ThuliumV1, Istex, Corpus, bibRecord, 003419

Magnetic properties of Tm–Zr multilayers

Identifieur interne : 003419 ( Istex/Corpus ); précédent : 003418; suivant : 003420

Magnetic properties of Tm–Zr multilayers

Auteurs : A. Baudry ; P. Boyer ; M. Brunel

Source :

Journal of Magnetism and Magnetic Materials [ 0304-8853 ] ; 1998.

RBID : ISTEX:ED039954EEDA7D88002F68629F607E671018296C

English descriptors

KwdEn :
- Anisotropy, Antiferromagnetic phase, Antiphase, Antiphase ferrimagnetic structure, Atomic planes, Basal, Basal plane, Basal plane lattice parameter, Baudry, Bragg, Bragg pattern, Bragg patterns, Bulk holmium, Bulk thulium, Bulk value, Charge ratio, Coherence length, Columnar growth, Compensation thickness, Conduction electrons, Crude model, Deposition process, Electron microscopy, Elsevier science, Energy levels, Epitaxial, Epitaxial conditions, Epitaxial growth, Epitaxial strains, Exchange interaction, Experimental data, Ferromagnetic, Ferromagnetic order, Grenoble cedex, Growth direction, Hexagonal lattices, Hexagonal symmetry, Hysteresis, Hysteresis loops, Inplane coherence length, Interface, Interface anisotropy, Interface contributions, Large uncertainty, Lateral, Lateral compression, Lateral size, Lateral strain, Lattice, Lattice mismatch, Lattice parameter, Layer, Layer thickness, Magn, Magnetic anisotropy, Magnetic isotherm, Magnetic materials, Magnetic moment, Magnetic moments, Magnetic phase diagram, Magnetic properties, Magnetic structure, Magnetization, Magnetization curve, Magnetization curves, Magnetization isotherms, Magnetization process, Magnetoelastic energy, Metamagnetic behaviour, Multilayer, Multilayers, Neel point, Other hand, Outer planes, Periodic strain, Periodic structure, Perpendicular, Perpendicular anisotropy, Phys, Several multilayers, Sharp interfaces, Squared antiphase structure, Temperature dependence, Thulium, Thulium layer, Thulium layers, Unmiscible elements, Usual expression, Volume anisotropies, Volume anisotropy.
Teeft :
- Anisotropy, Antiferromagnetic phase, Antiphase, Antiphase ferrimagnetic structure, Atomic planes, Basal, Basal plane, Basal plane lattice parameter, Baudry, Bragg, Bragg pattern, Bragg patterns, Bulk holmium, Bulk thulium, Bulk value, Charge ratio, Coherence length, Columnar growth, Compensation thickness, Conduction electrons, Crude model, Deposition process, Electron microscopy, Elsevier science, Energy levels, Epitaxial, Epitaxial conditions, Epitaxial growth, Epitaxial strains, Exchange interaction, Experimental data, Ferromagnetic, Ferromagnetic order, Grenoble cedex, Growth direction, Hexagonal lattices, Hexagonal symmetry, Hysteresis, Hysteresis loops, Inplane coherence length, Interface, Interface anisotropy, Interface contributions, Large uncertainty, Lateral, Lateral compression, Lateral size, Lateral strain, Lattice, Lattice mismatch, Lattice parameter, Layer, Layer thickness, Magn, Magnetic anisotropy, Magnetic isotherm, Magnetic materials, Magnetic moment, Magnetic moments, Magnetic phase diagram, Magnetic properties, Magnetic structure, Magnetization, Magnetization curve, Magnetization curves, Magnetization isotherms, Magnetization process, Magnetoelastic energy, Metamagnetic behaviour, Multilayer, Multilayers, Neel point, Other hand, Outer planes, Periodic strain, Periodic structure, Perpendicular, Perpendicular anisotropy, Phys, Several multilayers, Sharp interfaces, Squared antiphase structure, Temperature dependence, Thulium, Thulium layer, Thulium layers, Unmiscible elements, Usual expression, Volume anisotropies, Volume anisotropy.

Abstract

Abstract: A 600Å film of thulium and Tm–Zr multilayers in which the Tm layers are separated by 30Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30Å. X-ray diffraction gives evidence for a columnar growth along the c axis of the HCP structure, with in-plane compression of Tm layers thinner than 20Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary, the c-axis modulated antiferromagnetic phase which takes place in the film at TN≈54K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers, which favours a structure close to the squared 3–4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy–Zr and Ho–Zr multilayers, the interface and volume anisotropies do not compensate each other for 8Å Tm layers. The c-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.

Url:

https://api.istex.fr/document/ED039954EEDA7D88002F68629F607E671018296C/fulltext/pdf

DOI: 10.1016/S0304-8853(98)00026-2

Links to Exploration step

ISTEX:ED039954EEDA7D88002F68629F607E671018296C

Le document en format XML

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<front><div type="abstract" xml:lang="en">Abstract: A 600Å film of thulium and Tm–Zr multilayers in which the Tm layers are separated by 30Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30Å. X-ray diffraction gives evidence for a columnar growth along the c axis of the HCP structure, with in-plane compression of Tm layers thinner than 20Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary, the c-axis modulated antiferromagnetic phase which takes place in the film at TN≈54K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers, which favours a structure close to the squared 3–4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy–Zr and Ho–Zr multilayers, the interface and volume anisotropies do not compensate each other for 8Å Tm layers. The c-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.</div>
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<notesStmt><note type="content">Fig. 1: X-ray Bragg patterns obtained from a θ–2θ scan around the (0002) reflections of Tm and Zr in two Tm–Zr multilayers (radiation wavelength=λCu).</note>
<note type="content">Fig. 2: Typical rocking curve recorded for a Tm–Zr multilayer. The θ scan was performed with 2θ fixed at the position of a line of the (0002) Bragg reflection pattern.</note>
<note type="content">Fig. 3: Typical in-plane diffraction pattern recorded under grazing incidence in a Tm–Zr multilayer. No lines are detected in the intermediate range 35°⩽2θ⩽50°. Bragg reflections from (hk0) atomic planes only can be observed.</note>
<note type="content">Fig. 4: Variation of the basal plane lattice parameter a of Tm against the thickness of the thulium layer in Tm–Zr multilayers. The values of a are deduced from the acurate determination of the position of the [100] Bragg reflection measured under grazing incidence. The horizontal dotted line indicates the value for bulk Tm.</note>
<note type="content">Fig. 5: Zero-field cooled field-cooled magnetization curves measured in the 600Å thick Tm film and the Tm(30Å)/Zr(30Å) multilayer. The applied magnetic field (500Oe) is perpendicular to the plane of the layers.</note>
<note type="content">Fig. 6: Magnetization curves measured at 8K in the Tm film (top) and several Tm–Zr multilayers: [Tm(30Å)/Zr(30Å)]20, [Tm(15Å)/Zr(30Å)]20 and [Tm(8Å)/Zr(30Å)]20 (bottom). The applied magnetic field is perpendicular to the film.</note>
<note type="content">Fig. 7: Perpendicular susceptibility in the Tm film and in two multilayers: [Tm(30Å)/Zr(30Å)]20 and [Tm(15Å)/Zr(30Å)]20.</note>
<note type="content">Fig. 8: Hysteresis loops measured at 8K in the Tm film (600Å) and several Tm/Zr multilayers.</note>
<note type="content">Fig. 9: Plot of the magnetic anisotropy measured in Tm–Zr(30Å) (○) and Ho–Zr(30Å) (▵) multilayers, against the thickness of the rare-earth layers. The interrupted lines are the results of crystal-field calculations performed for the Tm–Zr multilayers within the point-charge approximation. The charges affected to the Tm and Zr ions are indicated in the figure. The full line is the result of similar calculations for Ho–Zr multilayers, with Q(Ho)=0.3 and Q(Zr)=0.4 in proton charge unit.</note>
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<sourceDesc><biblStruct type="inbook"><analytic><title level="a">Magnetic properties of Tm–Zr multilayers</title>
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<surname>Baudry</surname>
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<affiliation>Département de Recherche Fondamentale sur la Matière Condensée, CEA Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France</affiliation>
<affiliation>1 Affiliated to the CNRS.</affiliation>
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<surname>Boyer</surname>
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<affiliation>Département de Recherche Fondamentale sur la Matière Condensée, CEA Grenoble, 17 rue des Martyrs, 38054 Grenoble Cedex 9, France</affiliation>
<affiliation>Corresponding author.</affiliation>
<affiliation>2 Affiliated to Université Joseph Fourier, Grenoble.</affiliation>
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<author xml:id="author-0002"><persName><forename type="first">M</forename>
<surname>Brunel</surname>
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<affiliation>Laboratoire de Cristallographie, CNRS, BP 166, 38042 Grenoble Cedex 9, France</affiliation>
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<title level="j" type="abbrev">MAGMA</title>
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<abstract xml:lang="en"><p>A 600Å film of thulium and Tm–Zr multilayers in which the Tm layers are separated by 30Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30Å. X-ray diffraction gives evidence for a columnar growth along the c axis of the HCP structure, with in-plane compression of Tm layers thinner than 20Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary, the c-axis modulated antiferromagnetic phase which takes place in the film at TN≈54K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers, which favours a structure close to the squared 3–4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy–Zr and Ho–Zr multilayers, the interface and volume anisotropies do not compensate each other for 8Å Tm layers. The c-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.</p>
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<textClass><keywords scheme="keyword"><list><head>Keywords</head>
<item><term>Magnetic multilayers</term>
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<item><term>Rare earths</term>
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<head><ce:title>Magnetic properties of Tm–Zr multilayers</ce:title>
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<ce:surname>Baudry</ce:surname>
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<ce:abstract><ce:section-title>Abstract</ce:section-title>
<ce:abstract-sec><ce:simple-para>A 600<ce:hsp sp="0.25"></ce:hsp>
Å film of thulium and Tm–Zr multilayers in which the Tm layers are separated by 30<ce:hsp sp="0.25"></ce:hsp>
Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30<ce:hsp sp="0.25"></ce:hsp>
Å. X-ray diffraction gives evidence for a columnar growth along the <math altimg="si2.gif"><b>c</b>
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Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary, the <math altimg="si3.gif"><b>c</b>
</math>
-axis modulated antiferromagnetic phase which takes place in the film at <ce:italic>T</ce:italic>
<ce:inf>N</ce:inf>
≈54<ce:hsp sp="0.25"></ce:hsp>
K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers, which favours a structure close to the squared 3–4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30<ce:hsp sp="0.25"></ce:hsp>
K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy–Zr and Ho–Zr multilayers, the interface and volume anisotropies do not compensate each other for 8<ce:hsp sp="0.25"></ce:hsp>
Å Tm layers. The <ce:italic>c</ce:italic>
-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.</ce:simple-para>
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</ce:abstract>
<ce:keywords class="keyword"><ce:section-title>Keywords</ce:section-title>
<ce:keyword><ce:text>Magnetic multilayers</ce:text>
</ce:keyword>
<ce:keyword><ce:text>Rare earths</ce:text>
</ce:keyword>
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<abstract lang="en">Abstract: A 600Å film of thulium and Tm–Zr multilayers in which the Tm layers are separated by 30Å non-magnetic Zr layers were evaporated on superficially oxidized silicon substrates under ultra-vacuum conditions. The thickness of the Tm layers was varied between 8 and 30Å. X-ray diffraction gives evidence for a columnar growth along the c axis of the HCP structure, with in-plane compression of Tm layers thinner than 20Å. The magnetic structure of the film is quite similar to that of bulk Tm. On the contrary, the c-axis modulated antiferromagnetic phase which takes place in the film at TN≈54K is not observed in the multilayers. This phenomenon is preferentially attributed to an enhancement of the ferromagnetic coupling at the edges of the thulium layers, which favours a structure close to the squared 3–4 antiphase ferromagnetic arrangement of the magnetic moments displayed by the bulk below 30K. A marked trend to ferromagnetism is observed as the Tm layers become thinner. Contrary to that observed in Dy–Zr and Ho–Zr multilayers, the interface and volume anisotropies do not compensate each other for 8Å Tm layers. The c-axis magnetic anisotropy of Tm is preserved whatever the thickness of the Tm layers. The estimated anisotropies are compared with the results of point-charge crystal-field calculations.</abstract>
<note type="content">Fig. 1: X-ray Bragg patterns obtained from a θ–2θ scan around the (0002) reflections of Tm and Zr in two Tm–Zr multilayers (radiation wavelength=λCu).</note>
<note type="content">Fig. 2: Typical rocking curve recorded for a Tm–Zr multilayer. The θ scan was performed with 2θ fixed at the position of a line of the (0002) Bragg reflection pattern.</note>
<note type="content">Fig. 3: Typical in-plane diffraction pattern recorded under grazing incidence in a Tm–Zr multilayer. No lines are detected in the intermediate range 35°⩽2θ⩽50°. Bragg reflections from (hk0) atomic planes only can be observed.</note>
<note type="content">Fig. 4: Variation of the basal plane lattice parameter a of Tm against the thickness of the thulium layer in Tm–Zr multilayers. The values of a are deduced from the acurate determination of the position of the [100] Bragg reflection measured under grazing incidence. The horizontal dotted line indicates the value for bulk Tm.</note>
<note type="content">Fig. 5: Zero-field cooled field-cooled magnetization curves measured in the 600Å thick Tm film and the Tm(30Å)/Zr(30Å) multilayer. The applied magnetic field (500Oe) is perpendicular to the plane of the layers.</note>
<note type="content">Fig. 6: Magnetization curves measured at 8K in the Tm film (top) and several Tm–Zr multilayers: [Tm(30Å)/Zr(30Å)]20, [Tm(15Å)/Zr(30Å)]20 and [Tm(8Å)/Zr(30Å)]20 (bottom). The applied magnetic field is perpendicular to the film.</note>
<note type="content">Fig. 7: Perpendicular susceptibility in the Tm film and in two multilayers: [Tm(30Å)/Zr(30Å)]20 and [Tm(15Å)/Zr(30Å)]20.</note>
<note type="content">Fig. 8: Hysteresis loops measured at 8K in the Tm film (600Å) and several Tm/Zr multilayers.</note>
<note type="content">Fig. 9: Plot of the magnetic anisotropy measured in Tm–Zr(30Å) (○) and Ho–Zr(30Å) (▵) multilayers, against the thickness of the rare-earth layers. The interrupted lines are the results of crystal-field calculations performed for the Tm–Zr multilayers within the point-charge approximation. The charges affected to the Tm and Zr ions are indicated in the figure. The full line is the result of similar calculations for Ho–Zr multilayers, with Q(Ho)=0.3 and Q(Zr)=0.4 in proton charge unit.</note>
<subject><genre>Keywords</genre>
<topic>Magnetic multilayers</topic>
<topic>Rare earths</topic>
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Magnetic properties of Tm–Zr multilayers

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