I. S. Dubenko < I. Stekhin < I. V. Golosovsky | Facettes : |
List of bibliographic references
Number of relevant bibliographic references: 2.Ident. | Authors (with country if any) | Title |
---|---|---|
000364 (1997-07-15) | M. Pompa [France] ; A. M. Flank ; P. Lagarde ; J. C. Rife ; I. Stekhin [Russie] ; M. Nakazawa [Japon] ; H. Ogasawara ; A. Kotani | Experimental and theoretical comparison between absorption, total electron yield, and fluorescence spectra of rare-earth M5 edges |
000387 (1997) | M. Pompa [France] ; A. M. Flank [France] ; P. Lagarde [France] ; J. Rife [États-Unis] ; I. Stekhin [Russie] ; M. Nakazawa [Japon] ; H. Ogasawara [Russie] ; A. Kotani [Japon] | Experimental and theoretical comparison between absorption, total electron yield and fluorescence spectra of the thulium M5 edge |
List of associated KwdEn.i
Nombre de documents | Descripteur |
---|---|
2 | Experimental study |
2 | Theoretical study |
2 | Thin films |
2 | Thulium |
2 | X-ray spectra |
1 | Absorption spectra |
1 | Absorptivity |
1 | Fluorescence |
1 | Fluorescence yield |
1 | Lanthanum |
1 | Metallic thin films |
1 | Metals |
1 | Polarization |
1 | Rare earths |
1 | Samarium |
1 | X-ray emission spectra |
1 | X-ray fluorescence analysis |
1 | Yields |
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