Ident. | Authors (with country if any) | Title |
---|
000048 (2013) |
C. Khaldi [Tunisie] ; S. Boussami [Tunisie] ; M. Tliha [Tunisie, Arabie saoudite] ; S. Azizi [Tunisie] ; N. Fenineche [France] ; O. El-Kedim [France] ; H. Mathlouthi [Tunisie] ; Jilani Lamloumi [Tunisie] | The effect of the temperature on the electrochemical properties of the hydrogen storage alloy for nickel-metal hydride accumulators |
000054 (2013) |
M. Arab Pour Yazdi [France] ; N. Fenineche [France] ; E. Aubry [France] ; A. Kaibi [Algérie] ; A. Billard [France] | Microstructure and magnetic properties of Ni3Fe solid solution thin films deposited by DC-magnetron sputtering |
000060 (2013) |
Khalid Hoummada [France] ; Gamra Tellouche [Algérie] ; Ivan Blum [France] ; Alain Portavoce [France] ; Marion Descoins [France] ; Dominique Mangelinck [France] | Direct observation of Ni decorated dislocation loops within As+-implanted silicon and arsenic clustering in Ni silicide contact |
000070 (2012) |
M. Boudard [France] ; C. Girardot [France] ; N. Ihzaz [France, Tunisie] ; S. Pignard [France] ; L. Rapenne [France] ; H. Roussel [France] ; A. Bartasyte [France] | X-ray and transmission electron microscopy structural characterization of multifunctional Perovskite thin films |
000078 (2012) |
N. Omari [Maroc, France] ; H. Lassri [Maroc] ; A. Fnidiki [France] ; M. Abid [Maroc] ; E. K. Hlil [France] | Magnetic and electronic studies in the granular (Ni0.84Fe0.16)54(alumina)46 sputtered thin films |
000120 (2010) |
Z. Beji [France, Tunisie] ; L. S. Smiri [Tunisie] ; M.-J. Vaulay [France] ; F. Herbst [France] ; S. Ammar [France] ; F. Fievet [France] | Nanocrystalline Ni0.8Zn0.2Fe2O4 films prepared by spray deposition from polyol-mediated sol: Microstructural and magnetic characterization |
000166 (2008) |
L. Cattin [France] ; B. A. Reguig [Algérie] ; A. Khelil [Algérie] ; M. Morsli [France] ; K. Benchouk [Algérie] ; J. C. Bernede [France] | Properties of NiO thin films deposited by chemical spray pyrolysis using different precursor solutions |
000184 (2007) |
S.-M. Cherif [France] ; A. Layadi [Algérie] ; J. Ben Youssef [France] ; C. Nacereddine [Algérie] ; Y. Roussigne [France] | Study of the magnetic anisotropy in Ni/Cu and Ni/glass thin films |
000185 (2007) |
B. A. Reguig [Algérie] ; A. Khelil [Algérie] ; L. Cattin [France] ; M. Morsli [France] ; J. C. Bernede [France] | Properties of NiO thin films deposited by intermittent spray pyrolysis process |
000205 (2006) |
M. Charbonnier [France] ; M. Romand [France] ; Y. Goepfert [France] ; D. Leonard [France] ; F. Bessueille [France] ; M. Bouadi [Algérie] | Palladium (+2) reduction : A key step for the electroless Ni metallization of insulating substrates by a tin-free process |
000265 (2004) |
K. Benkirane [Maroc] ; R. Elkabil [Maroc] ; A. Hamdoun [Maroc] ; M. Lassri [Maroc] ; M. Abid [Maroc] ; H. Lassri [Maroc] ; R. Krishnan [France] | Thermal variation of magnetization in Ni/V multilayers |
000288 (2003) |
A. Kellou [Algérie] ; N. E. Fenineche [France] ; A. Tadjer [Algérie] ; H. Aourag [Algérie, France] | Ferromagnetic and antiferromagnetic couplings in Cr(0 0 1) thin films and TM monolayer/Cr(0 0 1) (TM = Ti, V, Cr, Mn, Fe, Co, Ni) |
000294 (2003) |
M. Laribi [France, Algérie] ; N. Mesrati [Algérie] ; A. B. Vannes [France] ; D. Treheux [France] | Adhesion and residual stresses determination of thermally sprayed molybdenum on steel |
000362 (2000) |
V. Branger [France] ; C. Coupeau [France] ; P. Goudeau [France] ; B. Boubeker [France, Maroc] ; K. F. Badawi [France] ; J. Grilhe [France] | Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates |
000365 (1999) |
J. C. Bernède [France] ; J. Pouzet [France] ; E. Gourmelon [France] ; H. Hadouda [Algérie] | Recent studies on photoconductive thin films of binary compounds |
000392 (1999) |
M. Abid [Maroc] ; H. Ouahmane [Maroc] ; H. Lassri [Maroc] ; A. Khmou [Maroc] ; R. Krishnan [France] | Magnetic properties of Ni/V multilayers |
000396 (1998) |
R. Mlika [Tunisie, France] ; H. Ben Ouada [Tunisie] ; N. Jaffrezic-Renault [France] ; I. Dumazet [France] ; R. Lamartine [France] ; M. Gamoudi [France] ; G. Guillaud [France] | Study of ion-selective evaporated calixarene film used as a sensitive layer on ISFET sensors |
000407 (1998) |
J. Ouerfelli [France] ; Z. Jlaïel [France] ; N. Guettari [Algérie] ; E. Gourmelon [France] ; J. Pouzet [France] ; J. C. Bernede [France] ; A. Khelil [Algérie] ; M. Zoater [Liban] ; A. Conan [France] | De la nécessité d'une fine couche de nickel pour obtenir des couches minces de MoSe2 photoconductrices |
000414 (1998) |
N. Guettari [Algérie] ; J. Ouerfelli [France] ; J. C. Bernede [France] ; A. Khelil [Algérie] ; J. Pouzet [France] ; A. Conan [France] | Photoconductive WSe2 thin films obtained by solid state reaction in the presence of a thin nickel layer |
000423 (1998) |
R. Mlika [Tunisie] ; H. Ben Ouada [Tunisie] ; R. Ben Chaabane [Tunisie] ; M. Gamoudi [France] ; G. Guillaud [France] ; N. Jaffrezic-Renault [France] ; R. Lamartine [France] | Calixarene membranes on semiconductor substrates for E.I.S. chemical sensors |
000430 (1997) |
E. Gourmelon [France] ; H. Hadouda [Algérie] ; Jc Bernede [France] ; J. Pouzet [France] | High quality crystalline MoS2 thin films obtained on Ni coated substrates: optimization of the post-annealing treatment |