| S. R. Rotman < S. R. Shieh < S. Rahaman | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 2.| Ident. | Authors (with country if any) | Title |
|---|---|---|
| 000174 (2006) | I. Jarrige [Taïwan] ; J.-P. Rueff [France] ; S. R. Shieh [Taïwan] ; T. Matsumura [Japon] ; H. Ishii [Taïwan] ; N. Hiraoka [Taïwan] ; Y. Q. Cai [Taïwan] | f-Level occupancy in TmTe under pressure investigated by high-resolution X-ray absorption spectroscopy |
| 000198 (2005) | I. Jarrige [Taïwan] ; H. Ishii [Taïwan] ; Y. Q. Cai [Taïwan] ; J.-P. Rueff [France] ; C. Bonnelle [France] ; T. Matsumura [Japon] ; S. R. Shieh [Taïwan] | Valence state of Tm in TmX (X = S, Se, Te) investigated by resonant inelastic x-ray scattering |
List of associated KwdEn.i
| Nombre de documents | Descripteur |
|---|---|
| 2 | X-ray absorption spectra |
| 1 | Chalcogenides |
| 1 | Electronic structure |
| 1 | High pressure |
| 1 | Inelastic scattering |
| 1 | Mixed state |
| 1 | Mixed valence |
| 1 | Pressure effects |
| 1 | Resonance |
| 1 | Thulium compounds |
| 1 | Thulium tellurides |
| 1 | Valence |
| 1 | X-ray scattering |
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HfdIndexSelect -h $EXPLOR_AREA/Data/France/Analysis/Author.i \
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{{Explor lien
|wiki= Wicri/Terre
|area= ThuliumV1
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|étape= Analysis
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|clé= S. R. Shieh
}}
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