ThuliumV1, Main, Exploration, bibRecord, 002B08

Experimental and theoretical comparison between absorption, total electron yield and fluorescence spectra of the thulium M5 edge

Identifieur interne : 002B08 ( Main/Exploration ); précédent : 002B07; suivant : 002B09

Experimental and theoretical comparison between absorption, total electron yield and fluorescence spectra of the thulium M5 edge

Auteurs : M. Pompa [France] ; A. M. Flank [France] ; P. Lagarde [France] ; J. Rife [États-Unis] ; I. Stekhin [Russie] ; M. Nakazawa [Japon] ; H. Ogasawara [Russie] ; A. Kotani [Japon]

Source :

Journal de physique. IV [ 1155-4339 ] ; 1997.

RBID : Pascal:97-0426195

Descripteurs français

Pascal (Inist)
- Etude expérimentale, Etude théorique, Spectre absorption, Fluorescence, Spectre RX, Couche mince, Rendement fluorescence, Thulium, 7870D, 7870E, Tm.

English descriptors

KwdEn :
- Absorption spectra, Experimental study, Fluorescence, Fluorescence yield, Theoretical study, Thin films, Thulium, X-ray spectra.

Abstract

Beside the now well known self-absorption effect, several phenomena related to the multiplet structure of the intermediate state the occur which will render the X-ray fluorescence different from the true absorption result on 3d transition metals at the L edge and on the M4,5 edges of rare earths. Special selection rules of the radiative de-excitation process may play an important role there. We have measured the absorption coefficient of a thin film of thulium deposited onto an aluminum foil, at room temperature, through the simultaneous detection of the transmission, 160 eV bandwidth fluorescence yield and total electron yield. While transmission and electron yield results are very similar, as expected for a very thin sample, the fluorescence yield spectrum is definitely different. Theoretically, the resonant X-ray fluorescence spectrum was calculated using an atomic model, and then integrated over the emitted energy, to predict the fluorescence yield spectrum. A very good agreement is obtained between the theory and experiment.

Affiliations:

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Le document en format XML

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<term>Thin films</term>
<term>Thulium</term>
<term>X-ray spectra</term>
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<keywords scheme="Pascal" xml:lang="fr"><term>Etude expérimentale</term>
<term>Etude théorique</term>
<term>Spectre absorption</term>
<term>Fluorescence</term>
<term>Spectre RX</term>
<term>Couche mince</term>
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<term>7870D</term>
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<front><div type="abstract" xml:lang="en">Beside the now well known self-absorption effect, several phenomena related to the multiplet structure of the intermediate state the occur which will render the X-ray fluorescence different from the true absorption result on 3d transition metals at the L edge and on the M4,5 edges of rare earths. Special selection rules of the radiative de-excitation process may play an important role there. We have measured the absorption coefficient of a thin film of thulium deposited onto an aluminum foil, at room temperature, through the simultaneous detection of the transmission, 160 eV bandwidth fluorescence yield and total electron yield. While transmission and electron yield results are very similar, as expected for a very thin sample, the fluorescence yield spectrum is definitely different. Theoretically, the resonant X-ray fluorescence spectrum was calculated using an atomic model, and then integrated over the emitted energy, to predict the fluorescence yield spectrum. A very good agreement is obtained between the theory and experiment.</div>
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Experimental and theoretical comparison between absorption, total electron yield and fluorescence spectra of the thulium M5 edge

Experimental and theoretical comparison between absorption, total electron yield and fluorescence spectra of the thulium M5 edge

Source :

Descripteurs français

English descriptors

Abstract

Links toward previous steps (curation, corpus...)

Le document en format XML

Pour manipuler ce document sous Unix (Dilib)

Pour mettre un lien sur cette page dans le réseau Wicri