Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing
Identifieur interne : 003A79 ( Istex/Corpus ); précédent : 003A78; suivant : 003A80Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing
Auteurs : A F J. Van Raan ; J G M. Van Der VeldeSource :
- Research Evaluation [ 0958-2029 ] ; 1992-08.
Abstract
An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.
Url:
DOI: 10.1093/rev/2.2.103
Links to Exploration step
ISTEX:C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73Le document en format XML
<record><TEI wicri:istexFullTextTei="biblStruct"><teiHeader><fileDesc><titleStmt><title>Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><author><name sortKey="Van Raan, A F J" sort="Van Raan, A F J" uniqKey="Van Raan A" first="A F J" last="Van Raan">A F J. Van Raan</name></author><author><name sortKey="Van Der Velde, J G M" sort="Van Der Velde, J G M" uniqKey="Van Der Velde J" first="J G M" last="Van Der Velde">J G M. Van Der Velde</name></author></titleStmt><publicationStmt><idno type="wicri:source">ISTEX</idno><idno type="RBID">ISTEX:C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</idno><date when="1992" year="1992">1992</date><idno type="doi">10.1093/rev/2.2.103</idno><idno type="url">https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/fulltext/pdf</idno><idno type="wicri:Area/Istex/Corpus">003A79</idno></publicationStmt><sourceDesc><biblStruct><analytic><title level="a">Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><author><name sortKey="Van Raan, A F J" sort="Van Raan, A F J" uniqKey="Van Raan A" first="A F J" last="Van Raan">A F J. Van Raan</name></author><author><name sortKey="Van Der Velde, J G M" sort="Van Der Velde, J G M" uniqKey="Van Der Velde J" first="J G M" last="Van Der Velde">J G M. Van Der Velde</name></author></analytic><monogr></monogr><series><title level="j">Research Evaluation</title><title level="j" type="abbrev">res eval</title><idno type="ISSN">0958-2029</idno><idno type="eISSN">1471-5449</idno><imprint><publisher>Beech Tree Publishing</publisher><date type="published" when="1992-08">1992-08</date><biblScope unit="volume">2</biblScope><biblScope unit="issue">2</biblScope><biblScope unit="page" from="103">103</biblScope><biblScope unit="page" to="110">110</biblScope></imprint><idno type="ISSN">0958-2029</idno></series><idno type="istex">C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</idno><idno type="DOI">10.1093/rev/2.2.103</idno></biblStruct></sourceDesc><seriesStmt><idno type="ISSN">0958-2029</idno></seriesStmt></fileDesc><profileDesc><textClass></textClass><langUsage><language ident="en">en</language></langUsage></profileDesc></teiHeader><front><div type="abstract">An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.</div></front></TEI><istex><corpusName>oup</corpusName><author><json:item><name>A F J van Raan</name></json:item><json:item><name>J G M van der Velde</name></json:item></author><subject><json:item><lang><json:string>eng</json:string></lang><value>Main articles</value></json:item></subject><language><json:string>eng</json:string></language><abstract>An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.</abstract><qualityIndicators><score>6.48</score><pdfVersion>1.4</pdfVersion><pdfPageSize>595.3 x 841.89 pts (A4)</pdfPageSize><refBibsNative>false</refBibsNative><keywordCount>1</keywordCount><abstractCharCount>1073</abstractCharCount><pdfWordCount>4108</pdfWordCount><pdfCharCount>27134</pdfCharCount><pdfPageCount>8</pdfPageCount><abstractWordCount>156</abstractWordCount></qualityIndicators><title>Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><genre><json:string>research-article</json:string></genre><host><volume>2</volume><pages><last>110</last><first>103</first></pages><issn><json:string>0958-2029</json:string></issn><issue>2</issue><genre></genre><language><json:string>unknown</json:string></language><eissn><json:string>1471-5449</json:string></eissn><title>Research Evaluation</title></host><categories><wos><json:string>INFORMATION SCIENCE & LIBRARY SCIENCE</json:string></wos></categories><publicationDate>1992</publicationDate><copyrightDate>1992</copyrightDate><doi><json:string>10.1093/rev/2.2.103</json:string></doi><id>C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</id><fulltext><json:item><original>true</original><mimetype>application/pdf</mimetype><extension>pdf</extension><uri>https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/fulltext/pdf</uri></json:item><json:item><original>false</original><mimetype>application/zip</mimetype><extension>zip</extension><uri>https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/fulltext/zip</uri></json:item><istex:fulltextTEI uri="https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/fulltext/tei"><teiHeader><fileDesc><titleStmt><title level="a">Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><respStmt xml:id="ISTEX-API" resp="Références bibliographiques récupérées via GROBID" name="ISTEX-API (INIST-CNRS)"></respStmt></titleStmt><publicationStmt><authority>ISTEX</authority><publisher>Beech Tree Publishing</publisher><availability><p>OUP</p></availability><date>1992</date></publicationStmt><notesStmt><note>A F J van Raan and J G M van der Velde are in the Centre for Science and Technology Studies (CWTS), University of Leiden, Wassenaarseweg 52, PO Box 9555, 2300 RB Leiden, The Netherlands.</note></notesStmt><sourceDesc><biblStruct type="inbook"><analytic><title level="a">Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title><author><persName><forename type="first">A F J</forename><surname>van Raan</surname></persName></author><author><persName><forename type="first">J G M</forename><surname>van der Velde</surname></persName></author></analytic><monogr><title level="j">Research Evaluation</title><title level="j" type="abbrev">res eval</title><idno type="JournalID">rev</idno><idno type="pISSN">0958-2029</idno><idno type="eISSN">1471-5449</idno><imprint><publisher>Beech Tree Publishing</publisher><date type="published" when="1992-08"></date><biblScope unit="volume">2</biblScope><biblScope unit="issue">2</biblScope><biblScope unit="page" from="103">103</biblScope><biblScope unit="page" to="110">110</biblScope></imprint></monogr><idno type="istex">C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</idno><idno type="DOI">10.1093/rev/2.2.103</idno></biblStruct></sourceDesc></fileDesc><profileDesc><creation><date>1992</date></creation><langUsage><language ident="en">en</language></langUsage><abstract><p>An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.</p></abstract><textClass><keywords scheme="keyword"><list><head>heading</head><item><term>Main articles</term></item></list></keywords></textClass></profileDesc><revisionDesc><change when="1992-08">Published</change><change xml:id="refBibs-istex" who="#ISTEX-API" when="2016-0-27">References added</change></revisionDesc></teiHeader></istex:fulltextTEI><json:item><original>false</original><mimetype>text/plain</mimetype><extension>txt</extension><uri>https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/fulltext/txt</uri></json:item></fulltext><metadata><istex:metadataXml wicri:clean="corpus oup" wicri:toSee="no header"><istex:xmlDeclaration>version="1.0"</istex:xmlDeclaration><istex:docType PUBLIC="-//NLM//DTD Journal Publishing DTD v2.3 20070202//EN" URI="journalpublishing.dtd" name="istex:docType"></istex:docType><istex:document><article article-type="research-article"><front><journal-meta><journal-id journal-id-type="hwp">rev</journal-id><journal-id journal-id-type="publisher-id">rev</journal-id><journal-title>Research Evaluation</journal-title><abbrev-journal-title>res eval</abbrev-journal-title><issn pub-type="ppub">0958-2029</issn><issn pub-type="epub">1471-5449</issn><publisher><publisher-name>Beech Tree Publishing</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.1093/rev/2.2.103</article-id><article-categories><subj-group subj-group-type="heading"><subject>Main articles</subject><subj-group subj-group-type="heading"><subject>Mapping R&D</subject></subj-group></subj-group></article-categories><title-group><article-title>Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</article-title></title-group><contrib-group><contrib contrib-type="author"><name><surname>van Raan</surname><given-names>A F J</given-names></name><xref ref-type="author-notes" rid="fn1"></xref></contrib><contrib contrib-type="author"><name><surname>van der Velde</surname><given-names>J G M</given-names></name><xref ref-type="author-notes" rid="fn1"></xref></contrib></contrib-group><author-notes><fn id="fn1" fn-type="other"><p>A F J van Raan and J G M van der Velde are in the Centre for Science and Technology Studies (CWTS), University of Leiden, Wassenaarseweg 52, PO Box 9555, 2300 RB Leiden, The Netherlands.</p></fn></author-notes><pub-date pub-type="ppub"><month>8</month><year>1992</year></pub-date><volume>2</volume><issue>2</issue><fpage>103</fpage><lpage>110</lpage><copyright-statement>© Beech Tree Publishing 1992</copyright-statement><copyright-year>1992</copyright-year><abstract><p>An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion).</p><p>The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques).</p><p>More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.</p></abstract></article-meta></front></article></istex:document></istex:metadataXml><mods version="3.6"><titleInfo><title>Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title></titleInfo><titleInfo type="alternative" contentType="CDATA"><title>Self-organized mapping of R&D activities: bibliometric cartography of integrated circuit design testing</title></titleInfo><name type="personal"><namePart type="given">A F J</namePart><namePart type="family">van Raan</namePart><role><roleTerm type="text">author</roleTerm></role></name><name type="personal"><namePart type="given">J G M</namePart><namePart type="family">van der Velde</namePart><role><roleTerm type="text">author</roleTerm></role></name><typeOfResource>text</typeOfResource><genre type="research-article">research-article</genre><subject><genre>heading</genre><topic>Main articles</topic></subject><originInfo><publisher>Beech Tree Publishing</publisher><dateIssued encoding="w3cdtf">1992-08</dateIssued><copyrightDate encoding="w3cdtf">1992</copyrightDate></originInfo><language><languageTerm type="code" authority="iso639-2b">eng</languageTerm><languageTerm type="code" authority="rfc3066">en</languageTerm></language><physicalDescription><internetMediaType>text/html</internetMediaType></physicalDescription><abstract>An exploratory bibliometric analysis of an R&D field (integrated circuit design testing) had the aim of visualizing the field's knowledge structure, and changes over time. It used bibliometric cartography based on co-word analysis. The basic approach and its relation with self-organizing systems are outlined; this includes the techniques for defining the field, drawing on publications (there being few patents for inclusion). The resultant four maps show the cognitive structures of the more scientific and the more technological sides, for 1984–1985 and 1990–1991. The main structure of the field changed relatively little over time, but emerging features of possible future importance can be seen. The maps' modular structure shows the core concepts are very closely related to other specific technologies (gate-arrays, logic devices, and so on), and other specific areas are also important (such as simulation and verification techniques). More specific studies, aiming at particular developments in the method, are suggested, and reader feedback is strongly invited.</abstract><note type="footnotes">A F J van Raan and J G M van der Velde are in the Centre for Science and Technology Studies (CWTS), University of Leiden, Wassenaarseweg 52, PO Box 9555, 2300 RB Leiden, The Netherlands.</note><relatedItem type="host"><titleInfo><title>Research Evaluation</title></titleInfo><titleInfo type="abbreviated"><title>res eval</title></titleInfo><identifier type="ISSN">0958-2029</identifier><identifier type="eISSN">1471-5449</identifier><identifier type="JournalID">rev</identifier><identifier type="JournalID-hwp">rev</identifier><part><date>1992</date><detail type="volume"><caption>vol.</caption><number>2</number></detail><detail type="issue"><caption>no.</caption><number>2</number></detail><extent unit="pages"><start>103</start><end>110</end></extent></part></relatedItem><identifier type="istex">C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73</identifier><identifier type="DOI">10.1093/rev/2.2.103</identifier><accessCondition type="use and reproduction" contentType="Copyright">© Beech Tree Publishing 1992</accessCondition><recordInfo><recordContentSource>OUP</recordContentSource></recordInfo></mods></metadata><covers><json:item><original>true</original><mimetype>image/tiff</mimetype><extension>tiff</extension><uri>https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/covers/tiff</uri></json:item></covers><annexes><json:item><original>true</original><mimetype>application/pdf</mimetype><extension>pdf</extension><uri>https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/annexes/pdf</uri></json:item></annexes><enrichments><istex:catWosTEI uri="https://api.istex.fr/document/C525A4A1A719B5E0B17ACA6F9D92E37542DBDE73/enrichments/catWos"><teiHeader><profileDesc><textClass><classCode scheme="WOS">INFORMATION SCIENCE & LIBRARY SCIENCE</classCode></textClass></profileDesc></teiHeader></istex:catWosTEI></enrichments><serie></serie></istex></record>Pour manipuler ce document sous Unix (Dilib)
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