CobaltMaghrebV1, PascalFrancis, Corpus, bibRecord, 000206

Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films

Identifieur interne : 000206 ( PascalFrancis/Corpus ); précédent : 000205; suivant : 000207

Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films

Auteurs : A. Kharmouche ; S-M Cherif ; A. Bourzami ; A. Layadi ; G. Schmerber

Source :

Journal of physics. D, Applied physics : (Print) [ 0022-3727 ] ; 2004.

RBID : Pascal:04-0516302

Descripteurs français

Pascal (Inist)
- Propriété magnétique, Diffraction RX, Hystérésis magnétique, Diffusion lumière, Microscopie force magnétique, Texture, Grosseur grain, Force coercitive, Anisotropie magnétique, Domaine magnétique, Epaisseur, Couche mince, Polycristal, Cobalt, Etude expérimentale, 7570A, Domaine en rubans.

English descriptors

KwdEn :
- Cobalt, Coercive force, Experimental study, Grain size, Light scattering, Magnetic anisotropy, Magnetic domains, Magnetic force microscopy, Magnetic hysteresis, Magnetic properties, Polycrystals, Stripe domains, Texture, Thickness, Thin films, XRD.

Abstract

A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t_Co, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H_a decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H_a. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.

Notice en format standard (ISO 2709)

Pour connaître la documentation sur le format Inist Standard.

A01	`01`	`1`		`@0 0022-3727`
A02	`01`			`@0 JPAPBE`
A03		`1`		`@0 J. phys., D. Appl. phys. : (Print)`
A05				`@2 37`
A06				`@2 18`
A08	`01`	`1`	`ENG`	`@1 Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films`
A11	`01`	`1`		`@1 KHARMOUCHE (A.)`
A11	`02`	`1`		`@1 CHERIF (S-M)`
A11	`03`	`1`		`@1 BOURZAMI (A.)`
A11	`04`	`1`		`@1 LAYADI (A.)`
A11	`05`	`1`		`@1 SCHMERBER (G.)`
A14	`01`			`@1 Département de Physique, Université Ferhat Abbas @2 Sétif 19000 @3 DZA @Z 1 aut. @Z 3 aut. @Z 4 aut.`
A14	`02`			`@1 Laboratoire PMTM, Institut Galilée, Université Paris 13 @2 Villetaneuse, 93340 @3 FRA @Z 1 aut. @Z 2 aut.`
A14	`03`			`@1 IPCMS-GEMME, UMR-CNRS, Université Louis Pasteur, 23 rue du Loess, B.P. 43 @2 67034, Strasbourg @3 FRA @Z 5 aut.`
A20				`@1 2583-2587`
A21				`@1 2004`
A23	`01`			`@0 ENG`
A43	`01`			`@1 INIST @2 5841 @5 354000114166750150`
A44				`@0 0000 @1 © 2004 INIST-CNRS. All rights reserved.`
A45				`@0 16 ref.`
A47	`01`	`1`		`@0 04-0516302`
A60				`@1 P`
A61				`@0 A`
A64	`01`	`1`		`@0 Journal of physics. D, Applied physics : (Print)`
A66	`01`			`@0 GBR`
C01	`01`		`ENG`	@0 A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t_Co, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H_a decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H_a. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.
C02	`01`	`3`		`@0 001B70E70A`
C03	`01`	`3`	`FRE`	`@0 Propriété magnétique @5 02`
C03	`01`	`3`	`ENG`	`@0 Magnetic properties @5 02`
C03	`02`	`3`	`FRE`	`@0 Diffraction RX @5 03`
C03	`02`	`3`	`ENG`	`@0 XRD @5 03`
C03	`03`	`3`	`FRE`	`@0 Hystérésis magnétique @5 04`
C03	`03`	`3`	`ENG`	`@0 Magnetic hysteresis @5 04`
C03	`04`	`3`	`FRE`	`@0 Diffusion lumière @5 06`
C03	`04`	`3`	`ENG`	`@0 Light scattering @5 06`
C03	`05`	`3`	`FRE`	`@0 Microscopie force magnétique @5 07`
C03	`05`	`3`	`ENG`	`@0 Magnetic force microscopy @5 07`
C03	`06`	`3`	`FRE`	`@0 Texture @5 08`
C03	`06`	`3`	`ENG`	`@0 Texture @5 08`
C03	`07`	`3`	`FRE`	`@0 Grosseur grain @5 09`
C03	`07`	`3`	`ENG`	`@0 Grain size @5 09`
C03	`08`	`3`	`FRE`	`@0 Force coercitive @5 10`
C03	`08`	`3`	`ENG`	`@0 Coercive force @5 10`
C03	`09`	`3`	`FRE`	`@0 Anisotropie magnétique @5 11`
C03	`09`	`3`	`ENG`	`@0 Magnetic anisotropy @5 11`
C03	`10`	`3`	`FRE`	`@0 Domaine magnétique @5 12`
C03	`10`	`3`	`ENG`	`@0 Magnetic domains @5 12`
C03	`11`	`3`	`FRE`	`@0 Epaisseur @5 14`
C03	`11`	`3`	`ENG`	`@0 Thickness @5 14`
C03	`12`	`3`	`FRE`	`@0 Couche mince @5 17`
C03	`12`	`3`	`ENG`	`@0 Thin films @5 17`
C03	`13`	`3`	`FRE`	`@0 Polycristal @5 18`
C03	`13`	`3`	`ENG`	`@0 Polycrystals @5 18`
C03	`14`	`3`	`FRE`	`@0 Cobalt @2 NC @5 19`
C03	`14`	`3`	`ENG`	`@0 Cobalt @2 NC @5 19`
C03	`15`	`3`	`FRE`	`@0 Etude expérimentale @5 20`
C03	`15`	`3`	`ENG`	`@0 Experimental study @5 20`
C03	`16`	`3`	`FRE`	`@0 7570A @4 INC @5 56`
C03	`17`	`3`	`FRE`	`@0 Domaine en rubans @4 CD @5 96`
C03	`17`	`3`	`ENG`	`@0 Stripe domains @4 CD @5 96`
N21				`@1 292`
N44	`01`			`@1 PSI`
N82				`@1 PSI`

Format Inist (serveur)

NO :	PASCAL 04-0516302 INIST
ET :	Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films
AU :	KHARMOUCHE (A.); CHERIF (S-M); BOURZAMI (A.); LAYADI (A.); SCHMERBER (G.)
AF :	Département de Physique, Université Ferhat Abbas/Sétif 19000/Algérie (1 aut., 3 aut., 4 aut.); Laboratoire PMTM, Institut Galilée, Université Paris 13/Villetaneuse, 93340/France (1 aut., 2 aut.); IPCMS-GEMME, UMR-CNRS, Université Louis Pasteur, 23 rue du Loess, B.P. 43/67034, Strasbourg/France (5 aut.)
DT :	Publication en série; Niveau analytique
SO :	Journal of physics. D, Applied physics : (Print); ISSN 0022-3727; Coden JPAPBE; Royaume-Uni; Da. 2004; Vol. 37; No. 18; Pp. 2583-2587; Bibl. 16 ref.
LA :	Anglais
EA :	A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t_Co, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H_a decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H_a. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.
CC :	001B70E70A
FD :	Propriété magnétique; Diffraction RX; Hystérésis magnétique; Diffusion lumière; Microscopie force magnétique; Texture; Grosseur grain; Force coercitive; Anisotropie magnétique; Domaine magnétique; Epaisseur; Couche mince; Polycristal; Cobalt; Etude expérimentale; 7570A; Domaine en rubans
ED :	Magnetic properties; XRD; Magnetic hysteresis; Light scattering; Magnetic force microscopy; Texture; Grain size; Coercive force; Magnetic anisotropy; Magnetic domains; Thickness; Thin films; Polycrystals; Cobalt; Experimental study; Stripe domains
LO :	INIST-5841.354000114166750150
ID :	04-0516302

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Pascal:04-0516302

Le document en format XML

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<term>Force coercitive</term>
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<front><div type="abstract" xml:lang="en">A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t<sub>Co</sub>
, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H<sub>a</sub>
 decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H<sub>a</sub>
. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.</div>
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<fA14 i1="01"><s1>Département de Physique, Université Ferhat Abbas</s1>
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<sZ>2 aut.</sZ>
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<fC01 i1="01" l="ENG"><s0>A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t<sub>Co</sub>
, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H<sub>a</sub>
 decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H<sub>a</sub>
. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.</s0>
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<s5>07</s5>
</fC03>
<fC03 i1="05" i2="3" l="ENG"><s0>Magnetic force microscopy</s0>
<s5>07</s5>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>Texture</s0>
<s5>08</s5>
</fC03>
<fC03 i1="06" i2="3" l="ENG"><s0>Texture</s0>
<s5>08</s5>
</fC03>
<fC03 i1="07" i2="3" l="FRE"><s0>Grosseur grain</s0>
<s5>09</s5>
</fC03>
<fC03 i1="07" i2="3" l="ENG"><s0>Grain size</s0>
<s5>09</s5>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>Force coercitive</s0>
<s5>10</s5>
</fC03>
<fC03 i1="08" i2="3" l="ENG"><s0>Coercive force</s0>
<s5>10</s5>
</fC03>
<fC03 i1="09" i2="3" l="FRE"><s0>Anisotropie magnétique</s0>
<s5>11</s5>
</fC03>
<fC03 i1="09" i2="3" l="ENG"><s0>Magnetic anisotropy</s0>
<s5>11</s5>
</fC03>
<fC03 i1="10" i2="3" l="FRE"><s0>Domaine magnétique</s0>
<s5>12</s5>
</fC03>
<fC03 i1="10" i2="3" l="ENG"><s0>Magnetic domains</s0>
<s5>12</s5>
</fC03>
<fC03 i1="11" i2="3" l="FRE"><s0>Epaisseur</s0>
<s5>14</s5>
</fC03>
<fC03 i1="11" i2="3" l="ENG"><s0>Thickness</s0>
<s5>14</s5>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Couche mince</s0>
<s5>17</s5>
</fC03>
<fC03 i1="12" i2="3" l="ENG"><s0>Thin films</s0>
<s5>17</s5>
</fC03>
<fC03 i1="13" i2="3" l="FRE"><s0>Polycristal</s0>
<s5>18</s5>
</fC03>
<fC03 i1="13" i2="3" l="ENG"><s0>Polycrystals</s0>
<s5>18</s5>
</fC03>
<fC03 i1="14" i2="3" l="FRE"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>19</s5>
</fC03>
<fC03 i1="14" i2="3" l="ENG"><s0>Cobalt</s0>
<s2>NC</s2>
<s5>19</s5>
</fC03>
<fC03 i1="15" i2="3" l="FRE"><s0>Etude expérimentale</s0>
<s5>20</s5>
</fC03>
<fC03 i1="15" i2="3" l="ENG"><s0>Experimental study</s0>
<s5>20</s5>
</fC03>
<fC03 i1="16" i2="3" l="FRE"><s0>7570A</s0>
<s4>INC</s4>
<s5>56</s5>
</fC03>
<fC03 i1="17" i2="3" l="FRE"><s0>Domaine en rubans</s0>
<s4>CD</s4>
<s5>96</s5>
</fC03>
<fC03 i1="17" i2="3" l="ENG"><s0>Stripe domains</s0>
<s4>CD</s4>
<s5>96</s5>
</fC03>
<fN21><s1>292</s1>
</fN21>
<fN44 i1="01"><s1>PSI</s1>
</fN44>
<fN82><s1>PSI</s1>
</fN82>
</pA>
</standard>
<server><NO>PASCAL 04-0516302 INIST</NO>
<ET>Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films</ET>
<AU>KHARMOUCHE (A.); CHERIF (S-M); BOURZAMI (A.); LAYADI (A.); SCHMERBER (G.)</AU>
<AF>Département de Physique, Université Ferhat Abbas/Sétif 19000/Algérie (1 aut., 3 aut., 4 aut.); Laboratoire PMTM, Institut Galilée, Université Paris 13/Villetaneuse, 93340/France (1 aut., 2 aut.); IPCMS-GEMME, UMR-CNRS, Université Louis Pasteur, 23 rue du Loess, B.P. 43/67034, Strasbourg/France (5 aut.)</AF>
<DT>Publication en série; Niveau analytique</DT>
<SO>Journal of physics. D, Applied physics : (Print); ISSN 0022-3727; Coden JPAPBE; Royaume-Uni; Da. 2004; Vol. 37; No. 18; Pp. 2583-2587; Bibl. 16 ref.</SO>
<LA>Anglais</LA>
<EA>A series of Co thin films have been evaporated onto Si(100) and glass substrates. The Co thickness, t<sub>Co</sub>
, ranges from 50 to 195 nm. The structural and magnetic properties have been investigated by x-ray diffraction, hysteresis curves, Brillouin light scattering and magnetic force microscopy (MFM) techniques. The Co thin films are found to be polycrystalline with (0001) texture. There is an increase of the grain size with increasing film thickness. The coercive fields range from values as low as 2 Oe in thinner films to the highest values, 2500 Oe, in 195 nm thick Co/Si films. The magnetocrystalline anisotropy field H<sub>a</sub>
 decreases as the thickness increases; surface and stress induced anisotropies seem to contribute to the value of H<sub>a</sub>
. MFM images reveal a well-defined stripe pattern for thicker Co/Si samples. Such domains are not observed in the case of the thinner films. These su-called weak-stripe domains appear in magnetic films with a low or intermediate perpendicular anisotropy. Similar behaviour was observed in Co/glass samples, in addition, cross-tie walls were seen in thinner ones.</EA>
<CC>001B70E70A</CC>
<FD>Propriété magnétique; Diffraction RX; Hystérésis magnétique; Diffusion lumière; Microscopie force magnétique; Texture; Grosseur grain; Force coercitive; Anisotropie magnétique; Domaine magnétique; Epaisseur; Couche mince; Polycristal; Cobalt; Etude expérimentale; 7570A; Domaine en rubans</FD>
<ED>Magnetic properties; XRD; Magnetic hysteresis; Light scattering; Magnetic force microscopy; Texture; Grain size; Coercive force; Magnetic anisotropy; Magnetic domains; Thickness; Thin films; Polycrystals; Cobalt; Experimental study; Stripe domains</ED>
<LO>INIST-5841.354000114166750150</LO>
<ID>04-0516302</ID>
</server>
</inist>
</record>

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Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films

Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films

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