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Serveur d'exploration sur le thulium - Analysis (France)

Index « Auteurs » - entrée « M. Latroche »
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M. Langlet < M. Latroche < M. Laval  Facettes :

List of bibliographic references

Number of relevant bibliographic references: 1.
Ident.Authors (with country if any)Title
000528 (1990) M. Latroche [France] ; V. Paul-Boncour [France] ; A. Percheron-Guegan [France] ; J. C. Achard [France]Structure determination of Y0.95Ni2 by X-ray powder diffraction

List of associated KwdEn.i

Nombre de
documents		Descripteur
1Achard laboratoire
1Actu crystalzogr
1Atom site
1Atomic distances
1Atomic position shifts
1Atomic positions
1Average value
1Cell parameter volume
1Composition range
1Compound exhibits
1Correct description
1Cubic structure
1Cubic superstructure lines
1Data analysis
1Diffraction pattern exhibits
1Diffraction studies
1Electronic microprobe analysis
1Element radii
1Experimental details
1Extra peaks
1Final refinement
1Fine powder
1First stage
1Free parameter
1Further improvements
1Further investigations
1Geometrical point
1Good agreement
1Homogeneous sample
1Ideal distances
1Ideal mgcu
1Ideal position
1Ideal ratio
1Ideal structure
1Important modifications
1Induction furnace
1Intensity data
1Intermetallic compound
1Intermetallic compound crystallizes
1International tables
1Lanthanum vacancies
1Large amounts
1Large size
1Latter compound crystallizes
1Lattice parameter
1Lavesphase structure
1Letter structure determination
1Lower temperature
1Main phase
1Metallographic examination
1Method yields
1Meudon bellevue
1Meudon cedex
1Microprobe analysis
1Miller indices
1Neighbouring phase
1Other compounds
1Other systems
1Other yttrium site occupancy factors
1Parameter
1Positional parameters
1Powder diffraction
1Powder diffraction pattern
1Powder diffraction pattern exhibits
1Profile parameters
1Profile parameters reliability factors
1Profile shape analysis
1Pure components
1Rare earth vacancies
1Refinement method
1Reflections number
1Reliability factor
1Same cell parameter
1Same conditions
1Same scale
1Scotch tape
1Significant improvement
1Single phase
1Small shift
1Space group
1Step scan
1Strong lines
1Structural defects
1Structural distortions
1Structural parameters number
1Structural results
1Structure determination
1Such defects
1Systematic absences
1Terres rares
1Tetragonal cell
1Tetragonal distortion
1Thermal parameters
1Theta powder pattern
1Thulium occupancy factors
1Yttrium
1Yttrium atom occupancy factor
1Yttrium atoms
1Yttrium vacancies

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