Serveur d'exploration sur l'Indium - Analysis (France)

Index « Auteurs » - entrée « P. Legay »
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P. Lefebvre < P. Legay < P. Legoll  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 10.
Ident.Authors (with country if any)Title
001590 (1999-02-15) Oxide confining layer on an InP substrate
001704 (1999) MOVPE growth of a monolithic VCSEL at 1.56 μm in the InGaAlAs-InAlAs system lattice matched to InP
001B13 (1997-07) Base metallization stability in InP/InGaAs heterojunction bipolar transistors and its influence on leakage currents
001C93 (1997) Controlled steam oxidation of AlInAs for microelectronics and optoelectronics applications
001D85 (1996-06-24) p- and n-type carbon doping of InxGa1-xAsyP1-y alloys lattice matched to InP
001F71 (1996) Benefits of chemical beam epitaxy for micro and optoelectronic applications
002045 (1995-06-15) Acoustical and optical properties of Ga0.52In0.48P: A Brillouin scattering study
002102 (1995) Uniform selective area growth of GaAs and GaInP by low temperature chemical beam epitaxy
002192 (1995) Dependence of InP and GaAs chemical beam epitaxy growth rate on substrate orientations ; applications to selective area epitaxy
002370 (1994) Optical characterization of chemical beam epitaxy grown Ga0.52In0.48P layers and related microstructures

List of associated KwdEn.i

Nombre de
documents
Descripteur
6Experimental study
5Indium phosphides
4Gallium arsenides
3Binary compounds
3Crystal growth from vapors
3Epitaxy
3Gallium phosphides
3III-V semiconductors
3Refractive index
3Semiconductor lasers
3Ternary compounds
2Brillouin effect
2Chemical beam condensation
2Ellipsometry
2Epitaxial layers
2III-V compound
2Indium compounds
2Microelectronic fabrication
2Oxidation
2Selective area
2Semiconductor materials
2Substrates
1Absorption
1Acoustic properties
1Aluminium Arsenides
1Aluminium compounds
1Annealing
1Bipolar transistors
1CBE
1Carbon additions
1Characterization
1Chemical beam epitaxy
1Chemical composition
1Chemical interdiffusion
1Contact resistance
1Critical temperature
1Crystal doping
1Crystal lattices
1Crystal orientation
1Current density
1Diffusion
1Distributed Bragg reflector
1Elastic constants
1Experiments
1Heterojunction bipolar transistors
1Heterojunction transistor
1Indium Arsenides
1Indium arsenides
1Integrated optoelectronics
1Kinetics
1Leakage currents
1Light scattering
1Low pressure metallorganic vapor phase epitaxy
1Low temperature
1Metallorganic vapor phase epitaxy
1Microstructure
1Mirrors
1Morphology
1Multiple quantum well
1Native state
1Ohmic contacts
1Optical properties
1Photoluminescence
1Precipitation
1Raman scattering
1Raman spectra
1Reviews
1Semiconducting indium compounds
1Semiconducting indium phosphide
1Semiconducting silicon
1Semiconductor device metallizing
1Semiconductor superlattices
1Spectroscopy
1Steam
1Strained quantum well
1Superlattices
1Surface emitting lasers
1Surface treatments
1Ternary compound
1Theory
1Thermal method
1Thin films
1Uniformity
1Vertical cavity surface emitting laser
1Visible radiation

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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i  \
                -Sk "P. Legay" \
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