Optimal tests in 1-parameter exponential families
Identifieur interne : 000669 ( Istex/Corpus ); précédent : 000668; suivant : 000670Optimal tests in 1-parameter exponential families
Auteurs : W. Eberl Jr. ; W. SendlerSource :
- Archiv der Mathematik [ 0003-889X ] ; 1982-12-01.
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DOI: 10.1007/BF01304770
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