Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing
Identifieur interne : 004039 ( Main/Merge ); précédent : 004038; suivant : 004040Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing
Auteurs : A F J. Van Raan ; J G M. Van Der VeldeSource :
- Research Evaluation [ 0958-2029 ] ; 1992-08.
Abstract
An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.
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DOI: 10.1093/rev/2.2.103
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<record><TEI wicri:istexFullTextTei="biblStruct"><teiHeader><fileDesc><titleStmt><title>Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><author><name sortKey="Van Raan, A F J" sort="Van Raan, A F J" uniqKey="Van Raan A" first="A F J" last="Van Raan">A F J. Van Raan</name></author><author><name sortKey="Van Der Velde, J G M" sort="Van Der Velde, J G M" uniqKey="Van Der Velde J" first="J G M" last="Van Der Velde">J G M. Van Der Velde</name></author></titleStmt><publicationStmt><idno type="wicri:source">ISTEX</idno><idno type="RBID">ISTEX:C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</idno><date when="1992" year="1992">1992</date><idno type="doi">10.1093/rev/2.2.103</idno><idno type="url">https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/fulltext/pdf</idno><idno type="wicri:Area/Istex/Corpus">003A79</idno><idno type="wicri:Area/Istex/Curation">003607</idno><idno type="wicri:Area/Istex/Checkpoint">003612</idno><idno type="wicri:doubleKey">0958-2029:1992:Van Raan A:self:organized:mapping</idno><idno type="wicri:Area/Main/Merge">004039</idno></publicationStmt><sourceDesc><biblStruct><analytic><title level="a">Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><author><name sortKey="Van Raan, A F J" sort="Van Raan, A F J" uniqKey="Van Raan A" first="A F J" last="Van Raan">A F J. Van Raan</name></author><author><name sortKey="Van Der Velde, J G M" sort="Van Der Velde, J G M" uniqKey="Van Der Velde J" first="J G M" last="Van Der Velde">J G M. Van Der Velde</name></author></analytic><monogr></monogr><series><title level="j">Research Evaluation</title><title level="j" type="abbrev">res eval</title><idno type="ISSN">0958-2029</idno><idno type="eISSN">1471-5449</idno><imprint><publisher>Beech Tree Publishing</publisher><date type="published" when="1992-08">1992-08</date><biblScope unit="volume">2</biblScope><biblScope unit="issue">2</biblScope><biblScope unit="page" from="103">103</biblScope><biblScope unit="page" to="110">110</biblScope></imprint><idno type="ISSN">0958-2029</idno></series><idno type="istex">C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</idno><idno type="DOI">10.1093/rev/2.2.103</idno></biblStruct></sourceDesc><seriesStmt><idno type="ISSN">0958-2029</idno></seriesStmt></fileDesc><profileDesc><textClass></textClass><langUsage><language ident="en">en</language></langUsage></profileDesc></teiHeader><front><div type="abstract">An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.</div></front></TEI></record>Pour manipuler ce document sous Unix (Dilib)
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