0><s5>14</s5></fC03><fC03 i1="11" i2="3" l="ENG"><s0>Thickness</s0><s5>14</s5></fC03><fC03 i1="12" i2="3" l="FRE"><s0>Couche mince</s0><s5>17</s5></fC03><fC03 i1="12" i2="3" l="ENG"><s0>Thin films</s0><s5>17</s5></fC03><fC03 i1="13" i2="3" l="FRE"><s0>Polycristal</s0><s5>18</s5></fC03><fC03 i1="13" i2="3" l="ENG"><s0>Polycrystals</s0><s5>18</s5></fC03><fC03 i1="14" i2="3" l="FRE"><s0>Cobalt</s0><s2>NC</s2><s5>19</s5></fC03><fC03 i1="14" i2="3" l="ENG"><s0>Cobalt</s0><s2>NC</s2><s5>19</s5></fC03><fC03 i1="15" i2="3" l="FRE"><s0>Etude expérimentale</s0><s5>20</s5></fC03><fC03 i1="15" i2="3" l="ENG"><s0>Experimental study</s0><s5>20</s5></fC03><fC03 i1="16" i2="3" l="FRE"><s0>7570A</s0><s4>INC</s4><s5>56</s5></fC03><fC03 i1="17" i2="3" l="FRE"><s0>Domaine en rubans</s0><s4>CD</s4><s5>96</s5></fC03><fC03 i1="17" i2="3" l="ENG"><s0>Stripe domains</s0><s4>CD</s4><s5>96</s5></fC03><fN21><s1>292</s1></fN21><fN44 i1="01"><s1>PSI</s1></fN44><fN82><s1>PSI</s1></fN82></pA></standard></inist><affiliations><list><country><li>Algérie</li><li>France</li></country><region><li>Alsace (région administrative)</li><li>Grand Est</li><li>Île-de-France</li></region><settlement><li>Strasbourg</li></settlement><orgName><li>Université Paris 13</li><li>Université Strasbourg 1</li></orgName></list><tree><country name="Algérie"><noRegion><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name></noRegion><name sortKey="Bourzami, A" sort="Bourzami, A" uniqKey="Bourzami A" first="A." last="Bourzami">A. Bourzami</name><name sortKey="Layadi, A" sort="Layadi, A" uniqKey="Layadi A" first="A." last="Layadi">A. Layadi</name></country><country name="France"><region name="Île-de-France"><name sortKey="Kharmouche, A" sort="Kharmouche, A" uniqKey="Kharmouche A" first="A." last="Kharmouche">A. Kharmouche</name></region><name sortKey="Cherif, S M" sort="Cherif, S M" uniqKey="Cherif S" first="S-M" last="Cherif">S-M Cherif</name><name sortKey="Schmerber, G" sort="Schmerber, G" uniqKey="Schmerber G" first="G." last="Schmerber">G. Schmerber</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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