Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit
Identifieur interne : 000156 ( Pascal/Corpus ); précédent : 000155; suivant : 000157Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit
Auteurs : A. I. Figueroa ; J. Bartolome ; J. M. García Del Pozo ; A. Arauzo ; E. Guerrero ; P. Tellez ; F. Bartolome ; L. M. GariaSource :
- Journal of magnetism and magnetic materials [ 0304-8853 ] ; 2012.
Descripteurs français
- Pascal (Inist)
English descriptors
- KwdEn :
Abstract
A transverse susceptibility (TS) measurement system based on a simple inverter CMOS cell oscillator cross-coupled to a LC tank is presented. The system has been implemented to operate at a Quantum Design Physical Properties Measurement System (PPMS). We introduce several improvements with respect to similar currently operating TS measurement equipments. The electronics have been redesigned to use CMOS transistors as active devices, which simplifies the circuit design and enlarge the tuning range, thus making the proposed electronic block more feasible, predictable, and precise. Additionally, we propose a newly designed sample holder, which facilitates the procedure to change a sample and improves reproducibility of the circuit. Our design minimizes the thermal leak of the measuring probe by one order of magnitude, allowing to measure from 1.8 K in standard PPMS systems, thanks to the use of a low temperature beryllium-copper coaxial cable instead of the conventional RG402 Cu coaxial cable employed in the insert for the PPMS in similar systems. The data acquisition method is also simplified, so that the measuring sequences are implemented directly in the PPMS controller computer by programming them in the Quantum Design MultiVu software that controls the PPMS. We present the test measurements performed on the system without sample to study the background signal and stability of the circuit. Measurements on a Gd2O3 calibrating sample yield to the estimation of the system sensitivity, which is found to be on the order of 10-6 emu. Finally, measurements on a TmCo2 Laves phase sample with a ferrimagnetic transition temperature around 4 K are described, demonstrating that the developed system is well suited to explore interesting magnetic phenomena at this temperature scale.
Notice en format standard (ISO 2709)
Pour connaître la documentation sur le format Inist Standard.
| pA |
|
|---|
Format Inist (serveur)
| NO : | PASCAL 12-0219396 INIST |
|---|---|
| ET : | Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit |
| AU : | FIGUEROA (A. I.); BARTOLOME (J.); DEL POZO (J. M. García); ARAUZO (A.); GUERRERO (E.); TELLEZ (P.); BARTOLOME (F.); GARIA (L. M.) |
| AF : | Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada/50009 Zaragoza/Espagne (1 aut., 2 aut., 7 aut., 8 aut.); Servicio de Instrumentación Electrónica, Universidad de Zaragoza/50009 Zaragoza/Espagne (3 aut., 6 aut.); Servicio de Medidas Fisicas, Universidad de Zaragoza/50009 Zaragoza/Espagne (4 aut., 5 aut.) |
| DT : | Publication en série; Niveau analytique |
| SO : | Journal of magnetism and magnetic materials; ISSN 0304-8853; Coden JMMMDC; Pays-Bas; Da. 2012; Vol. 324; No. 17; Pp. 2669-2675; Bibl. 27 ref. |
| LA : | Anglais |
| EA : | A transverse susceptibility (TS) measurement system based on a simple inverter CMOS cell oscillator cross-coupled to a LC tank is presented. The system has been implemented to operate at a Quantum Design Physical Properties Measurement System (PPMS). We introduce several improvements with respect to similar currently operating TS measurement equipments. The electronics have been redesigned to use CMOS transistors as active devices, which simplifies the circuit design and enlarge the tuning range, thus making the proposed electronic block more feasible, predictable, and precise. Additionally, we propose a newly designed sample holder, which facilitates the procedure to change a sample and improves reproducibility of the circuit. Our design minimizes the thermal leak of the measuring probe by one order of magnitude, allowing to measure from 1.8 K in standard PPMS systems, thanks to the use of a low temperature beryllium-copper coaxial cable instead of the conventional RG402 Cu coaxial cable employed in the insert for the PPMS in similar systems. The data acquisition method is also simplified, so that the measuring sequences are implemented directly in the PPMS controller computer by programming them in the Quantum Design MultiVu software that controls the PPMS. We present the test measurements performed on the system without sample to study the background signal and stability of the circuit. Measurements on a Gd2O3 calibrating sample yield to the estimation of the system sensitivity, which is found to be on the order of 10-6 emu. Finally, measurements on a TmCo2 Laves phase sample with a ferrimagnetic transition temperature around 4 K are described, demonstrating that the developed system is well suited to explore interesting magnetic phenomena at this temperature scale. |
| CC : | 001B00G57P |
| FD : | Radiofréquence; Technologie MOS complémentaire; Méthode mesure; Susceptibilité magnétique; Conception; Oscillateur hyperfréquence; Etalonnage; Thulium alliage; Cobalt alliage; Matériau ferrimagnétique; Lanthanide alliage; Métal transition alliage |
| ED : | Radiofrequency; Complementary MOS technology; Measuring methods; Magnetic susceptibility; Design; Microwave oscillators; Calibration; Thulium alloys; Cobalt alloys; Ferrimagnetic materials; Rare earth alloys; Transition element alloys |
| SD : | Radiofrecuencia; Tecnología MOS complementario |
| LO : | INIST-17230.354000507710060140 |
| ID : | 12-0219396 |
Links to Exploration step
Pascal:12-0219396Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit</title><author><name sortKey="Figueroa, A I" sort="Figueroa, A I" uniqKey="Figueroa A" first="A. I." last="Figueroa">A. I. Figueroa</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Bartolome, J" sort="Bartolome, J" uniqKey="Bartolome J" first="J." last="Bartolome">J. Bartolome</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Del Pozo, J M Garcia" sort="Del Pozo, J M Garcia" uniqKey="Del Pozo J" first="J. M. García" last="Del Pozo">J. M. García Del Pozo</name><affiliation><inist:fA14 i1="02"><s1>Servicio de Instrumentación Electrónica, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>3 aut.</sZ><sZ>6 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Arauzo, A" sort="Arauzo, A" uniqKey="Arauzo A" first="A." last="Arauzo">A. Arauzo</name><affiliation><inist:fA14 i1="03"><s1>Servicio de Medidas Fisicas, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Guerrero, E" sort="Guerrero, E" uniqKey="Guerrero E" first="E." last="Guerrero">E. Guerrero</name><affiliation><inist:fA14 i1="03"><s1>Servicio de Medidas Fisicas, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Tellez, P" sort="Tellez, P" uniqKey="Tellez P" first="P." last="Tellez">P. Tellez</name><affiliation><inist:fA14 i1="02"><s1>Servicio de Instrumentación Electrónica, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>3 aut.</sZ><sZ>6 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Bartolome, F" sort="Bartolome, F" uniqKey="Bartolome F" first="F." last="Bartolome">F. Bartolome</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Garia, L M" sort="Garia, L M" uniqKey="Garia L" first="L. M." last="Garia">L. M. Garia</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">INIST</idno><idno type="inist">12-0219396</idno><date when="2012">2012</date><idno type="stanalyst">PASCAL 12-0219396 INIST</idno><idno type="RBID">Pascal:12-0219396</idno><idno type="wicri:Area/Pascal/Corpus">000156</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit</title><author><name sortKey="Figueroa, A I" sort="Figueroa, A I" uniqKey="Figueroa A" first="A. I." last="Figueroa">A. I. Figueroa</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Bartolome, J" sort="Bartolome, J" uniqKey="Bartolome J" first="J." last="Bartolome">J. Bartolome</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Del Pozo, J M Garcia" sort="Del Pozo, J M Garcia" uniqKey="Del Pozo J" first="J. M. García" last="Del Pozo">J. M. García Del Pozo</name><affiliation><inist:fA14 i1="02"><s1>Servicio de Instrumentación Electrónica, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>3 aut.</sZ><sZ>6 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Arauzo, A" sort="Arauzo, A" uniqKey="Arauzo A" first="A." last="Arauzo">A. Arauzo</name><affiliation><inist:fA14 i1="03"><s1>Servicio de Medidas Fisicas, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Guerrero, E" sort="Guerrero, E" uniqKey="Guerrero E" first="E." last="Guerrero">E. Guerrero</name><affiliation><inist:fA14 i1="03"><s1>Servicio de Medidas Fisicas, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Tellez, P" sort="Tellez, P" uniqKey="Tellez P" first="P." last="Tellez">P. Tellez</name><affiliation><inist:fA14 i1="02"><s1>Servicio de Instrumentación Electrónica, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>3 aut.</sZ><sZ>6 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Bartolome, F" sort="Bartolome, F" uniqKey="Bartolome F" first="F." last="Bartolome">F. Bartolome</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author><author><name sortKey="Garia, L M" sort="Garia, L M" uniqKey="Garia L" first="L. M." last="Garia">L. M. Garia</name><affiliation><inist:fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14></affiliation></author></analytic><series><title level="j" type="main">Journal of magnetism and magnetic materials</title><title level="j" type="abbreviated">J. magn. magn. mater.</title><idno type="ISSN">0304-8853</idno><imprint><date when="2012">2012</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Journal of magnetism and magnetic materials</title><title level="j" type="abbreviated">J. magn. magn. mater.</title><idno type="ISSN">0304-8853</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Calibration</term><term>Cobalt alloys</term><term>Complementary MOS technology</term><term>Design</term><term>Ferrimagnetic materials</term><term>Magnetic susceptibility</term><term>Measuring methods</term><term>Microwave oscillators</term><term>Radiofrequency</term><term>Rare earth alloys</term><term>Thulium alloys</term><term>Transition element alloys</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Radiofréquence</term><term>Technologie MOS complémentaire</term><term>Méthode mesure</term><term>Susceptibilité magnétique</term><term>Conception</term><term>Oscillateur hyperfréquence</term><term>Etalonnage</term><term>Thulium alliage</term><term>Cobalt alliage</term><term>Matériau ferrimagnétique</term><term>Lanthanide alliage</term><term>Métal transition alliage</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">A transverse susceptibility (TS) measurement system based on a simple inverter CMOS cell oscillator cross-coupled to a LC tank is presented. The system has been implemented to operate at a Quantum Design Physical Properties Measurement System (PPMS). We introduce several improvements with respect to similar currently operating TS measurement equipments. The electronics have been redesigned to use CMOS transistors as active devices, which simplifies the circuit design and enlarge the tuning range, thus making the proposed electronic block more feasible, predictable, and precise. Additionally, we propose a newly designed sample holder, which facilitates the procedure to change a sample and improves reproducibility of the circuit. Our design minimizes the thermal leak of the measuring probe by one order of magnitude, allowing to measure from 1.8 K in standard PPMS systems, thanks to the use of a low temperature beryllium-copper coaxial cable instead of the conventional RG402 Cu coaxial cable employed in the insert for the PPMS in similar systems. The data acquisition method is also simplified, so that the measuring sequences are implemented directly in the PPMS controller computer by programming them in the Quantum Design MultiVu software that controls the PPMS. We present the test measurements performed on the system without sample to study the background signal and stability of the circuit. Measurements on a Gd<sub>2</sub>O<sub>3</sub> calibrating sample yield to the estimation of the system sensitivity, which is found to be on the order of 10<sup>-6</sup> emu. Finally, measurements on a TmCo<sub>2</sub> Laves phase sample with a ferrimagnetic transition temperature around 4 K are described, demonstrating that the developed system is well suited to explore interesting magnetic phenomena at this temperature scale.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0304-8853</s0></fA01><fA02 i1="01"><s0>JMMMDC</s0></fA02><fA03 i2="1"><s0>J. magn. magn. mater.</s0></fA03><fA05><s2>324</s2></fA05><fA06><s2>17</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit</s1></fA08><fA11 i1="01" i2="1"><s1>FIGUEROA (A. I.)</s1></fA11><fA11 i1="02" i2="1"><s1>BARTOLOME (J.)</s1></fA11><fA11 i1="03" i2="1"><s1>DEL POZO (J. M. García)</s1></fA11><fA11 i1="04" i2="1"><s1>ARAUZO (A.)</s1></fA11><fA11 i1="05" i2="1"><s1>GUERRERO (E.)</s1></fA11><fA11 i1="06" i2="1"><s1>TELLEZ (P.)</s1></fA11><fA11 i1="07" i2="1"><s1>BARTOLOME (F.)</s1></fA11><fA11 i1="08" i2="1"><s1>GARIA (L. M.)</s1></fA11><fA14 i1="01"><s1>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></fA14><fA14 i1="02"><s1>Servicio de Instrumentación Electrónica, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>3 aut.</sZ><sZ>6 aut.</sZ></fA14><fA14 i1="03"><s1>Servicio de Medidas Fisicas, Universidad de Zaragoza</s1><s2>50009 Zaragoza</s2><s3>ESP</s3><sZ>4 aut.</sZ><sZ>5 aut.</sZ></fA14><fA20><s1>2669-2675</s1></fA20><fA21><s1>2012</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>17230</s2><s5>354000507710060140</s5></fA43><fA44><s0>0000</s0><s1>© 2012 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>27 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>12-0219396</s0></fA47><fA60><s1>P</s1></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Journal of magnetism and magnetic materials</s0></fA64><fA66 i1="01"><s0>NLD</s0></fA66><fC01 i1="01" l="ENG"><s0>A transverse susceptibility (TS) measurement system based on a simple inverter CMOS cell oscillator cross-coupled to a LC tank is presented. The system has been implemented to operate at a Quantum Design Physical Properties Measurement System (PPMS). We introduce several improvements with respect to similar currently operating TS measurement equipments. The electronics have been redesigned to use CMOS transistors as active devices, which simplifies the circuit design and enlarge the tuning range, thus making the proposed electronic block more feasible, predictable, and precise. Additionally, we propose a newly designed sample holder, which facilitates the procedure to change a sample and improves reproducibility of the circuit. Our design minimizes the thermal leak of the measuring probe by one order of magnitude, allowing to measure from 1.8 K in standard PPMS systems, thanks to the use of a low temperature beryllium-copper coaxial cable instead of the conventional RG402 Cu coaxial cable employed in the insert for the PPMS in similar systems. The data acquisition method is also simplified, so that the measuring sequences are implemented directly in the PPMS controller computer by programming them in the Quantum Design MultiVu software that controls the PPMS. We present the test measurements performed on the system without sample to study the background signal and stability of the circuit. Measurements on a Gd<sub>2</sub>O<sub>3</sub> calibrating sample yield to the estimation of the system sensitivity, which is found to be on the order of 10<sup>-6</sup> emu. Finally, measurements on a TmCo<sub>2</sub> Laves phase sample with a ferrimagnetic transition temperature around 4 K are described, demonstrating that the developed system is well suited to explore interesting magnetic phenomena at this temperature scale.</s0></fC01><fC02 i1="01" i2="3"><s0>001B00G57P</s0></fC02><fC03 i1="01" i2="X" l="FRE"><s0>Radiofréquence</s0><s5>02</s5></fC03><fC03 i1="01" i2="X" l="ENG"><s0>Radiofrequency</s0><s5>02</s5></fC03><fC03 i1="01" i2="X" l="SPA"><s0>Radiofrecuencia</s0><s5>02</s5></fC03><fC03 i1="02" i2="X" l="FRE"><s0>Technologie MOS complémentaire</s0><s5>03</s5></fC03><fC03 i1="02" i2="X" l="ENG"><s0>Complementary MOS technology</s0><s5>03</s5></fC03><fC03 i1="02" i2="X" l="SPA"><s0>Tecnología MOS complementario</s0><s5>03</s5></fC03><fC03 i1="03" i2="3" l="FRE"><s0>Méthode mesure</s0><s5>04</s5></fC03><fC03 i1="03" i2="3" l="ENG"><s0>Measuring methods</s0><s5>04</s5></fC03><fC03 i1="04" i2="3" l="FRE"><s0>Susceptibilité magnétique</s0><s5>05</s5></fC03><fC03 i1="04" i2="3" l="ENG"><s0>Magnetic susceptibility</s0><s5>05</s5></fC03><fC03 i1="05" i2="3" l="FRE"><s0>Conception</s0><s5>11</s5></fC03><fC03 i1="05" i2="3" l="ENG"><s0>Design</s0><s5>11</s5></fC03><fC03 i1="06" i2="3" l="FRE"><s0>Oscillateur hyperfréquence</s0><s5>12</s5></fC03><fC03 i1="06" i2="3" l="ENG"><s0>Microwave oscillators</s0><s5>12</s5></fC03><fC03 i1="07" i2="3" l="FRE"><s0>Etalonnage</s0><s5>13</s5></fC03><fC03 i1="07" i2="3" l="ENG"><s0>Calibration</s0><s5>13</s5></fC03><fC03 i1="08" i2="3" l="FRE"><s0>Thulium alliage</s0><s5>15</s5></fC03><fC03 i1="08" i2="3" l="ENG"><s0>Thulium alloys</s0><s5>15</s5></fC03><fC03 i1="09" i2="3" l="FRE"><s0>Cobalt alliage</s0><s5>16</s5></fC03><fC03 i1="09" i2="3" l="ENG"><s0>Cobalt alloys</s0><s5>16</s5></fC03><fC03 i1="10" i2="3" l="FRE"><s0>Matériau ferrimagnétique</s0><s5>18</s5></fC03><fC03 i1="10" i2="3" l="ENG"><s0>Ferrimagnetic materials</s0><s5>18</s5></fC03><fC03 i1="11" i2="3" l="FRE"><s0>Lanthanide alliage</s0><s5>48</s5></fC03><fC03 i1="11" i2="3" l="ENG"><s0>Rare earth alloys</s0><s5>48</s5></fC03><fC03 i1="12" i2="3" l="FRE"><s0>Métal transition alliage</s0><s5>49</s5></fC03><fC03 i1="12" i2="3" l="ENG"><s0>Transition element alloys</s0><s5>49</s5></fC03><fN21><s1>170</s1></fN21></pA></standard><server><NO>PASCAL 12-0219396 INIST</NO><ET>Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit</ET><AU>FIGUEROA (A. I.); BARTOLOME (J.); DEL POZO (J. M. García); ARAUZO (A.); GUERRERO (E.); TELLEZ (P.); BARTOLOME (F.); GARIA (L. M.)</AU><AF>Instituto de Ciencia de Materiales de Aragón, CSIC-Universidad de Zaragoza, Departamento de Física de la Materia Condensada/50009 Zaragoza/Espagne (1 aut., 2 aut., 7 aut., 8 aut.); Servicio de Instrumentación Electrónica, Universidad de Zaragoza/50009 Zaragoza/Espagne (3 aut., 6 aut.); Servicio de Medidas Fisicas, Universidad de Zaragoza/50009 Zaragoza/Espagne (4 aut., 5 aut.)</AF><DT>Publication en série; Niveau analytique</DT><SO>Journal of magnetism and magnetic materials; ISSN 0304-8853; Coden JMMMDC; Pays-Bas; Da. 2012; Vol. 324; No. 17; Pp. 2669-2675; Bibl. 27 ref.</SO><LA>Anglais</LA><EA>A transverse susceptibility (TS) measurement system based on a simple inverter CMOS cell oscillator cross-coupled to a LC tank is presented. The system has been implemented to operate at a Quantum Design Physical Properties Measurement System (PPMS). We introduce several improvements with respect to similar currently operating TS measurement equipments. The electronics have been redesigned to use CMOS transistors as active devices, which simplifies the circuit design and enlarge the tuning range, thus making the proposed electronic block more feasible, predictable, and precise. Additionally, we propose a newly designed sample holder, which facilitates the procedure to change a sample and improves reproducibility of the circuit. Our design minimizes the thermal leak of the measuring probe by one order of magnitude, allowing to measure from 1.8 K in standard PPMS systems, thanks to the use of a low temperature beryllium-copper coaxial cable instead of the conventional RG402 Cu coaxial cable employed in the insert for the PPMS in similar systems. The data acquisition method is also simplified, so that the measuring sequences are implemented directly in the PPMS controller computer by programming them in the Quantum Design MultiVu software that controls the PPMS. We present the test measurements performed on the system without sample to study the background signal and stability of the circuit. Measurements on a Gd<sub>2</sub>O<sub>3</sub> calibrating sample yield to the estimation of the system sensitivity, which is found to be on the order of 10<sup>-6</sup> emu. Finally, measurements on a TmCo<sub>2</sub> Laves phase sample with a ferrimagnetic transition temperature around 4 K are described, demonstrating that the developed system is well suited to explore interesting magnetic phenomena at this temperature scale.</EA><CC>001B00G57P</CC><FD>Radiofréquence; Technologie MOS complémentaire; Méthode mesure; Susceptibilité magnétique; Conception; Oscillateur hyperfréquence; Etalonnage; Thulium alliage; Cobalt alliage; Matériau ferrimagnétique; Lanthanide alliage; Métal transition alliage</FD><ED>Radiofrequency; Complementary MOS technology; Measuring methods; Magnetic susceptibility; Design; Microwave oscillators; Calibration; Thulium alloys; Cobalt alloys; Ferrimagnetic materials; Rare earth alloys; Transition element alloys</ED><SD>Radiofrecuencia; Tecnología MOS complementario</SD><LO>INIST-17230.354000507710060140</LO><ID>12-0219396</ID></server></inist></record>Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=$WICRI_ROOT/Wicri/Terre/explor/ThuliumV1/Data/Pascal/Corpus
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000156 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Pascal/Corpus/biblio.hfd -nk 000156 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= Wicri/Terre
|area= ThuliumV1
|flux= Pascal
|étape= Corpus
|type= RBID
|clé= Pascal:12-0219396
|texte= Low temperature radio-frequency transverse susceptibility measurements using a CMOS oscillator circuit
}}
| This area was generated with Dilib version V0.6.21. |  |