AustralieFrV1, PascalFrancis, Corpus, bibRecord, 001B45

Effect of grain refinement by severe plastic deformation on the next-neighbor misorientation distribution

Identifieur interne : 001B45 ( PascalFrancis/Corpus ); précédent : 001B44; suivant : 001B46

Effect of grain refinement by severe plastic deformation on the next-neighbor misorientation distribution

Auteurs : L. S. Toth ; B. Beausir ; C. F. Gu ; Y. Estrin ; N. Scheerbaum ; C. H. J. Davies

Source :

Acta materialia [ 1359-6454 ] ; 2010.

RBID : Pascal:11-0304776

Descripteurs français

Pascal (Inist)
- Affinement grain, Grosseur grain, Microstructure, Déformation plastique, Désorientation joint grain, Structure grain fin, Pressage, Diffraction électron.

English descriptors

KwdEn :
- Electron diffraction, Fine grain structure, Grain boundary misorientation, Grain refinement, Grain size, Microstructure, Plastic deformation, Pressing.

Abstract

Next-neighbor misorientation distributions (NNMD) in severely deformed polycrystalline materials are commonly measured by orientation imaging. A procedure is proposed which enables the separation of NNMD of ultrafine-grained materials into two parts: the distribution of misorientations between newly emerged grains within the original ("parent") grain interior ("internal daughter grains") and the distribution of misorientations between grains adjacent to an original grain boundary on its opposite sides ("grain boundary daughter grains"). The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation. It was applied to copper processed by up to three passes of equal-channel angular pressing. A characteristic feature of the measured NNMD is the occurrence of a double peak, which is clearly due to the differences between the NNMD of the two distinct populations of new grains defined above. The peak at low angles represents mainly the continual grain subdivision process in the interior of a parent grain (and is associated with internal daughter grains), while the peak at large angles is due to the high angle misorientations of the grain boundary daughter grains.

Notice en format standard (ISO 2709)

Pour connaître la documentation sur le format Inist Standard.

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A03		`1`		`@0 Acta mater.`
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A11	`01`	`1`		`@1 TOTH (L. S.)`
A11	`02`	`1`		`@1 BEAUSIR (B.)`
A11	`03`	`1`		`@1 GU (C. F.)`
A11	`04`	`1`		`@1 ESTRIN (Y.)`
A11	`05`	`1`		`@1 SCHEERBAUM (N.)`
A11	`06`	`1`		`@1 DAVIES (C. H. J.)`
A14	`01`			`@1 Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), Université Paul Verlaine - Metz/CNRS @2 57045 Metz @3 FRA @Z 1 aut.`
A14	`02`			`@1 Institut für Strukturphysik, Technische Universität Dresden @2 01062 Dresden @3 DEU @Z 2 aut. @Z 5 aut.`
A14	`03`			`@1 Department of Materials Engineering, Monash University @2 Clayton, VIC 3800 @3 AUS @Z 3 aut. @Z 4 aut. @Z 6 aut.`
A14	`04`			`@1 CSIRO Division of Process Science and Engineering @2 Clayton, VIC @3 AUS @Z 4 aut.`
A20				`@1 6706-6716`
A21				`@1 2010`
A23	`01`			`@0 ENG`
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A44				`@0 0000 @1 © 2011 INIST-CNRS. All rights reserved.`
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A64	`01`	`1`		`@0 Acta materialia`
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C01	`01`		`ENG`	@0 Next-neighbor misorientation distributions (NNMD) in severely deformed polycrystalline materials are commonly measured by orientation imaging. A procedure is proposed which enables the separation of NNMD of ultrafine-grained materials into two parts: the distribution of misorientations between newly emerged grains within the original ("parent") grain interior ("internal daughter grains") and the distribution of misorientations between grains adjacent to an original grain boundary on its opposite sides ("grain boundary daughter grains"). The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation. It was applied to copper processed by up to three passes of equal-channel angular pressing. A characteristic feature of the measured NNMD is the occurrence of a double peak, which is clearly due to the differences between the NNMD of the two distinct populations of new grains defined above. The peak at low angles represents mainly the continual grain subdivision process in the interior of a parent grain (and is associated with internal daughter grains), while the peak at large angles is due to the high angle misorientations of the grain boundary daughter grains.
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C03	`01`	`X`	`ENG`	`@0 Grain refinement @5 55`
C03	`01`	`X`	`GER`	`@0 Kornfeinen @5 55`
C03	`01`	`X`	`SPA`	`@0 Afino grano @5 55`
C03	`02`	`X`	`FRE`	`@0 Grosseur grain @5 56`
C03	`02`	`X`	`ENG`	`@0 Grain size @5 56`
C03	`02`	`X`	`GER`	`@0 Korngroesse @5 56`
C03	`02`	`X`	`SPA`	`@0 Grosor grano @5 56`
C03	`03`	`X`	`FRE`	`@0 Microstructure @5 57`
C03	`03`	`X`	`ENG`	`@0 Microstructure @5 57`
C03	`03`	`X`	`GER`	`@0 Mikrogefuege @5 57`
C03	`03`	`X`	`SPA`	`@0 Microestructura @5 57`
C03	`04`	`X`	`FRE`	`@0 Déformation plastique @5 58`
C03	`04`	`X`	`ENG`	`@0 Plastic deformation @5 58`
C03	`04`	`X`	`GER`	`@0 Plastische Verformung @5 58`
C03	`04`	`X`	`SPA`	`@0 Deformación plástica @5 58`
C03	`05`	`X`	`FRE`	`@0 Désorientation joint grain @5 59`
C03	`05`	`X`	`ENG`	`@0 Grain boundary misorientation @5 59`
C03	`05`	`X`	`GER`	`@0 Kornfehlorientierung @5 59`
C03	`05`	`X`	`SPA`	`@0 Desorientación plano de exfoliación @5 59`
C03	`06`	`X`	`FRE`	`@0 Structure grain fin @5 60`
C03	`06`	`X`	`ENG`	`@0 Fine grain structure @5 60`
C03	`06`	`X`	`GER`	`@0 Feinkorngefuege @5 60`
C03	`06`	`X`	`SPA`	`@0 Estructura grano fino @5 60`
C03	`07`	`X`	`FRE`	`@0 Pressage @5 61`
C03	`07`	`X`	`ENG`	`@0 Pressing @5 61`
C03	`07`	`X`	`SPA`	`@0 Prensado @5 61`
C03	`08`	`X`	`FRE`	`@0 Diffraction électron @5 62`
C03	`08`	`X`	`ENG`	`@0 Electron diffraction @5 62`
C03	`08`	`X`	`GER`	`@0 Elektronenbeugung @5 62`
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Format Inist (serveur)

NO :	PASCAL 11-0304776 INIST
ET :	Effect of grain refinement by severe plastic deformation on the next-neighbor misorientation distribution
AU :	TOTH (L. S.); BEAUSIR (B.); GU (C. F.); ESTRIN (Y.); SCHEERBAUM (N.); DAVIES (C. H. J.)
AF :	Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), Université Paul Verlaine - Metz/CNRS/57045 Metz/France (1 aut.); Institut für Strukturphysik, Technische Universität Dresden/01062 Dresden/Allemagne (2 aut., 5 aut.); Department of Materials Engineering, Monash University/Clayton, VIC 3800/Australie (3 aut., 4 aut., 6 aut.); CSIRO Division of Process Science and Engineering/Clayton, VIC/Australie (4 aut.)
DT :	Publication en série; Niveau analytique
SO :	Acta materialia; ISSN 1359-6454; Royaume-Uni; Da. 2010; Vol. 58; No. 20; Pp. 6706-6716; Bibl. 15 ref.
LA :	Anglais
EA :	Next-neighbor misorientation distributions (NNMD) in severely deformed polycrystalline materials are commonly measured by orientation imaging. A procedure is proposed which enables the separation of NNMD of ultrafine-grained materials into two parts: the distribution of misorientations between newly emerged grains within the original ("parent") grain interior ("internal daughter grains") and the distribution of misorientations between grains adjacent to an original grain boundary on its opposite sides ("grain boundary daughter grains"). The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation. It was applied to copper processed by up to three passes of equal-channel angular pressing. A characteristic feature of the measured NNMD is the occurrence of a double peak, which is clearly due to the differences between the NNMD of the two distinct populations of new grains defined above. The peak at low angles represents mainly the continual grain subdivision process in the interior of a parent grain (and is associated with internal daughter grains), while the peak at large angles is due to the high angle misorientations of the grain boundary daughter grains.
CC :	001D11A; 001D11G; 240
FD :	Affinement grain; Grosseur grain; Microstructure; Déformation plastique; Désorientation joint grain; Structure grain fin; Pressage; Diffraction électron
FG :	Propriété mécanique
ED :	Grain refinement; Grain size; Microstructure; Plastic deformation; Grain boundary misorientation; Fine grain structure; Pressing; Electron diffraction
EG :	Mechanical properties
GD :	Kornfeinen; Korngroesse; Mikrogefuege; Plastische Verformung; Kornfehlorientierung; Feinkorngefuege; Elektronenbeugung
SD :	Afino grano; Grosor grano; Microestructura; Deformación plástica; Desorientación plano de exfoliación; Estructura grano fino; Prensado; Difracción electrónica
LO :	INIST-7423.354000193343000160
ID :	11-0304776

Links to Exploration step

Pascal:11-0304776

Le document en format XML

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<front><div type="abstract" xml:lang="en">Next-neighbor misorientation distributions (NNMD) in severely deformed polycrystalline materials are commonly measured by orientation imaging. A procedure is proposed which enables the separation of NNMD of ultrafine-grained materials into two parts: the distribution of misorientations between newly emerged grains within the original ("parent") grain interior ("internal daughter grains") and the distribution of misorientations between grains adjacent to an original grain boundary on its opposite sides ("grain boundary daughter grains"). The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation. It was applied to copper processed by up to three passes of equal-channel angular pressing. A characteristic feature of the measured NNMD is the occurrence of a double peak, which is clearly due to the differences between the NNMD of the two distinct populations of new grains defined above. The peak at low angles represents mainly the continual grain subdivision process in the interior of a parent grain (and is associated with internal daughter grains), while the peak at large angles is due to the high angle misorientations of the grain boundary daughter grains.</div>
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<fC01 i1="01" l="ENG"><s0>Next-neighbor misorientation distributions (NNMD) in severely deformed polycrystalline materials are commonly measured by orientation imaging. A procedure is proposed which enables the separation of NNMD of ultrafine-grained materials into two parts: the distribution of misorientations between newly emerged grains within the original ("parent") grain interior ("internal daughter grains") and the distribution of misorientations between grains adjacent to an original grain boundary on its opposite sides ("grain boundary daughter grains"). The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation. It was applied to copper processed by up to three passes of equal-channel angular pressing. A characteristic feature of the measured NNMD is the occurrence of a double peak, which is clearly due to the differences between the NNMD of the two distinct populations of new grains defined above. The peak at low angles represents mainly the continual grain subdivision process in the interior of a parent grain (and is associated with internal daughter grains), while the peak at large angles is due to the high angle misorientations of the grain boundary daughter grains.</s0>
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<s5>56</s5>
</fC03>
<fC03 i1="02" i2="X" l="ENG"><s0>Grain size</s0>
<s5>56</s5>
</fC03>
<fC03 i1="02" i2="X" l="GER"><s0>Korngroesse</s0>
<s5>56</s5>
</fC03>
<fC03 i1="02" i2="X" l="SPA"><s0>Grosor grano</s0>
<s5>56</s5>
</fC03>
<fC03 i1="03" i2="X" l="FRE"><s0>Microstructure</s0>
<s5>57</s5>
</fC03>
<fC03 i1="03" i2="X" l="ENG"><s0>Microstructure</s0>
<s5>57</s5>
</fC03>
<fC03 i1="03" i2="X" l="GER"><s0>Mikrogefuege</s0>
<s5>57</s5>
</fC03>
<fC03 i1="03" i2="X" l="SPA"><s0>Microestructura</s0>
<s5>57</s5>
</fC03>
<fC03 i1="04" i2="X" l="FRE"><s0>Déformation plastique</s0>
<s5>58</s5>
</fC03>
<fC03 i1="04" i2="X" l="ENG"><s0>Plastic deformation</s0>
<s5>58</s5>
</fC03>
<fC03 i1="04" i2="X" l="GER"><s0>Plastische Verformung</s0>
<s5>58</s5>
</fC03>
<fC03 i1="04" i2="X" l="SPA"><s0>Deformación plástica</s0>
<s5>58</s5>
</fC03>
<fC03 i1="05" i2="X" l="FRE"><s0>Désorientation joint grain</s0>
<s5>59</s5>
</fC03>
<fC03 i1="05" i2="X" l="ENG"><s0>Grain boundary misorientation</s0>
<s5>59</s5>
</fC03>
<fC03 i1="05" i2="X" l="GER"><s0>Kornfehlorientierung</s0>
<s5>59</s5>
</fC03>
<fC03 i1="05" i2="X" l="SPA"><s0>Desorientación plano de exfoliación</s0>
<s5>59</s5>
</fC03>
<fC03 i1="06" i2="X" l="FRE"><s0>Structure grain fin</s0>
<s5>60</s5>
</fC03>
<fC03 i1="06" i2="X" l="ENG"><s0>Fine grain structure</s0>
<s5>60</s5>
</fC03>
<fC03 i1="06" i2="X" l="GER"><s0>Feinkorngefuege</s0>
<s5>60</s5>
</fC03>
<fC03 i1="06" i2="X" l="SPA"><s0>Estructura grano fino</s0>
<s5>60</s5>
</fC03>
<fC03 i1="07" i2="X" l="FRE"><s0>Pressage</s0>
<s5>61</s5>
</fC03>
<fC03 i1="07" i2="X" l="ENG"><s0>Pressing</s0>
<s5>61</s5>
</fC03>
<fC03 i1="07" i2="X" l="SPA"><s0>Prensado</s0>
<s5>61</s5>
</fC03>
<fC03 i1="08" i2="X" l="FRE"><s0>Diffraction électron</s0>
<s5>62</s5>
</fC03>
<fC03 i1="08" i2="X" l="ENG"><s0>Electron diffraction</s0>
<s5>62</s5>
</fC03>
<fC03 i1="08" i2="X" l="GER"><s0>Elektronenbeugung</s0>
<s5>62</s5>
</fC03>
<fC03 i1="08" i2="X" l="SPA"><s0>Difracción electrónica</s0>
<s5>62</s5>
</fC03>
<fC07 i1="01" i2="X" l="FRE"><s0>Propriété mécanique</s0>
<s5>74</s5>
</fC07>
<fC07 i1="01" i2="X" l="ENG"><s0>Mechanical properties</s0>
<s5>74</s5>
</fC07>
<fC07 i1="01" i2="X" l="SPA"><s0>Propiedad mecánica</s0>
<s5>74</s5>
</fC07>
<fN21><s1>206</s1>
</fN21>
<fN44 i1="01"><s1>OTO</s1>
</fN44>
<fN82><s1>OTO</s1>
</fN82>
</pA>
</standard>
<server><NO>PASCAL 11-0304776 INIST</NO>
<ET>Effect of grain refinement by severe plastic deformation on the next-neighbor misorientation distribution</ET>
<AU>TOTH (L. S.); BEAUSIR (B.); GU (C. F.); ESTRIN (Y.); SCHEERBAUM (N.); DAVIES (C. H. J.)</AU>
<AF>Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), Université Paul Verlaine - Metz/CNRS/57045 Metz/France (1 aut.); Institut für Strukturphysik, Technische Universität Dresden/01062 Dresden/Allemagne (2 aut., 5 aut.); Department of Materials Engineering, Monash University/Clayton, VIC 3800/Australie (3 aut., 4 aut., 6 aut.); CSIRO Division of Process Science and Engineering/Clayton, VIC/Australie (4 aut.)</AF>
<DT>Publication en série; Niveau analytique</DT>
<SO>Acta materialia; ISSN 1359-6454; Royaume-Uni; Da. 2010; Vol. 58; No. 20; Pp. 6706-6716; Bibl. 15 ref.</SO>
<LA>Anglais</LA>
<EA>Next-neighbor misorientation distributions (NNMD) in severely deformed polycrystalline materials are commonly measured by orientation imaging. A procedure is proposed which enables the separation of NNMD of ultrafine-grained materials into two parts: the distribution of misorientations between newly emerged grains within the original ("parent") grain interior ("internal daughter grains") and the distribution of misorientations between grains adjacent to an original grain boundary on its opposite sides ("grain boundary daughter grains"). The procedure is based on electron backscatter diffraction orientation map analyses carried out on different planes of deformed samples considering the evolution of the grain size and shape during severe plastic deformation. It was applied to copper processed by up to three passes of equal-channel angular pressing. A characteristic feature of the measured NNMD is the occurrence of a double peak, which is clearly due to the differences between the NNMD of the two distinct populations of new grains defined above. The peak at low angles represents mainly the continual grain subdivision process in the interior of a parent grain (and is associated with internal daughter grains), while the peak at large angles is due to the high angle misorientations of the grain boundary daughter grains.</EA>
<CC>001D11A; 001D11G; 240</CC>
<FD>Affinement grain; Grosseur grain; Microstructure; Déformation plastique; Désorientation joint grain; Structure grain fin; Pressage; Diffraction électron</FD>
<FG>Propriété mécanique</FG>
<ED>Grain refinement; Grain size; Microstructure; Plastic deformation; Grain boundary misorientation; Fine grain structure; Pressing; Electron diffraction</ED>
<EG>Mechanical properties</EG>
<GD>Kornfeinen; Korngroesse; Mikrogefuege; Plastische Verformung; Kornfehlorientierung; Feinkorngefuege; Elektronenbeugung</GD>
<SD>Afino grano; Grosor grano; Microestructura; Deformación plástica; Desorientación plano de exfoliación; Estructura grano fino; Prensado; Difracción electrónica</SD>
<LO>INIST-7423.354000193343000160</LO>
<ID>11-0304776</ID>
</server>
</inist>
</record>

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Effect of grain refinement by severe plastic deformation on the next-neighbor misorientation distribution

Effect of grain refinement by severe plastic deformation on the next-neighbor misorientation distribution

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