C. Y. Huang And NotElectrical resistivity
List of bibliographic references
Number of relevant bibliographic references: 2.Ident. | Authors (with country if any) | Title |
---|---|---|
000741 | J. G. Lin [République populaire de Chine] ; C. Y. Huang [République populaire de Chine] ; Y. Y. Xue [États-Unis] ; C. W. Chu [États-Unis] ; X. W. Cao [États-Unis] ; J. C. Ho [États-Unis] | Origin of the R-ion effect on Tc in RBa2Cu3O7 |
000B50 | C. Y. Huang [États-Unis] ; K. Sugawara [États-Unis] | EPR studies of the valence states of thulium in thulium monochalcogenides |
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