Detection limit < Detection limits < Detection methods

Facettes :

List of bibliographic references

Number of relevant bibliographic references: 71.
[20-40] [0 - 20][0 - 50][40-60]

Ident.	Authors (with country if any)	Title
000E40 (1999)	Ben Fairman ; Michael W. Hinds ; Simon M. Nelms ; Denise M. Penny ; Phill Goodall	Industrial analysis: metals, chemicals and advanced materials
000E53 (2010)	S. Dubascoux [France] ; I. Le Hcho [France] ; M. Hassellv [Suède] ; F. Von Der Kammer [Autriche] ; M. Potin Gautier [France] ; G. Lespes [France]	Field-flow fractionation and inductively coupled plasma mass spectrometer coupling: History, development and applications
000F12 (1973)	J. F. Chapman ; L. S. Dale ; R. N. Whittem	An improved plasma jet system for spectrochemical analysis
001015 (1995)	J. L. M. De Boer [Pays-Bas] ; W. Verweij [Pays-Bas] ; T. Van Der Velde-Koerts [Pays-Bas] ; W. Mennes [Pays-Bas]	Levels of rare earth elements in Dutch drinking water and its sources. Determination by inductively coupled plasma mass spectrometry and toxicological implications. A pilot study
001166 (1994)	John Marshall ; John Carroll ; James S. Crighton ; Charles L. R. Barnard	Atomic Spectrometry Update—Industrial Analysis: Metals, Chemicals and Advanced Materials
001189 (1989)	John Marshall ; John Carroll ; Simon T. Sparkes	Atomic Spectrometry Update—Industrial Analysis: Metals, Chemicals and Advanced Materials
001408 (1992)	M. A. Marabini [Italie] ; B. Passariello [Italie] ; M. Barbaro [Italie]	Inductively coupled plasma-mass spectrometry: Capabilities and applications
001513 (2001)	Peter Stchur [États-Unis] ; Karl X. Yang [États-Unis] ; Xiandeng Hou [États-Unis] ; Tao Sun [États-Unis] ; Robert G. Michel [États-Unis]	Laser excited atomic fluorescence spectrometry — a review
001565 (1994)	V. I. Smolniakov [Russie]	EDXRF of complex objects: Some problems and solutions
001583 (1975)	Albrecht Baumann ; Ulrich Förstner ; Rudolf Rohde	Lake Shala: Water chemistry, mineralogy and geochemistry of sediments in an Ethiopian Rift lake
001759 (1983)	M. A. Eid [Égypte] ; K. M. El Behery [Égypte] ; A. A. Fakhry [Égypte] ; F. A. El Anany [Égypte]	Spectrographic determination of rare earth elements using a wallstabilized plasma arc
001861 (1998)	Ben Fairman ; Michael W. Hinds ; Simon M. Nelms ; Denise M. Pennyde	Atomic Spectrometry Update-Industrial analysis: metals, chemicals and advanced materials
001914 (1990)	F. Jancik ; W. Czysz ; W. R. H. S ; W. Schmidt ; M. Katyal ; W. Asche ; B. R. Glutz ; E. Svatek ; J. S. Dunnett ; A. Niemann ; K. Söllner ; A. Böhler	Abstracts
001983 (1971)	L. S. Bark ; P. R. Wood	Photoluminescence and chemiluminescence in inorganic analysis
001A34 (1995)	Shu-Xiu Zhang [Japon] ; Shinichiro Murachi [Japon] ; Totaro Imasaka [Japon] ; Midori Watanabe [Japon]	Determination of rare earth impurities in ultrapure europium oxide by inductively-coupled plasma mass spectrometry
001B73 (1998)	Andrew T. Ellis ; Michael Holmes ; Peter Kregsamer ; Philip J. Potts ; Christina Streli ; Margaret West ; Peter Wobrauschek	Atomic Spectrometry Update—X-ray Fluorescence Spectrometry
001C49 (1980)	R. J. Decker	Some analytical characteristics of a three electrode d.c. argon plasma source for optical emission spectrometry
001C84 (1966)	J. R. Rhodes	Radioisotope X-ray spectrometry. A review
001F04 (1988)	L. C. Chandola [Inde] ; P. P. Khanna [Inde]	X-Ray fluorescence analysis of thulium oxide for rare earth impurities
001F05 (1970)	H. Higuchi [Japon] ; K. Tomura [Japon] ; H. Hamaguchi [Japon]	Determination of rare-earth eleemnts in rock samples by neutron activation analysis
001F83 (1997)	Cathleen E. Mcginnis [États-Unis] ; Jinesh C. Jain [États-Unis] ; Clive R. Neal [États-Unis]	Characterisation of Memory Effects and Development of an Effective Wash Protocol for the Measurement of Petrogenetically Critical Trace Elements in Geological Samples by ICP‐MS

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