OCR Accuracy: UNLV's third annual test
Identifieur interne : 002E83 ( Main/Curation ); précédent : 002E82; suivant : 002E84OCR Accuracy: UNLV's third annual test
Auteurs : T. A. Nartker [États-Unis] ; S. V. RiceSource :
- Inform : (Silver Spring) [ 0892-3876 ] ; 1994.
Descripteurs français
- Pascal (Inist)
- Wicri :
- topic : Essai, Bilan, Produit industriel.
English descriptors
- KwdEn :
Abstract
Each year the Information Science Research Institute (ISRI) at the University of Nevada, Las Vegas (UNVL) conducts a test of the performance of OCR (Optical Character Recognition) systems: overview of the state-of-art of OCR from machine-printed documents
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Pascal:95-0486729Le document en format XML
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<author><name sortKey="Rice, S V" sort="Rice, S V" uniqKey="Rice S" first="S. V." last="Rice">S. V. Rice</name>
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<sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">OCR Accuracy: UNLV's third annual test</title>
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<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Accuracy</term>
<term>Balance</term>
<term>Character recognition</term>
<term>Conversion</term>
<term>Error rate</term>
<term>Manufactured product</term>
<term>Optical storage</term>
<term>Performance evaluation</term>
<term>System</term>
<term>Test</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>Reconnaissance caractère</term>
<term>Stockage optique</term>
<term>Conversion</term>
<term>Système</term>
<term>Précision</term>
<term>Evaluation performance</term>
<term>Essai</term>
<term>Bilan</term>
<term>Produit industriel</term>
<term>Taux erreur</term>
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<keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Essai</term>
<term>Bilan</term>
<term>Produit industriel</term>
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<front><div type="abstract" xml:lang="en">Each year the Information Science Research Institute (ISRI) at the University of Nevada, Las Vegas (UNVL) conducts a test of the performance of OCR (Optical Character Recognition) systems: overview of the state-of-art of OCR from machine-printed documents</div>
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