Thomas M. Pollak And NotParametric processes
List of bibliographic references
Number of relevant bibliographic references: 1.Ident. | Authors (with country if any) | Title |
---|---|---|
000387 | Kevin T. Zawilski [États-Unis] ; Scott D. Setzler [États-Unis] ; Peter G. Schunemann [États-Unis] ; Thomas M. Pollak [États-Unis] | Laser damage threshold of single crystal ZnGeP2 at 2.05 μm |
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