ThuliumV1, Hal, Checkpoint, bibRecord, 000043

Amorphous Tm3+ doped sulfide thin films fabricated by sputtering

Identifieur interne : 000043 ( Hal/Checkpoint ); précédent : 000042; suivant : 000044

Amorphous Tm3+ doped sulfide thin films fabricated by sputtering

Auteurs : Virginie Nazabal [France] ; Anne-Marie Jurdyc [France] ; P. Nemec [République tchèque] ; Marie-Laure Brandily-Anne [France] ; Laëtitia Petit [États-Unis] ; Katheleen Richardson [États-Unis] ; Philippe Vinatier [France] ; Cathel Bousquet [France] ; Thierry Cardinal [France] ; Stanislav Pechev [France] ; Jean-Luc Adam [France]

Source :

Optical Materials [ 0925-3467 ] ; 2010.

RBID : Hal:hal-00608450

English descriptors

mix :
- Chalcogenide glasses, RF sputtering, Thin film, Thulium.

Abstract

Amorphous chalcogenide films play a motivating role in the development of integrated planar optical circuits and their components. The aim of the present investigation was to optimize deposition conditions for preparation of pure and Tm3+ doped sulfide films by radio-frequency magnetron sputtering. The study of their composition, morphological characteristics and thermal properties was realized by scanning electronic microscope attached with energy dispersive spectroscopy, Rutherford backscattering, X-ray diffraction, and micro-thermal probe. Some optical properties, like transmission, index of refraction, optical band-gap, propagation modes from 633 to 1540 nm, were investigated on thin films. The whole results point out hopeful perspectives strengthened by the clear observation of the near-infrared photo-luminescence of Tm3+ doped sulfide films.

Url:

https://hal.archives-ouvertes.fr/hal-00608450

DOI: 10.1016/j.optmat.2010.08.023

Links toward previous steps (curation, corpus...)

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to stream Hal, to step Curation: 000007

Links to Exploration step

Hal:hal-00608450

Le document en format XML

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<front><div type="abstract" xml:lang="en">Amorphous chalcogenide films play a motivating role in the development of integrated planar optical circuits and their components. The aim of the present investigation was to optimize deposition conditions for preparation of pure and Tm3+ doped sulfide films by radio-frequency magnetron sputtering. The study of their composition, morphological characteristics and thermal properties was realized by scanning electronic microscope attached with energy dispersive spectroscopy, Rutherford backscattering, X-ray diffraction, and micro-thermal probe. Some optical properties, like transmission, index of refraction, optical band-gap, propagation modes from 633 to 1540 nm, were investigated on thin films. The whole results point out hopeful perspectives strengthened by the clear observation of the near-infrared photo-luminescence of Tm3+ doped sulfide films.</div>
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<author role="aut"><persName><forename type="first">Anne-Marie</forename>
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<author role="aut"><persName><forename type="first">Katheleen</forename>
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<author role="aut"><persName><forename type="first">Jean-Luc</forename>
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<abstract xml:lang="en">Amorphous chalcogenide films play a motivating role in the development of integrated planar optical circuits and their components. The aim of the present investigation was to optimize deposition conditions for preparation of pure and Tm3+ doped sulfide films by radio-frequency magnetron sputtering. The study of their composition, morphological characteristics and thermal properties was realized by scanning electronic microscope attached with energy dispersive spectroscopy, Rutherford backscattering, X-ray diffraction, and micro-thermal probe. Some optical properties, like transmission, index of refraction, optical band-gap, propagation modes from 633 to 1540 nm, were investigated on thin films. The whole results point out hopeful perspectives strengthened by the clear observation of the near-infrared photo-luminescence of Tm3+ doped sulfide films.</abstract>
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Amorphous Tm3+ doped sulfide thin films fabricated by sputtering

Amorphous Tm3+ doped sulfide thin films fabricated by sputtering

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