Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection
Identifieur interne : 002631 ( Istex/Corpus ); précédent : 002630; suivant : 002632Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection
Auteurs : L. C. Lee ; Z. F. FuSource :
- Journal of Geophysical Research: Space Physics [ 0148-0227 ] ; 1986-06-01.
Abstract
In an earlier paper we suggested that the multiple X line reconnection process may occur at the dayside magnetopause and lead to the occurrence of flux transfer events. In a series of papers we shall examine in detail various aspects of the multiple X line reconnection processes. In the present paper, the first of the series, we attempt to obtain a criterion for the transition from the classical single X line reconnection to the multiple X line reconnection based on a two‐dimensional simulation model. It is found that the development of tearing instability in the diffusion region of the reconnection configuration may lead to the formation of magnetic islands and hence to the occurrence of multiple X line reconnection. The criterion for the tearing instability is found to be l/δ > 7 coth (8/S0.5), where S is the Lundquist number based on the width of the diffusion region, l is the half‐length, and δ the half‐width of the diffusion region. Furthermore, a formula is obtained for the dependence of the ratio l/δ on the system length Lz, the imposed reconnection rate R0, and the resistivity η. The ratio l/δ is found to increase with an increasing system length Lz, an increasing imposed reconnection rate R0, and a decreasing resistivity η. Therefore the multiple X line reconnection process tends to occur when the system length is long, the reconnection rate is high, or the resistivity is small.
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DOI: 10.1029/JA091iA06p06807
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A criterion for the transition from a single X line to a multiple X line reconnection</title><author wicri:is="90%"><name sortKey="Lee, L C" sort="Lee, L C" uniqKey="Lee L" first="L. C." last="Lee">L. C. Lee</name></author><author wicri:is="90%"><name sortKey="Fu, Z F" sort="Fu, Z F" uniqKey="Fu Z" first="Z. F." last="Fu">Z. F. Fu</name></author></analytic><monogr></monogr><series><title level="j">Journal of Geophysical Research: Space Physics</title><title level="j" type="abbrev">J. Geophys. Res.</title><idno type="ISSN">0148-0227</idno><idno type="eISSN">2156-2202</idno><imprint><publisher>Blackwell Publishing Ltd</publisher><date type="published" when="1986-06-01">1986-06-01</date><biblScope unit="volume">91</biblScope><biblScope unit="issue">A6</biblScope><biblScope unit="page" from="6807">6807</biblScope><biblScope unit="page" to="6815">6815</biblScope></imprint><idno type="ISSN">0148-0227</idno></series><idno type="istex">1F992218258B52E9C4DE8BCE0722FA7C11BFC89E</idno><idno type="DOI">10.1029/JA091iA06p06807</idno><idno type="ArticleID">5A8245</idno></biblStruct></sourceDesc><seriesStmt><idno type="ISSN">0148-0227</idno></seriesStmt></fileDesc><profileDesc><textClass></textClass><langUsage><language ident="en">en</language></langUsage></profileDesc></teiHeader><front><div type="abstract">In an earlier paper we suggested that the multiple X line reconnection process may occur at the dayside magnetopause and lead to the occurrence of flux transfer events. In a series of papers we shall examine in detail various aspects of the multiple X line reconnection processes. In the present paper, the first of the series, we attempt to obtain a criterion for the transition from the classical single X line reconnection to the multiple X line reconnection based on a two‐dimensional simulation model. It is found that the development of tearing instability in the diffusion region of the reconnection configuration may lead to the formation of magnetic islands and hence to the occurrence of multiple X line reconnection. The criterion for the tearing instability is found to be l/δ > 7 coth (8/S0.5), where S is the Lundquist number based on the width of the diffusion region, l is the half‐length, and δ the half‐width of the diffusion region. Furthermore, a formula is obtained for the dependence of the ratio l/δ on the system length Lz, the imposed reconnection rate R0, and the resistivity η. The ratio l/δ is found to increase with an increasing system length Lz, an increasing imposed reconnection rate R0, and a decreasing resistivity η. Therefore the multiple X line reconnection process tends to occur when the system length is long, the reconnection rate is high, or the resistivity is small.</div></front></TEI><istex><corpusName>wiley</corpusName><author><json:item><name>L. C. Lee</name></json:item><json:item><name>Z. F. Fu</name></json:item></author><articleId><json:string>5A8245</json:string></articleId><language><json:string>eng</json:string></language><abstract>In an earlier paper we suggested that the multiple X line reconnection process may occur at the dayside magnetopause and lead to the occurrence of flux transfer events. In a series of papers we shall examine in detail various aspects of the multiple X line reconnection processes. In the present paper, the first of the series, we attempt to obtain a criterion for the transition from the classical single X line reconnection to the multiple X line reconnection based on a two‐dimensional simulation model. It is found that the development of tearing instability in the diffusion region of the reconnection configuration may lead to the formation of magnetic islands and hence to the occurrence of multiple X line reconnection. The criterion for the tearing instability is found to be l/δ > 7 coth (8/S0.5), where S is the Lundquist number based on the width of the diffusion region, l is the half‐length, and δ the half‐width of the diffusion region. Furthermore, a formula is obtained for the dependence of the ratio l/δ on the system length Lz, the imposed reconnection rate R0, and the resistivity η. The ratio l/δ is found to increase with an increasing system length Lz, an increasing imposed reconnection rate R0, and a decreasing resistivity η. Therefore the multiple X line reconnection process tends to occur when the system length is long, the reconnection rate is high, or the resistivity is small.</abstract><qualityIndicators><score>7.126</score><pdfVersion>1.3</pdfVersion><pdfPageSize>620 x 812 pts</pdfPageSize><refBibsNative>true</refBibsNative><keywordCount>0</keywordCount><abstractCharCount>1410</abstractCharCount><pdfWordCount>4294</pdfWordCount><pdfCharCount>31637</pdfCharCount><pdfPageCount>9</pdfPageCount><abstractWordCount>236</abstractWordCount></qualityIndicators><title>Multiple X line reconnection: 1. 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Res.</title><idno type="pISSN">0148-0227</idno><idno type="eISSN">2156-2202</idno><idno type="DOI">10.1002/(ISSN)2156-2202a</idno><imprint><publisher>Blackwell Publishing Ltd</publisher><date type="published" when="1986-06-01"></date><biblScope unit="volume">91</biblScope><biblScope unit="issue">A6</biblScope><biblScope unit="page" from="6807">6807</biblScope><biblScope unit="page" to="6815">6815</biblScope></imprint></monogr><idno type="istex">1F992218258B52E9C4DE8BCE0722FA7C11BFC89E</idno><idno type="DOI">10.1029/JA091iA06p06807</idno><idno type="ArticleID">5A8245</idno></biblStruct></sourceDesc></fileDesc><profileDesc><creation><date>1986</date></creation><langUsage><language ident="en">en</language></langUsage><abstract><p>In an earlier paper we suggested that the multiple X line reconnection process may occur at the dayside magnetopause and lead to the occurrence of flux transfer events. 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The ratio l/δ is found to increase with an increasing system length Lz, an increasing imposed reconnection rate R0, and a decreasing resistivity η. Therefore the multiple X line reconnection process tends to occur when the system length is long, the reconnection rate is high, or the resistivity is small.</p></abstract><textClass><keywords scheme="Journal Subject"><list><head>index-terms</head><item><term>MAGNETOSPHERIC PHYSICS</term></item><item><term>Cusp</term></item><item><term>Magnetopause and boundary layers</term></item><item><term>Magnetotail</term></item><item><term>Solar wind/magnetosphere interactions</term></item><item><term>Magnetic reconnection</term></item><item><term>SOLAR PHYSICS, ASTROPHYSICS, AND ASTRONOMY</term></item><item><term>Magnetic reconnection</term></item><item><term>SPACE PLASMA PHYSICS</term></item><item><term>Magnetic reconnection</term></item></list></keywords></textClass></profileDesc><revisionDesc><change when="1985-09-30">Received</change><change when="1986-02-12">Registration</change><change when="1986-06-01">Published</change></revisionDesc></teiHeader></istex:fulltextTEI><json:item><original>false</original><mimetype>text/plain</mimetype><extension>txt</extension><uri>https://api.istex.fr/document/1F992218258B52E9C4DE8BCE0722FA7C11BFC89E/fulltext/txt</uri></json:item></fulltext><metadata><istex:metadataXml wicri:clean="Wiley, elements deleted: body"><istex:xmlDeclaration>version="1.0" encoding="UTF-8" standalone="yes"</istex:xmlDeclaration><istex:document><component type="serialArticle" version="2.0" xml:lang="en" xml:id="jgra8007"><header><publicationMeta level="product"><doi>10.1002/(ISSN)2156-2202a</doi><issn type="print">0148-0227</issn><issn type="electronic">2156-2202</issn><idGroup><id type="product" value="JGRA"></id><id type="coden" value="JGREA2"></id></idGroup><titleGroup><title type="main" xml:lang="en" sort="JOURNAL OF GEOPHYSICAL RESEARCH: SPACE PHYSICS">Journal of Geophysical Research: Space Physics</title><title type="short">J. 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C.</givenNames></author>, and <author><givenNames>Z. F.</givenNames> <familyName>Fu</familyName></author> (<pubYear year="1986">1986</pubYear>), <articleTitle>Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection</articleTitle>, <journalTitle>J. Geophys. Res.</journalTitle>, <vol>91</vol>(<issue>A6</issue>), <pageFirst>6807</pageFirst>–<pageLast>6815</pageLast>, doi:<accessionId ref="info:doi/10.1029/JA091iA06p06807">10.1029/JA091iA06p06807</accessionId>.</citation></selfCitationGroup><linkGroup><link type="toTypesetVersion" href="file:JGRA.JGRA8007.pdf"></link></linkGroup></publicationMeta><contentMeta><titleGroup><title type="main">Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection</title><title type="shortAuthors">Lee and Fu</title></titleGroup><creators><creator xml:id="jgra8007-cr-0001"><personName><givenNames>L. C.</givenNames><familyName>Lee</familyName></personName></creator><creator xml:id="jgra8007-cr-0002"><personName><givenNames>Z. F.</givenNames><familyName>Fu</familyName></personName></creator></creators><abstractGroup><abstract type="main"><p xml:id="jgra8007-para-0001">In an earlier paper we suggested that the multiple X line reconnection process may occur at the dayside magnetopause and lead to the occurrence of flux transfer events. In a series of papers we shall examine in detail various aspects of the multiple X line reconnection processes. In the present paper, the first of the series, we attempt to obtain a criterion for the transition from the classical single X line reconnection to the multiple X line reconnection based on a two‐dimensional simulation model. It is found that the development of tearing instability in the diffusion region of the reconnection configuration may lead to the formation of magnetic islands and hence to the occurrence of multiple X line reconnection. The criterion for the tearing instability is found to be <i>l</i>/δ > 7 coth (8/<i>S</i><sup>0.5</sup>), where <i>S</i> is the Lundquist number based on the width of the diffusion region, <i>l</i> is the half‐length, and δ the half‐width of the diffusion region. Furthermore, a formula is obtained for the dependence of the ratio <i>l</i>/δ on the system length <i>L<sub>z</sub></i>, the imposed reconnection rate <i>R</i><sub>0</sub>, and the resistivity η. The ratio <i>l</i>/δ is found to increase with an increasing system length <i>L<sub>z</sub></i>, an increasing imposed reconnection rate <i>R</i><sub>0</sub>, and a decreasing resistivity η. Therefore the multiple X line reconnection process tends to occur when the system length is long, the reconnection rate is high, or the resistivity is small.</p></abstract></abstractGroup></contentMeta></header></component></istex:document></istex:metadataXml><mods version="3.6"><titleInfo lang="en"><title>Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection</title></titleInfo><titleInfo type="alternative" contentType="CDATA" lang="en"><title>Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection</title></titleInfo><name type="personal"><namePart type="given">L. C.</namePart><namePart type="family">Lee</namePart></name><name type="personal"><namePart type="given">Z. F.</namePart><namePart type="family">Fu</namePart></name><typeOfResource>text</typeOfResource><genre type="article" displayLabel="article"></genre><originInfo><publisher>Blackwell Publishing Ltd</publisher><dateIssued encoding="w3cdtf">1986-06-01</dateIssued><dateCaptured encoding="w3cdtf">1985-09-30</dateCaptured><dateValid encoding="w3cdtf">1986-02-12</dateValid><edition>Lee, L. C., and Z. F. Fu (1986), Multiple X line reconnection: 1. A criterion for the transition from a single X line to a multiple X line reconnection, J. Geophys. Res., 91(A6), 6807–6815, doi:10.1029/JA091iA06p06807.</edition><copyrightDate encoding="w3cdtf">1986</copyrightDate></originInfo><language><languageTerm type="code" authority="rfc3066">en</languageTerm><languageTerm type="code" authority="iso639-2b">eng</languageTerm></language><physicalDescription><internetMediaType>text/html</internetMediaType></physicalDescription><abstract>In an earlier paper we suggested that the multiple X line reconnection process may occur at the dayside magnetopause and lead to the occurrence of flux transfer events. In a series of papers we shall examine in detail various aspects of the multiple X line reconnection processes. In the present paper, the first of the series, we attempt to obtain a criterion for the transition from the classical single X line reconnection to the multiple X line reconnection based on a two‐dimensional simulation model. It is found that the development of tearing instability in the diffusion region of the reconnection configuration may lead to the formation of magnetic islands and hence to the occurrence of multiple X line reconnection. The criterion for the tearing instability is found to be l/δ > 7 coth (8/S0.5), where S is the Lundquist number based on the width of the diffusion region, l is the half‐length, and δ the half‐width of the diffusion region. Furthermore, a formula is obtained for the dependence of the ratio l/δ on the system length Lz, the imposed reconnection rate R0, and the resistivity η. The ratio l/δ is found to increase with an increasing system length Lz, an increasing imposed reconnection rate R0, and a decreasing resistivity η. Therefore the multiple X line reconnection process tends to occur when the system length is long, the reconnection rate is high, or the resistivity is small.</abstract><relatedItem type="host"><titleInfo><title>Journal of Geophysical Research: Space Physics</title></titleInfo><titleInfo type="abbreviated"><title>J. Geophys. 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