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Effect of annealing ZnO on the performance of inverted polymer light-emitting diodes based on SAM/ZnO as an electron injection layer

Identifieur interne : 000B67 ( Main/Curation ); précédent : 000B66; suivant : 000B68

Effect of annealing ZnO on the performance of inverted polymer light-emitting diodes based on SAM/ZnO as an electron injection layer

Auteurs : Chen-Yan Li [Taïwan] ; Ying-Nien Chou [Taïwan] ; Jia-Rong Syu [Taïwan] ; Sung-Nien Hsieh [Taïwan] ; Tzung-Da Tsai [Taïwan] ; Chen-Hao Wu [Taïwan] ; Tzung-Fang Guo [Taïwan] ; Wei-Chou Hsu [Taïwan] ; Yao-Jane Hsu [Taïwan] ; Ten-Chin Wen [Taïwan]

Source :

RBID : Pascal:11-0360187

Descripteurs français

English descriptors

Abstract

An efficient electron injection/hole blocking layer, N-[3-(trimethoxysily)propyl]ethylenediamine that was grafted onto zinc oxide (ZnO/PEDA-TMS), was used in inverted polymer light-emitting diodes (PLEDs). PEDA-TMS induced a strong dipole directed towards ZnO, which was enhanced by vacuum energy level shifts of ultra-violet photoelectron spectroscopic observations, reducing the barrier height between ZnO and the emissive layer. The effect of annealing ZnO on the performance of PLEDs was analyzed using an electron-only device and capacitance-voltage (C-V) characterization. Following annealing at 300 °C, ZnO provided effective electron injection and blocked holes, which enhanced the recombination of the electrons and holes. The eletroluminescence efficiency of an inverted PLED with a ZnO/PEDA-TMS layer is comparable to that of a conventional device. The electron injection mechanism of the inverted device can be explained by C-V behaviors, which are correlated with the threshold voltage and turn-on voltage.

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Pascal:11-0360187

Le document en format XML

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<term>Annealing</term>
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<term>Electron blocking layer</term>
<term>Electron injection</term>
<term>Electron injection layer</term>
<term>Elliptical configuration</term>
<term>Energy level</term>
<term>Hole blocking layer</term>
<term>Light emitting diode</term>
<term>Performance evaluation</term>
<term>Polymer</term>
<term>Self-assembled layer</term>
<term>Thulium sulfides</term>
<term>Voltage capacity curve</term>
<term>Voltage threshold</term>
<term>Zinc oxide</term>
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<keywords scheme="Pascal" xml:lang="fr">
<term>Recuit</term>
<term>Evaluation performance</term>
<term>Diode électroluminescente</term>
<term>Configuration elliptique</term>
<term>Dipôle</term>
<term>Niveau énergie</term>
<term>Hauteur barrière</term>
<term>Caractéristique capacité tension</term>
<term>Injection électron</term>
<term>Seuil tension</term>
<term>Couche autoassemblée</term>
<term>Oxyde de zinc</term>
<term>Polymère</term>
<term>Sulfure de thulium</term>
<term>ZnO</term>
<term>TmS</term>
<term>Couche d'injection d'électrons</term>
<term>Couche de blocage d'électrons</term>
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<div type="abstract" xml:lang="en">An efficient electron injection/hole blocking layer, N-[3-(trimethoxysily)propyl]ethylenediamine that was grafted onto zinc oxide (ZnO/PEDA-TMS), was used in inverted polymer light-emitting diodes (PLEDs). PEDA-TMS induced a strong dipole directed towards ZnO, which was enhanced by vacuum energy level shifts of ultra-violet photoelectron spectroscopic observations, reducing the barrier height between ZnO and the emissive layer. The effect of annealing ZnO on the performance of PLEDs was analyzed using an electron-only device and capacitance-voltage (C-V) characterization. Following annealing at 300 °C, ZnO provided effective electron injection and blocked holes, which enhanced the recombination of the electrons and holes. The eletroluminescence efficiency of an inverted PLED with a ZnO/PEDA-TMS layer is comparable to that of a conventional device. The electron injection mechanism of the inverted device can be explained by C-V behaviors, which are correlated with the threshold voltage and turn-on voltage.</div>
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