S. R. Rotman < S. R. Shieh < S. Rahaman | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 2.Ident. | Authors (with country if any) | Title |
---|---|---|
000174 (2006) | I. Jarrige [Taïwan] ; J.-P. Rueff [France] ; S. R. Shieh [Taïwan] ; T. Matsumura [Japon] ; H. Ishii [Taïwan] ; N. Hiraoka [Taïwan] ; Y. Q. Cai [Taïwan] | f-Level occupancy in TmTe under pressure investigated by high-resolution X-ray absorption spectroscopy |
000198 (2005) | I. Jarrige [Taïwan] ; H. Ishii [Taïwan] ; Y. Q. Cai [Taïwan] ; J.-P. Rueff [France] ; C. Bonnelle [France] ; T. Matsumura [Japon] ; S. R. Shieh [Taïwan] | Valence state of Tm in TmX (X = S, Se, Te) investigated by resonant inelastic x-ray scattering |
List of associated KwdEn.i
Nombre de documents | Descripteur |
---|---|
2 | X-ray absorption spectra |
1 | Chalcogenides |
1 | Electronic structure |
1 | High pressure |
1 | Inelastic scattering |
1 | Mixed state |
1 | Mixed valence |
1 | Pressure effects |
1 | Resonance |
1 | Thulium compounds |
1 | Thulium tellurides |
1 | Valence |
1 | X-ray scattering |
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