Concentration effect of Tm3+ on cathodoluminescence properties of SiO2:Tm3+ and SiO2:Ho3+,Tm3+ systems
Identifieur interne : 000166 ( Pascal/Checkpoint ); précédent : 000165; suivant : 000167Concentration effect of Tm3+ on cathodoluminescence properties of SiO2:Tm3+ and SiO2:Ho3+,Tm3+ systems
Auteurs : M. S. Dhlamini [Afrique du Sud] ; G. H. Mhlongo [Afrique du Sud] ; H. C. Swart [Afrique du Sud] ; O. M. Ntwaeaborwa [Afrique du Sud] ; K. T. Hillie [Afrique du Sud]Source :
- Physica. B, Condensed matter [ 0921-4526 ] ; 2012.
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Abstract
Cathodoluminescence (CL) properties of SiO2 powders activated with thulium (Tm3+) and holmium (Ho3+) ions prepared by a sol-gel process were investigated. Different molar concentrations of Tm3+ co-doped with Ho3+ were studied. The 460 nm peak was monitored and the influence of the beam energy and concentration of Tm3+ ions on the emission properties of this peak was also monitored. The peculiar behavior whereby the 460 nm emission peak decreases and the increase in the 705 and 865 nm peaks with the increase in the concentration of Tm3+ ions is reported. The relationship between the accelerating beam voltage and the CL intensity of the blue emission peak (460 nm peak) is established. Morphology, particle size and optical properties were characterized with Scanning electron microscopy (SEM), UV/VIS Lambda 750 S spectrometer and Auger electron spectroscopy (AES) equipped with Ocean Optics S2000, respectively.
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<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">Concentration effect of Tm<sup>3+</sup> on cathodoluminescence properties of SiO<sub>2</sub>:Tm<sup>3+</sup> and SiO<sub>2</sub>:Ho<sup>3+</sup>,Tm<sup>3+</sup> systems</title><author><name sortKey="Dhlamini, M S" sort="Dhlamini, M S" uniqKey="Dhlamini M" first="M. S." last="Dhlamini">M. S. Dhlamini</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Physics, University of South Africa, P.O.Box 392, Unisa</s1><s2>Pretoria ZA0003</s2><s3>ZAF</s3><sZ>1 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Pretoria ZA0003</wicri:noRegion></affiliation></author><author><name sortKey="Mhlongo, G H" sort="Mhlongo, G H" uniqKey="Mhlongo G" first="G. H." last="Mhlongo">G. H. Mhlongo</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>National Centre for Nano-Structured Materials, Council for Scientific and Industrial Research</s1><s2>Pretoria 0001</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Pretoria 0001</wicri:noRegion></affiliation><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author><author><name sortKey="Swart, H C" sort="Swart, H C" uniqKey="Swart H" first="H. C." last="Swart">H. C. Swart</name><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author><author><name sortKey="Ntwaeaborwa, O M" sort="Ntwaeaborwa, O M" uniqKey="Ntwaeaborwa O" first="O. M." last="Ntwaeaborwa">O. M. Ntwaeaborwa</name><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author><author><name sortKey="Hillie, K T" sort="Hillie, K T" uniqKey="Hillie K" first="K. T." last="Hillie">K. T. Hillie</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>National Centre for Nano-Structured Materials, Council for Scientific and Industrial Research</s1><s2>Pretoria 0001</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Pretoria 0001</wicri:noRegion></affiliation><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author></titleStmt><publicationStmt><idno type="wicri:source">INIST</idno><idno type="inist">12-0262761</idno><date when="2012">2012</date><idno type="stanalyst">PASCAL 12-0262761 INIST</idno><idno type="RBID">Pascal:12-0262761</idno><idno type="wicri:Area/Pascal/Corpus">000150</idno><idno type="wicri:Area/Pascal/Curation">000150</idno><idno type="wicri:Area/Pascal/Checkpoint">000166</idno><idno type="wicri:explorRef" wicri:stream="Pascal" wicri:step="Checkpoint">000166</idno></publicationStmt><sourceDesc><biblStruct><analytic><title xml:lang="en" level="a">Concentration effect of Tm<sup>3+</sup> on cathodoluminescence properties of SiO<sub>2</sub>:Tm<sup>3+</sup> and SiO<sub>2</sub>:Ho<sup>3+</sup>,Tm<sup>3+</sup> systems</title><author><name sortKey="Dhlamini, M S" sort="Dhlamini, M S" uniqKey="Dhlamini M" first="M. S." last="Dhlamini">M. S. Dhlamini</name><affiliation wicri:level="1"><inist:fA14 i1="01"><s1>Department of Physics, University of South Africa, P.O.Box 392, Unisa</s1><s2>Pretoria ZA0003</s2><s3>ZAF</s3><sZ>1 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Pretoria ZA0003</wicri:noRegion></affiliation></author><author><name sortKey="Mhlongo, G H" sort="Mhlongo, G H" uniqKey="Mhlongo G" first="G. H." last="Mhlongo">G. H. Mhlongo</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>National Centre for Nano-Structured Materials, Council for Scientific and Industrial Research</s1><s2>Pretoria 0001</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Pretoria 0001</wicri:noRegion></affiliation><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author><author><name sortKey="Swart, H C" sort="Swart, H C" uniqKey="Swart H" first="H. C." last="Swart">H. C. Swart</name><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author><author><name sortKey="Ntwaeaborwa, O M" sort="Ntwaeaborwa, O M" uniqKey="Ntwaeaborwa O" first="O. M." last="Ntwaeaborwa">O. M. Ntwaeaborwa</name><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author><author><name sortKey="Hillie, K T" sort="Hillie, K T" uniqKey="Hillie K" first="K. T." last="Hillie">K. T. Hillie</name><affiliation wicri:level="1"><inist:fA14 i1="02"><s1>National Centre for Nano-Structured Materials, Council for Scientific and Industrial Research</s1><s2>Pretoria 0001</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Pretoria 0001</wicri:noRegion></affiliation><affiliation wicri:level="1"><inist:fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></inist:fA14><country>Afrique du Sud</country><wicri:noRegion>Bloemfontein ZA9300</wicri:noRegion></affiliation></author></analytic><series><title level="j" type="main">Physica. B, Condensed matter</title><title level="j" type="abbreviated">Physica, B Condens. matter</title><idno type="ISSN">0921-4526</idno><imprint><date when="2012">2012</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Physica. B, Condensed matter</title><title level="j" type="abbreviated">Physica, B Condens. matter</title><idno type="ISSN">0921-4526</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>AES</term><term>Cathodoluminescence</term><term>Codoping</term><term>Energy-level transitions</term><term>Holmium additions</term><term>Line intensity</term><term>Microstructure</term><term>Nonradiative transitions</term><term>Particle size</term><term>Scanning electron microscopy</term><term>Silicon oxides</term><term>Sol-gel process</term><term>Thulium additions</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Codopage</term><term>Cathodoluminescence</term><term>Procédé sol gel</term><term>Addition holmium</term><term>Addition thulium</term><term>Microstructure</term><term>Dimension particule</term><term>Transition niveau énergie</term><term>Microscopie électronique balayage</term><term>Transition non radiative</term><term>Intensité raie</term><term>Spectrométrie Auger</term><term>Oxyde de silicium</term><term>SiO2</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Cathodoluminescence (CL) properties of SiO<sub>2</sub> powders activated with thulium (Tm<sup>3+</sup>) and holmium (Ho<sup>3+</sup>) ions prepared by a sol-gel process were investigated. Different molar concentrations of Tm<sup>3+</sup> co-doped with Ho<sup>3+</sup> were studied. The 460 nm peak was monitored and the influence of the beam energy and concentration of Tm<sup>3+</sup> ions on the emission properties of this peak was also monitored. The peculiar behavior whereby the 460 nm emission peak decreases and the increase in the 705 and 865 nm peaks with the increase in the concentration of Tm<sup>3+</sup> ions is reported. The relationship between the accelerating beam voltage and the CL intensity of the blue emission peak (460 nm peak) is established. Morphology, particle size and optical properties were characterized with Scanning electron microscopy (SEM), UV/VIS Lambda 750 S spectrometer and Auger electron spectroscopy (AES) equipped with Ocean Optics S2000, respectively.</div></front></TEI><inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0921-4526</s0></fA01><fA03 i2="1"><s0>Physica, B Condens. matter</s0></fA03><fA05><s2>407</s2></fA05><fA06><s2>10</s2></fA06><fA08 i1="01" i2="1" l="ENG"><s1>Concentration effect of Tm<sup>3+</sup> on cathodoluminescence properties of SiO<sub>2</sub>:Tm<sup>3+</sup> and SiO<sub>2</sub>:Ho<sup>3+</sup>,Tm<sup>3+</sup> systems</s1></fA08><fA09 i1="01" i2="1" l="ENG"><s1>SACPM 2011: Proceedings of the 4th South African Conference on Photonic Materials, held in Kariega Game Reserve, South Africa, 2-6 May 2011</s1></fA09><fA11 i1="01" i2="1"><s1>DHLAMINI (M. S.)</s1></fA11><fA11 i1="02" i2="1"><s1>MHLONGO (G. H.)</s1></fA11><fA11 i1="03" i2="1"><s1>SWART (H. C.)</s1></fA11><fA11 i1="04" i2="1"><s1>NTWAEABORWA (O. M.)</s1></fA11><fA11 i1="05" i2="1"><s1>HILLIE (K. T.)</s1></fA11><fA12 i1="01" i2="1"><s1>VENTER (Andrè)</s1><s9>ed.</s9></fA12><fA12 i1="02" i2="1"><s1>AURET (Danie)</s1><s9>ed.</s9></fA12><fA12 i1="03" i2="1"><s1>SWART (Hendrik C.)</s1><s9>ed.</s9></fA12><fA14 i1="01"><s1>Department of Physics, University of South Africa, P.O.Box 392, Unisa</s1><s2>Pretoria ZA0003</s2><s3>ZAF</s3><sZ>1 aut.</sZ></fA14><fA14 i1="02"><s1>National Centre for Nano-Structured Materials, Council for Scientific and Industrial Research</s1><s2>Pretoria 0001</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>5 aut.</sZ></fA14><fA14 i1="03"><s1>Department of Physics, University of the Free State, P.O.Box 339</s1><s2>Bloemfontein ZA9300</s2><s3>ZAF</s3><sZ>2 aut.</sZ><sZ>3 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ></fA14><fA15 i1="01"><s1>Nelson Mandela Metropolitan University</s1><s2>Port Elizabeth</s2><s3>ZAF</s3><sZ>1 aut.</sZ></fA15><fA15 i1="02"><s1>University of Pretoria</s1><s2>Pretoria</s2><s3>ZAF</s3><sZ>2 aut.</sZ></fA15><fA15 i1="03"><s1>University of the Free State</s1><s2>Bloemfontein</s2><s3>ZAF</s3><sZ>3 aut.</sZ></fA15><fA18 i1="01" i2="1"><s1>Nelson Mandela Metropolitan University (NMMU). Physics Department</s1><s2>Port Elizabeth</s2><s3>ZAF</s3><s9>org-cong.</s9></fA18><fA18 i1="02" i2="1"><s1>University of the Free State (UFS). Physics Department</s1><s2>Bloemfontein</s2><s3>ZAF</s3><s9>org-cong.</s9></fA18><fA18 i1="03" i2="1"><s1>University of Pretoria. Physics Department</s1><s2>Pretoria</s2><s3>ZAF</s3><s9>org-cong.</s9></fA18><fA18 i1="04" i2="1"><s1>South African Institute of Physics (SAIP). Condensed Matter Physics and Materials Specialist (CMPMS) Group</s1><s3>ZAF</s3><s9>org-cong.</s9></fA18><fA20><s1>1582-1585</s1></fA20><fA21><s1>2012</s1></fA21><fA23 i1="01"><s0>ENG</s0></fA23><fA43 i1="01"><s1>INIST</s1><s2>145B</s2><s5>354000509663090310</s5></fA43><fA44><s0>0000</s0><s1>© 2012 INIST-CNRS. All rights reserved.</s1></fA44><fA45><s0>14 ref.</s0></fA45><fA47 i1="01" i2="1"><s0>12-0262761</s0></fA47><fA60><s1>P</s1><s2>C</s2></fA60><fA61><s0>A</s0></fA61><fA64 i1="01" i2="1"><s0>Physica. B, Condensed matter</s0></fA64><fA66 i1="01"><s0>GBR</s0></fA66><fC01 i1="01" l="ENG"><s0>Cathodoluminescence (CL) properties of SiO<sub>2</sub> powders activated with thulium (Tm<sup>3+</sup>) and holmium (Ho<sup>3+</sup>) ions prepared by a sol-gel process were investigated. Different molar concentrations of Tm<sup>3+</sup> co-doped with Ho<sup>3+</sup> were studied. The 460 nm peak was monitored and the influence of the beam energy and concentration of Tm<sup>3+</sup> ions on the emission properties of this peak was also monitored. The peculiar behavior whereby the 460 nm emission peak decreases and the increase in the 705 and 865 nm peaks with the increase in the concentration of Tm<sup>3+</sup> ions is reported. The relationship between the accelerating beam voltage and the CL intensity of the blue emission peak (460 nm peak) is established. Morphology, particle size and optical properties were characterized with Scanning electron microscopy (SEM), UV/VIS Lambda 750 S spectrometer and Auger electron spectroscopy (AES) equipped with Ocean Optics S2000, respectively.</s0></fC01><fC02 i1="01" i2="3"><s0>001B70H60H</s0></fC02><fC03 i1="01" i2="X" l="FRE"><s0>Codopage</s0><s5>02</s5></fC03><fC03 i1="01" i2="X" l="ENG"><s0>Codoping</s0><s5>02</s5></fC03><fC03 i1="01" i2="X" l="SPA"><s0>Codrogado</s0><s5>02</s5></fC03><fC03 i1="02" i2="3" l="FRE"><s0>Cathodoluminescence</s0><s5>03</s5></fC03><fC03 i1="02" i2="3" l="ENG"><s0>Cathodoluminescence</s0><s5>03</s5></fC03><fC03 i1="03" i2="3" l="FRE"><s0>Procédé sol gel</s0><s5>04</s5></fC03><fC03 i1="03" i2="3" l="ENG"><s0>Sol-gel process</s0><s5>04</s5></fC03><fC03 i1="04" i2="3" l="FRE"><s0>Addition holmium</s0><s5>05</s5></fC03><fC03 i1="04" i2="3" l="ENG"><s0>Holmium additions</s0><s5>05</s5></fC03><fC03 i1="05" i2="3" l="FRE"><s0>Addition thulium</s0><s5>06</s5></fC03><fC03 i1="05" i2="3" l="ENG"><s0>Thulium additions</s0><s5>06</s5></fC03><fC03 i1="06" i2="3" l="FRE"><s0>Microstructure</s0><s5>07</s5></fC03><fC03 i1="06" i2="3" l="ENG"><s0>Microstructure</s0><s5>07</s5></fC03><fC03 i1="07" i2="3" l="FRE"><s0>Dimension particule</s0><s5>08</s5></fC03><fC03 i1="07" i2="3" l="ENG"><s0>Particle size</s0><s5>08</s5></fC03><fC03 i1="08" i2="3" l="FRE"><s0>Transition niveau énergie</s0><s5>09</s5></fC03><fC03 i1="08" i2="3" l="ENG"><s0>Energy-level transitions</s0><s5>09</s5></fC03><fC03 i1="09" i2="3" l="FRE"><s0>Microscopie électronique balayage</s0><s5>10</s5></fC03><fC03 i1="09" i2="3" l="ENG"><s0>Scanning electron microscopy</s0><s5>10</s5></fC03><fC03 i1="10" i2="3" l="FRE"><s0>Transition non radiative</s0><s5>11</s5></fC03><fC03 i1="10" i2="3" l="ENG"><s0>Nonradiative transitions</s0><s5>11</s5></fC03><fC03 i1="11" i2="3" l="FRE"><s0>Intensité raie</s0><s5>12</s5></fC03><fC03 i1="11" i2="3" l="ENG"><s0>Line intensity</s0><s5>12</s5></fC03><fC03 i1="12" i2="3" l="FRE"><s0>Spectrométrie Auger</s0><s5>14</s5></fC03><fC03 i1="12" i2="3" l="ENG"><s0>AES</s0><s5>14</s5></fC03><fC03 i1="13" i2="3" l="FRE"><s0>Oxyde de silicium</s0><s2>NK</s2><s5>15</s5></fC03><fC03 i1="13" i2="3" l="ENG"><s0>Silicon oxides</s0><s2>NK</s2><s5>15</s5></fC03><fC03 i1="14" i2="3" l="FRE"><s0>SiO2</s0><s4>INC</s4><s5>52</s5></fC03><fN21><s1>198</s1></fN21></pA><pR><fA30 i1="01" i2="1" l="ENG"><s1>SACPM 2011 South African Conference on Photonic Materials</s1><s2>4</s2><s3>Kariega Game Reserve ZAF</s3><s4>2011-05-02</s4></fA30></pR></standard></inist><affiliations><list><country><li>Afrique du Sud</li></country></list><tree><country name="Afrique du Sud"><noRegion><name sortKey="Dhlamini, M S" sort="Dhlamini, M S" uniqKey="Dhlamini M" first="M. S." last="Dhlamini">M. S. Dhlamini</name></noRegion><name sortKey="Hillie, K T" sort="Hillie, K T" uniqKey="Hillie K" first="K. T." last="Hillie">K. T. Hillie</name><name sortKey="Hillie, K T" sort="Hillie, K T" uniqKey="Hillie K" first="K. T." last="Hillie">K. T. Hillie</name><name sortKey="Mhlongo, G H" sort="Mhlongo, G H" uniqKey="Mhlongo G" first="G. H." last="Mhlongo">G. H. Mhlongo</name><name sortKey="Mhlongo, G H" sort="Mhlongo, G H" uniqKey="Mhlongo G" first="G. H." last="Mhlongo">G. H. Mhlongo</name><name sortKey="Ntwaeaborwa, O M" sort="Ntwaeaborwa, O M" uniqKey="Ntwaeaborwa O" first="O. M." last="Ntwaeaborwa">O. M. Ntwaeaborwa</name><name sortKey="Swart, H C" sort="Swart, H C" uniqKey="Swart H" first="H. C." last="Swart">H. C. Swart</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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