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List of bibliographic references

Number of relevant bibliographic references: 17.
Ident.Authors (with country if any)Title
000372 (2009) Simon Carter [Royaume-Uni] ; Andy S. Fisher [Royaume-Uni] ; Phill S. Goodall [Royaume-Uni] ; Michael W. Hinds [Canada] ; Steve Lancaster [Royaume-Uni] ; Sian Shore [Royaume-Uni]Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials
000B82 (1999) Ben Fairman ; Michael W. Hinds ; Simon M. Nelms ; Denise M. Penny ; Phill GoodallIndustrial analysis: metals, chemicals and advanced materials
000C44 (1999) Philip Robinson [Australie] ; Ashley T. Townsend [Australie] ; Zongshou Yu [Australie] ; Carsten Münker [Australie]Determination of Scandium, Yttrium and Rare Earth Elements in Rocks by High Resolution Inductively Coupled Plasma‐Mass Spectrometry
001120 (1995) J. L. M. De Boer [Pays-Bas] ; W. Verweij [Pays-Bas] ; T. Van Der Velde-Koerts [Pays-Bas] ; W. Mennes [Pays-Bas]Levels of rare earth elements in Dutch drinking water and its sources. Determination by inductively coupled plasma mass spectrometry and toxicological implications. A pilot study
001181 (1995) Shu-Xiu Zhang [Japon] ; Shinichiro Murachi [Japon] ; Totaro Imasaka [Japon] ; Midori Watanabe [Japon]Determination of rare earth impurities in ultrapure europium oxide by inductively-coupled plasma mass spectrometry
001246 (1994) John Marshall ; John Carroll ; James S. Crighton ; Charles L. R. BarnardAtomic Spectrometry Update—Industrial Analysis: Metals, Chemicals and Advanced Materials
001547 (1992) M. I. Rucandio [Espagne]Determination of lanthanides and yttrium in rare earth ores and concentrates by inductively coupled plasma atomic emission spectrometry
001646 (1991) John Marshall ; John Carroll ; James S. CrightonAtomic Spectrometry Update—Industrial Analysis: Metals, Chemicals and Advanced Materials
001769 (1990) Malcolm Cresser ; Les Ebdon ; Janet Armstrong ; John Dean ; Michael H. Ramsey ; Mark CaveAtomic Spectrometry Update—Environmental Analysis
001890 (1989) John Marshall ; John Carroll ; Simon T. SparkesAtomic Spectrometry Update—Industrial Analysis: Metals, Chemicals and Advanced Materials
001945 (1989) Lauri H. J. Lajunen ; Gregory R. ChoppinANALYTICAL CHEMISTRY OF THE LANTHANIDES PART 1. ATOMIC ABSORPTION AND PLASMA ATOMIC EMISSION SPECTROSCOPIC METHODS
001A02 (1988) Margaret S. Burns [États-Unis]Biological microanalysis by secondary ion mass spectrometry: Status and prospects
001A57 (1987) Alan R. Date [Royaume-Uni] ; Yuk Ying Cheung [Royaume-Uni] ; Marianne E. Stuart [Royaume-Uni]The influence of polyatomic ion interferences in analysis by inductively coupled plasma source mass spectrometry (ICP-MS)
001E52 (1983) M. A. Eid [Égypte] ; K. M. El Behery [Égypte] ; A. A. Fakhry [Égypte] ; F. A. El Anany [Égypte]Spectrographic determination of rare earth elements using a wallstabilized plasma arc
002447 (1976) S. Greenfield [Royaume-Uni] ; H. Mcd. Mcgeachin [Royaume-Uni] ; P. B. Smith [Royaume-Uni]Plasma emission sources in analytical spectroscopy—III
002C57 (1967) A. Lubecki [Pologne] ; M. Wasilewska [Pologne] ; L. G Rski [Pologne]On the application of Compton scattering to the elimination of matrix effects in non-dispersive X-ray fluorescence analysis
002D43 (1966) J. R. RhodesRadioisotope X-ray spectrometry. A review

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