Magnetic properties of Tm-Zr multilayers
Identifieur interne : 001179 ( Pascal/Curation ); précédent : 001178; suivant : 001180Magnetic properties of Tm-Zr multilayers
Auteurs : A. Baudry [France] ; P. Boyer [France] ; M. Brunel [France]Source :
- Journal of magnetism and magnetic materials [ 0304-8853 ] ; 1998.
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- Pascal (Inist)
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Abstract
A 600 Å film of thulium and Tm-Zr multilayers in which the Tm layers are separated by 30 Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30 Å, X-ray diffraction gives evidence for a columnar growth along the c axis of the HCP structure. with in-plane compression of Tm layers thinner than 20 Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary. the c-axis modulated antiferromagnetic phase which takes place in the film at TN 54 K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers. which favours a structure close to the squared 3-4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30 K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy-Zr and Ho-Zr multilayers, the interface and volume anisotropies do not compensate each other for 8 Å Tm layers. The c-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.
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<front><div type="abstract" xml:lang="en">A 600 Å film of thulium and Tm-Zr multilayers in which the Tm layers are separated by 30 Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30 Å, X-ray diffraction gives evidence for a columnar growth along the c axis of the HCP structure. with in-plane compression of Tm layers thinner than 20 Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary. the c-axis modulated antiferromagnetic phase which takes place in the film at T<sub>N</sub>
54 K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers. which favours a structure close to the squared 3-4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30 K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy-Zr and Ho-Zr multilayers, the interface and volume anisotropies do not compensate each other for 8 Å Tm layers. The c-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.</div>
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