Serveur d'exploration sur le nickel au Maghreb - Curation (Istex)

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List of bibliographic references

Number of relevant bibliographic references: 41.
[0-20] [0 - 20][0 - 41][20-40]
Ident.Authors (with country if any)Title
000034 (1988) Olwen Williams-Thorpe [Royaume-Uni]Provenancing and archaeology of roman millstones from the Mediterranean area
000244 (2000) M. F. Montemor [Portugal] ; M. G. S. Ferreira [Portugal] ; N. E. Hakiki [Portugal] ; M. Da Cunha Belo [Portugal]Chemical composition and electronic structure of the oxide films formed on 316L stainless steel and nickel based alloys in high temperature aqueous environments
000289 (1998) N. Guettari [Algérie] ; J. Ouerfelli [France] ; J. C. Bernède [France] ; A. Khelil [Algérie] ; J. Pouzet [France] ; A. Conan [France]Photoconductive WSe2 thin films obtained by solid state reaction in the presence of a thin nickel layer
000451 (1997) R. Ben Chaabane [France] ; G. Guillaud [France] ; M. Gamoudi [France]Study of the electrical properties of thin film transistors based on nickel phthalocyanine
000497 (1982) Ingrid Reuber [France] ; André Michard [France] ; Ahmed Chalouan [Maroc] ; Thierry Juteau [France] ; Bahija Jermoumi [Maroc]Structure and emplacement of the Alpine-type peridotites from Beni Bousera, Rif, Morocco: A polyphase tectonic interpretation
000511 (1999) J. C. Bernède [France] ; J. Pouzet [France] ; E. Gourmelon [France] ; H. Hadouda [Algérie]Recent studies on photoconductive thin films of binary compounds
000514 (2013) Martin Mowitz [Suède] ; Erik Zimerson [Suède] ; Cecilia Svedman [Suède] ; Magnus Bruze [Suède]Patch testing with serial dilutions and thin‐layer chromatograms of oak moss absolutes containing high and low levels of atranol and chloroatranol
000632 (1989) S. N Alavi [Turquie] ; V. Ediger [Turquie] ; M. Ergin [Turquie]Recent sedimentation on the shelf and upper slope in the Bay of Anamur, southern coast of Turkey
000684 (2009) Chrif Dridi [Tunisie, France] ; Maha Benzarti-Ghdira [Tunisie] ; Francis Vocanson [France] ; Rafik Ben Chaabane [Tunisie] ; Joel Davenas [France] ; Hafedh Ben Ouada [Tunisie]Optical and electrical properties of semi-conducting calix[5,9]arene thin films with potential applications in organic electronics
000747 (1997) E. Gourmelon [France] ; H. Hadouda [Algérie] ; Jc Bernede [France] ; J. Pouzet [France]High quality crystalline MoS2 thin films obtained on Ni coated substrates: optimization of the post-annealing treatment
000772 (1962) International Conference on the Electrical and Magnetic Properties of Thin Metallic Layers, Louvain, September 1961
000867 (2008) S. Ouir [Algérie] ; S. Sam [Algérie] ; G. Fortas [Algérie] ; N. Gabouze [Algérie] ; K. Beldjilali [Algérie] ; F. Tighilt [Algérie]FeNi alloys electroplated into porous (n‐type) silicon
000874 (2010) N. Khelifati [Algérie] ; S. Tata [Algérie] ; A. Rahal [Algérie] ; R. Cherfi [Algérie] ; A. Fedala [Algérie, France] ; M. Kechouane [Algérie] ; T. Mohammed-Brahim [France]The annealing temperature effect on the electrical properties of boron‐doped hydrogenated amorphous silicon a‐Si:H(B)
000956 (1998) Y. Ijdiyaou [Maroc] ; K. Hafidi [Maroc] ; M. Azizan [Maroc] ; E. L Ameziane [Maroc] ; A. Outzourhit [Maroc] ; L. Dreesen [Belgique] ; K. Benai [Maroc]Grazing incidence X-ray reflectometry studies of CdTe(111) surfaces and a-Si thin films
000992 (2012) R. Masrour [Maroc] ; M. Hamedoun [Maroc] ; A. Benyoussef [Maroc]Mean-field and high temperature series expansion calculations of some magnetic properties of Ising and XY antiferromagnetic thin-films
000994 (1984) R. Gomri [France] ; H. Boussetta [France] ; C. Bahezre [France] ; C. Monty [France]Impurity diffusion of Ni in Co1− x O single crystals
000A06 (1999) E. Gourmelon [France] ; J. Pouzet [France] ; J. C Bernede [France] ; H. Hadouda [Algérie] ; A. Khelil [Algérie] ; R. Le Ny [France]Crystalline properties of MoS2 thin films grown on metallic substrates
000A16 (1996) R. Mlika [Tunisie] ; H. Ben Ouada [Tunisie] ; R. Ben Chaabane [Tunisie] ; M. Gamoudi [France] ; G. Guillaud [France] ; N. Jaffrezic-Renault [France] ; R. Lamartine [France]Calixarene membranes on semiconductor substrates for E.I.S. chemical sensors
000A28 (1955) S. R. Taylor [États-Unis]The origin of some New Zealand metamorphic rocks as shown by their major and trace element composition
000A44 (2012) Mejed Chemli [Tunisie] ; Ayoub Haj Said [Tunisie] ; Jean-Louis Fave [France] ; Carlos Barthou [France] ; Mustapha Majdoub [Tunisie]Synthesis and chemical modification of new luminescent substituted poly(p‐phenylene) polymers
000B00 (2001) M. G. S. Ferreira [Portugal] ; N. E. Hakiki [Algérie] ; G. Goodlet [Portugal] ; S. Faty [Sénégal] ; A. M. P. Sim Es [Portugal] ; M. Da Cunha Belo [Portugal]Influence of the temperature of film formation on the electronic structure of oxide films formed on 304 stainless steel

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