Serveur d'exploration sur l'Indium - Analysis (Chine)

Index « Auteurs » - entrée « Z. Z. Chen »
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Z. Yu < Z. Z. Chen < Z. Z. Gan  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000560 (2012) Electrical, spectral and optical performance of yellow-green and amber micro-pixelated InGaN light-emitting diodes
000823 (2011) Improvement of structural and luminescence properties in InGaN/GaN multiple quantum wells by symmetrical thin low temperature-GaN layers
001262 (2007) The origins of double emission peaks in electroluminescence spectrum from InGaN/GaN MQW LED
001947 (2004) Study of photoluminescence and absorption in phase-separation InGaN films
001971 (2004) Photoluminescence from InGaN/GaN MQWs on sapphire and membranes fabricated by laser lift-off
001B89 (2003) InGaN/GaN MQW high brightness LED grown by MOCVD

List of associated KwdEn.i

Nombre de
documents
Descripteur
5Photoluminescence
3Gallium nitride
3Gallium nitrides
3Indium nitride
3Indium nitrides
3MOCVD
3Multiple quantum well
3Spectral line shift
3XRD
2Cathodoluminescence
2III-V compound
2III-V semiconductors
2Inorganic compounds
2Light emitting diode
2Luminescence
2MOVPE method
2Nanostructured materials
2Quantum dots
2Radiative recombination
2Semiconductor materials
2Ternary compounds
1Absorption spectra
1Annealing
1Atomic force microscopy
1Backscattering
1Binary compound
1Carrier lifetime
1Charge carrier injection
1Chemical composition
1Composition effect
1Compressive stress
1Current density
1Deep level
1Defect density
1Desorption
1Electroluminescence
1Energy level population
1Epitaxy
1Excitation spectrum
1Experimental study
1Fabrication property relation
1Flip chip bonding
1Gallium
1Growth mechanism
1Heterostructures
1Inclusions
1Indium
1Interfaces
1Lift off
1Light emitting diodes
1Microelectronic fabrication
1Microstructure
1Nitrides
1Optical microscopy
1Optical properties
1Optoelectronic device
1Optoelectronic devices
1Phase separation
1Piezoelectric materials
1Quantum dot
1Quantum wells
1Quantum yield
1RBS
1Raman spectra
1Roughness
1Size effect
1Stokes shift
1Strained layer
1Temperature dependence
1Temperature effect
1Ternary compound
1Thickness
1Time resolution
1Time resolved spectra
1Urbach rule
1VPE
1Voltage current curve
1Wafers
1X ray diffraction
1X ray diffractometry

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