Optimal tests in 1-parameter exponential families
Identifieur interne : 000626 ( Istex/Curation ); précédent : 000625; suivant : 000627Optimal tests in 1-parameter exponential families
Auteurs : W. Eberl Jr. ; W. SendlerSource :
- Archiv der Mathematik [ 0003-889X ] ; 1982-12-01.
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DOI: 10.1007/BF01304770
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W. Eberl Jr.<affiliation><mods:affiliation>Fachbereich Mathematik, Fernuniversität Hagen, Lützowstraße 125, D-5800, Hagen</mods:affiliation>
<wicri:noCountry code="subField">Hagen</wicri:noCountry>
</affiliation>
<affiliation><mods:affiliation>Fachbereich IV, Universität Trier, Schneidershof, D-5500, Trier</mods:affiliation>
<wicri:noCountry code="subField">Trier</wicri:noCountry>
</affiliation>
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