Recognition of line segments with unevenness used in OCR and fingerprints
Identifieur interne : 001F92 ( Main/Merge ); précédent : 001F91; suivant : 001F93Recognition of line segments with unevenness used in OCR and fingerprints
Auteurs : Nikolaos G. Bourbakis [États-Unis] ; David Goldman [États-Unis]Source :
- Engineering Applications of Artificial Intelligence [ 0952-1976 ] ; 1998.
Abstract
This paper deals with the recognition of digital line segments with unevenness, and their application to the recognition of handwritten characters and fingerprints. The recognition methodology for line segments with unevenness is based on a heuristic criterion, where the user hierarchically defines the levels of tolerance (or acceptance) whereby an unevenness is removed from a line segment (ignored) or not. The results of this line-recognition approach are used on a graph-based method for the recognition of handwritten characters, where the graph nodes are straight or curve line segments. In addition, the same approach is used on the recognition of line segments extracted from fingerprints to form the appropriate graphs, which represent a fingerprint.
Url:
DOI: 10.1016/S0952-1976(98)00063-3
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ISTEX:CFE20D46838F2981A68813E7741CD25F4038E9FFLe document en format XML
<record><TEI wicri:istexFullTextTei="biblStruct"><teiHeader><fileDesc><titleStmt><title>Recognition of line segments with unevenness used in OCR and fingerprints</title>
<author><name sortKey="Bourbakis, Nikolaos G" sort="Bourbakis, Nikolaos G" uniqKey="Bourbakis N" first="Nikolaos G" last="Bourbakis">Nikolaos G. Bourbakis</name>
</author>
<author><name sortKey="Goldman, David" sort="Goldman, David" uniqKey="Goldman D" first="David" last="Goldman">David Goldman</name>
</author>
</titleStmt>
<publicationStmt><idno type="wicri:source">ISTEX</idno>
<idno type="RBID">ISTEX:CFE20D46838F2981A68813E7741CD25F4038E9FF</idno>
<date when="1999" year="1999">1999</date>
<idno type="doi">10.1016/S0952-1976(98)00063-3</idno>
<idno type="url">https://api.istex.fr/document/CFE20D46838F2981A68813E7741CD25F4038E9FF/fulltext/pdf</idno>
<idno type="wicri:Area/Istex/Corpus">000627</idno>
<idno type="wicri:Area/Istex/Curation">000619</idno>
<idno type="wicri:Area/Istex/Checkpoint">001434</idno>
<idno type="wicri:doubleKey">0952-1976:1999:Bourbakis N:recognition:of:line</idno>
<idno type="wicri:Area/Main/Merge">001F92</idno>
</publicationStmt>
<sourceDesc><biblStruct><analytic><title level="a">Recognition of line segments with unevenness used in OCR and fingerprints</title>
<author><name sortKey="Bourbakis, Nikolaos G" sort="Bourbakis, Nikolaos G" uniqKey="Bourbakis N" first="Nikolaos G" last="Bourbakis">Nikolaos G. Bourbakis</name>
<affiliation wicri:level="1"><country xml:lang="fr">États-Unis</country>
<wicri:regionArea>Binghamton University, Center for Intelligent Systems, Binghamton, NY, 13902</wicri:regionArea>
<wicri:noRegion>13902</wicri:noRegion>
</affiliation>
</author>
<author><name sortKey="Goldman, David" sort="Goldman, David" uniqKey="Goldman D" first="David" last="Goldman">David Goldman</name>
<affiliation wicri:level="1"><country xml:lang="fr">États-Unis</country>
<wicri:regionArea>Binghamton University, Center for Intelligent Systems, Binghamton, NY, 13902</wicri:regionArea>
<wicri:noRegion>13902</wicri:noRegion>
</affiliation>
</author>
</analytic>
<monogr></monogr>
<series><title level="j">Engineering Applications of Artificial Intelligence</title>
<title level="j" type="abbrev">EAAI</title>
<idno type="ISSN">0952-1976</idno>
<imprint><publisher>ELSEVIER</publisher>
<date type="published" when="1998">1998</date>
<biblScope unit="volume">12</biblScope>
<biblScope unit="issue">3</biblScope>
<biblScope unit="page" from="273">273</biblScope>
<biblScope unit="page" to="279">279</biblScope>
</imprint>
<idno type="ISSN">0952-1976</idno>
</series>
<idno type="istex">CFE20D46838F2981A68813E7741CD25F4038E9FF</idno>
<idno type="DOI">10.1016/S0952-1976(98)00063-3</idno>
<idno type="PII">S0952-1976(98)00063-3</idno>
</biblStruct>
</sourceDesc>
<seriesStmt><idno type="ISSN">0952-1976</idno>
</seriesStmt>
</fileDesc>
<profileDesc><textClass></textClass>
<langUsage><language ident="en">en</language>
</langUsage>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">This paper deals with the recognition of digital line segments with unevenness, and their application to the recognition of handwritten characters and fingerprints. The recognition methodology for line segments with unevenness is based on a heuristic criterion, where the user hierarchically defines the levels of tolerance (or acceptance) whereby an unevenness is removed from a line segment (ignored) or not. The results of this line-recognition approach are used on a graph-based method for the recognition of handwritten characters, where the graph nodes are straight or curve line segments. In addition, the same approach is used on the recognition of line segments extracted from fingerprints to form the appropriate graphs, which represent a fingerprint.</div>
</front>
</TEI>
</record>
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