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Serveur d'exploration sur le thulium - Analysis (France)

Index « Keywords » - entrée « Transmission electron microscopy »
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Transmission electron microscope < Transmission electron microscopy < Transmission medium  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 6.
Ident.Authors (with country if any)Title
000027 (2013) Sourav Marik [Espagne, France] ; A. J. Dos Santos-Garcia [Espagne] ; Emilio Moran [Espagne] ; O. Toulemonde [France] ; M. A. Alario-Franco [Espagne]Spin glass to superconducting phase transformation by oxidation of a molybdo-cuprate: Mo0.3Cu0.7Sr2TmCu2O3;
000119 (2009) Wen-Juan Zhou [France, République populaire de Chine] ; Belén Albela [France] ; Meigui On [France] ; Pascal Perriat [France] ; Ming-Yuan He [République populaire de Chine] ; Laurent Bonneviot [France]Framework and grafted nickel ethylenediamine complexes in 2D hexagonal mesostructured templated silica
000178 (2006) T. Wojtowicz [France] ; F. Gloux [France] ; P. Ruterana [France] ; K. Lorenz [Portugal] ; E. Alves [Portugal]TEM investigation of Tm implanted GaN, the influence of high temperature annealing
000179 (2006) T. Wojtowicz [France] ; F. Gloux [France] ; P. Ruterana [France] ; G. Nouet [France] ; L. Bodiou [France] ; A. Braud [France] ; K. Lorenz [Portugal] ; E. Alves [Portugal]Structure and role of ultrathin AlN layers for improving optical activation of rare earth implanted GaN
000429 (1995) Colette Chassard-Bouchaud [France] ; Michelle Hubert [France] ; Françoise Escaig [France] ; René Louis Inglebert [France]Cellular and subcellular localization of chromium in the crab Liocarcinus puber (Brachyrhyncha) by transmission electron microscopy, secondary ion mass spectrometry and electron microprobe analysis
000524 (1991) V. Hardy [France] ; M. Hervieu ; D. Groult ; J. ProvostHigh resolution electron microscopy study of electronic energy loss effects in thallium-based superconducting copper oxides irradiated by 5.8 GeV-Xeions

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